2010 IEEE AUTOTESTCON最新文献

2010 IEEE AUTOTESTCON Pub Date : 2021-12-16 DOI: 10.1109/autest.2010.5613541

Kavish Rathore, Roopika Nautiyal, Anantha Singh, Brij Shah, S. Uliana, Jatan Joshi, Drashti Kapadia, H. Dhananjaya, H. Kang, Hyoun Ho Shin, J. Yoo, I. Lee, Sung Mo Yang

引用次数: 0

Bridging design and implementation for a more practical Condition Based Maintenance Plus (CBM+) solution: Embedded vehicle diagnostics on the Mini-Vehicle Computer System (VCS) 连接设计和实现更实用的基于状态的维护+ (CBM+)解决方案:微型车辆计算机系统(VCS)上的嵌入式车辆诊断

2010 IEEE AUTOTESTCON Pub Date : 2011-07-29 DOI: 10.1109/MIM.2011.5961369

M. Zachos, K. E. Schohl

{"title":"Bridging design and implementation for a more practical Condition Based Maintenance Plus (CBM+) solution: Embedded vehicle diagnostics on the Mini-Vehicle Computer System (VCS)","authors":"M. Zachos, K. E. Schohl","doi":"10.1109/MIM.2011.5961369","DOIUrl":"https://doi.org/10.1109/MIM.2011.5961369","url":null,"abstract":"Our last paper covered the background, current spiral developments, roll out, and sustainment of the US Army's newest At-Platform Automatic Test Systems (APATS) equipment for TWVs (Tactical Wheeled Vehicles). The equipment, called the SWICE (Smart Wireless Internal Combustion Engine) system, was developed for vehicle diagnostics systems in at-platform and embedded applications, including prognostics. An overview of the SWICE system operation was described, including the Smart Wireless Diagnostic Sensor (SWDS) device, features of the Vehicle Integrated Diagnostics Software-Field (VIDS-F) implementation, and the vehicle Diagnostics Software (DS) application. We also covered the functions of the Prognostics Client \"plug-in\" module and integrated support for the Common Logistic Operating Environment (CLOE) implementation, along with the concept of leveraging the SWICE/SWDS as a “Mini-Vehicle Control System (VCS)”. Having built and delivered much of the SWICE system, we have found several practical considerations as we moved from design to true implementation. Beginning with an overview of the SWICE system, the primary focus of this paper summarizes two examples of bridging the gap between design and implementation, namely, wireless security and data logging. While the former required the SWICE's wireless networking to be secured with Federal Information Processing Standards, the latter provided for a new application for leveraged use of the SWICE/SWDS as a Mini-VCS. The objective is to further enhance Conditioned Based Maintenance Plus (CBM+) secure diagnostics, data logging, prognostics and sensor integration to support improvement of the US military ground vehicle fleet's uptime to enhance operational readiness. Benefits include TWVs increased readiness and operational availability, reduced maintenance costs, lower repair part inventory levels, reduced cost of consumables, and an overall reduction in maintenance process errors.","PeriodicalId":235303,"journal":{"name":"2010 IEEE AUTOTESTCON","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128403475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Miniature MEMS-based data recorder for prognostics and health management (PHM) 用于预测和健康管理(PHM)的微型mems数据记录仪

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613608

M. Engelman, J. Judkins, S. Vohnout, E. Enikov

{"title":"Miniature MEMS-based data recorder for prognostics and health management (PHM)","authors":"M. Engelman, J. Judkins, S. Vohnout, E. Enikov","doi":"10.1109/AUTEST.2010.5613608","DOIUrl":"https://doi.org/10.1109/AUTEST.2010.5613608","url":null,"abstract":"Novel prognostic sensors and reasoner algorithms are the core technology for detecting defects caused by accumulation of fatigue damage in electrical and mechanical systems over time. However, serious technical challenges to implementing a general health management strategy for helicopters and military aircraft still exist. For example, severe heat and vibration make it difficult to distinguish fault signatures from environmental noise. Moreover, bearing loads are very dynamic, making it difficult to distinguish subtle wear-out signatures from normal acoustic patterns. Detection can be improved by increasing the number of sensor locations, but this option is unattractive from the standpoint of added cost, weight, and data overhead of such a system. Our approach is to integrate MEMS sensors with a standard commercial microcontroller and measurement electronics. In this way, prognostic sensors can be positioned closer to the stressed components and provide higher fidelity data with lower cost. We present an innovative design for a prognostics and health management (PHM) data recorder that will facilitate sense-and-response logistics, and provide a small and inexpensive package. This low-cost, low-power, and lightweight solution is based largely on COTS components; it is implemented using a standard low-power lightweight microcontroller core and COTS MEMS sensors to record and process local temperature and vibration data, and status reporting is implemented using a short range wireless transceiver.","PeriodicalId":235303,"journal":{"name":"2010 IEEE AUTOTESTCON","volume":"340 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117341184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Comparing LabVIEW graphical code to text-based alternatives for use in test applications 比较LabVIEW图形代码和用于测试应用程序的基于文本的替代代码

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613603

Elijah Kerry, Derrick Snyder

引用次数: 4

Creating next generation HIL simulators with FPGA technology 使用FPGA技术创建下一代HIL模拟器

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613618

C. Washington, J. Dolman

{"title":"Creating next generation HIL simulators with FPGA technology","authors":"C. Washington, J. Dolman","doi":"10.1109/AUTEST.2010.5613618","DOIUrl":"https://doi.org/10.1109/AUTEST.2010.5613618","url":null,"abstract":"As embedded control devices become more common in today's electro-mechanical systems, HIL Simulation is growing in its importance to the success of these systems. HIL testing provides a simulated environment for the unit under test, simulating the parts of the system that are not physically present. As these systems grow in complexity, traditional HIL simulation techniques are falling short. Fortunately, technologies such as Field Programmable Gate Arrays (FPGAs) are being applied to produce the next generation of HIL simulators. FPGAs enable test system developers to create custom hardware that can be easily reconfigured without physically modifying the device. In addition to being reconfigurable, for certain applications, FPGAs can offer superior performance compared to microprocessors. More specifically for HIL test systems, FPGA-based I/O devices provide superior determinism, on the order of nanoseconds, enabling realistic simulation of plant components not typically realizable with microprocessor-only based systems. They are also used to off-load some of the processing that would otherwise be required of the test system microprocessor increasing the total system bandwidth. Because of the ease with which their personalities can be reconfigured, FPGAs are also used in HIL test systems to create custom IO interfaces as well as IO interfaces that can adapt to multiple UUT types or changes to UUT interfaces that evolve during product development. In this paper, we will discuss examples of how FPGAs are being used for sensor simulation to create better, more adaptable HIL test systems.","PeriodicalId":235303,"journal":{"name":"2010 IEEE AUTOTESTCON","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129040912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 16

TPS transportability in windows environment windows环境下TPS的可移植性

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613567

M. Keyler

引用次数: 0

Maximizing the measurement accuracy of digitized signals 最大限度地提高数字化信号的测量精度

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613600

M. Haney

引用次数: 3

Test forensics: A guide to evaluating TPS transportability 测试取证:评估TPS可移植性的指南

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613546

S. Wegener

{"title":"Test forensics: A guide to evaluating TPS transportability","authors":"S. Wegener","doi":"10.1109/AUTEST.2010.5613546","DOIUrl":"https://doi.org/10.1109/AUTEST.2010.5613546","url":null,"abstract":"Test forensics is a systematic approach for evaluating execution results of a Unit Under Test (UUT) over a broad set of criterion. Execution results include the traditional test numbers, measured values and limits, but also include timing relationships and configuration information about the UUT and Automatic Test Equipment (ATE) used while conducting the test. Occasionally a test may pass on station (A) but fail on station (B), even though both stations are identical, and manufactured from the same production line. Finding the root cause of this type of failure is often tedious and time-consuming. The complexity of solving this issue increases significantly if station (B) is a replacement for station (A), containing a different hardware and software architecture, subject only to the requirement of being functionally equivalent. For either the production case or the transportability case, engineering could benefit from automated tools and data collection. Presented in this paper is an approach for collecting data from the early stages of compilation and translation of a test program set (TPS) all the way through TPS execution on the ATE. Test forensics is a design approach of the runtime system coupled with automated tools for analyzing and presenting the data to the operator. This paper will briefly touch on how the test-forensics implementation would benefit net-centric and distributive network efforts to achieve TPS transportability.","PeriodicalId":235303,"journal":{"name":"2010 IEEE AUTOTESTCON","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124069591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Identifying legacy re-host conversion candidates: Keeping current with technology 识别遗留的重新主机转换候选者:跟上技术的发展

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613630

L. Kirkland

引用次数: 0

Using an FPGA based system for IEEE 1641 waveform generation 采用基于FPGA的系统实现IEEE 1641波形的生成

2010 IEEE AUTOTESTCON Pub Date : 2010-10-28 DOI: 10.1109/AUTEST.2010.5613591

C. Baker, A. Hulme

{"title":"Using an FPGA based system for IEEE 1641 waveform generation","authors":"C. Baker, A. Hulme","doi":"10.1109/AUTEST.2010.5613591","DOIUrl":"https://doi.org/10.1109/AUTEST.2010.5613591","url":null,"abstract":"As the complexity and functionality of electronic equipment increases over time, testing of modern day electronics has brought about the need for more complex stimulus and measurement capabilities. New methodologies such as Virtual and Synthetic Instrumentation have emerged to provide a more flexible ATE that can be re-configured to support a variety of technologies required by the modern day unit under test (UUT). Synthetic instruments can provide a solution to obsolescence in legacy ATEs and the flexibility required for commercial ATEs. A project was initiated to implement a prototype FPGA based reconfigurable Synthetic Instrument Core Framework that could directly interpret and use IEEE 1641 signals. IEEE Std 1641 provides for the accurate definition of stimulus and measurement signals, each of which are supported by a mathematical (functional) definition. During this project, both the software and hardware were developed for the core framework, which enabled the automatic generation and synthesis of synthetic instruments required to generate or measure a selection of IEEE 1641 signal models. The results obtained using the synthetic instruments could then be validated against simulations from EADS newWaveX™ signal development tool. This paper provides an overview of the project and the processes used to determine and implement an appropriate architecture for such a synthetic instrument system. It mainly focuses on the core of the system, i.e. the controller and codec subsystems. The paper concludes by discussing the suitability of an FPGA system for an IEEE 1641 compliant synthetic instrument system, comparing synthesized signals with simulated waveforms, and indicating suitable future enhancements to the system.","PeriodicalId":235303,"journal":{"name":"2010 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130687985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1