{"title":"Developing a pulsed VNA, observations and experiences","authors":"M. Roos","doi":"10.1109/ARFTG.1988.323917","DOIUrl":"https://doi.org/10.1109/ARFTG.1988.323917","url":null,"abstract":"Over the past year a group of us at EIP Microwave have been converting a CW VNA into a system capable of measuring devices while in a pulsed RF mode. As we experimented with the CW VNA it became obvious that the problem was not with measuring a nonlinear device but with removing the nonlinearities form the CW measurement system. In this paper I will be discussing some of the tradeoffs which must be made when measuring pulsed signals and lend some insight into how they can be resolved. Even though the work described was toward the development of a commercial product the observations made will be valuable to anyone who is considering making pulsed vna measurements.","PeriodicalId":235867,"journal":{"name":"32nd ARFTG Conference Digest","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121500263","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Nonlinear Amplifier and Mixer Measurements with a Vector Network Analyzer","authors":"B. Brown","doi":"10.1109/ARFTG.1988.323915","DOIUrl":"https://doi.org/10.1109/ARFTG.1988.323915","url":null,"abstract":"This paper describes an RF network analyzer, the HP 8753B, which has the ability to make nonlinear measurements of amplifiers and mixers. The measurements to be discussed are swept-frequency harmonic distortion, gain compression with power metal calibration, and swept-frequency conversion loss of a mixer. In addition, the block diagram of the network analyzer will be examined in order to explain how these measurements are made.","PeriodicalId":235867,"journal":{"name":"32nd ARFTG Conference Digest","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133056693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated Millimeter-Wave Systems to Support a WR-22 Band Testing Program","authors":"P. Nolan","doi":"10.1109/ARFTG.1988.323919","DOIUrl":"https://doi.org/10.1109/ARFTG.1988.323919","url":null,"abstract":"","PeriodicalId":235867,"journal":{"name":"32nd ARFTG Conference Digest","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123716580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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