Electron Microscopy and Analysis 1997最新文献

筛选
英文 中文
Construction of a Database of HREM Images on the World Wide Web 万维网上HREM图像数据库的构建
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-30
D. Shindo, A. Taniyama, Y. Murakami, K. Hiraga, T. Oikawa, A. Kirkland
{"title":"Construction of a Database of HREM Images on the World Wide Web","authors":"D. Shindo, A. Taniyama, Y. Murakami, K. Hiraga, T. Oikawa, A. Kirkland","doi":"10.1201/9781003063056-30","DOIUrl":"https://doi.org/10.1201/9781003063056-30","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116795927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interpretation of Electron Energy Loss Spectra from Hard Elastic Carbon and Related Materials 硬弹性碳及相关材料电子能量损失谱的解释
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-41
Jun Yuan, N. Menon, G. Amaratunga, M. Chhowalla, Cj Keily
{"title":"Interpretation of Electron Energy Loss Spectra from Hard Elastic Carbon and Related Materials","authors":"Jun Yuan, N. Menon, G. Amaratunga, M. Chhowalla, Cj Keily","doi":"10.1201/9781003063056-41","DOIUrl":"https://doi.org/10.1201/9781003063056-41","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121052001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transmission Electron Microscopy of the Low Temperature Oxidation of Nb3Al Nb3Al低温氧化的透射电镜研究
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-160
Y. Kim, K. Knowles
{"title":"Transmission Electron Microscopy of the Low Temperature Oxidation of Nb3Al","authors":"Y. Kim, K. Knowles","doi":"10.1201/9781003063056-160","DOIUrl":"https://doi.org/10.1201/9781003063056-160","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129577725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The development of an ultrahigh vacuum field emission electron microscope for the observation and analysis of crystal surfaces. 用于观察和分析晶体表面的超高真空场发射电子显微镜的研制。
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-13
M. Takeguchi, T. Honda, Y. Ishida, A. Kirkland, M. Tanaka, K. Furuya
{"title":"The development of an ultrahigh vacuum field emission electron microscope for the observation and analysis of crystal surfaces.","authors":"M. Takeguchi, T. Honda, Y. Ishida, A. Kirkland, M. Tanaka, K. Furuya","doi":"10.1201/9781003063056-13","DOIUrl":"https://doi.org/10.1201/9781003063056-13","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128591532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An investigation of the ‘omega-phase’ in Ni-rich Ni-Al 富镍镍铝中“ω -相”的研究
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-149
Y. Zheng, C. Boothroyd
{"title":"An investigation of the ‘omega-phase’ in Ni-rich Ni-Al","authors":"Y. Zheng, C. Boothroyd","doi":"10.1201/9781003063056-149","DOIUrl":"https://doi.org/10.1201/9781003063056-149","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126333673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The determination of the ionicity of sapphire using energy-filtered high resolution electron microscopy 能量过滤高分辨电子显微镜法测定蓝宝石的离子性
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-28
S. Lloyd, R. E. Dunin-Borkowskit, C. Boothroyd
{"title":"The determination of the ionicity of sapphire using energy-filtered high resolution electron microscopy","authors":"S. Lloyd, R. E. Dunin-Borkowskit, C. Boothroyd","doi":"10.1201/9781003063056-28","DOIUrl":"https://doi.org/10.1201/9781003063056-28","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131956024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TEM Study of Facet Junctions in YBa2Cu3O7-δ/PrBa2Cu3O7-δ Thin Film Patterned Multilayer Structures YBa2Cu3O7-δ/PrBa2Cu3O7-δ薄膜图案多层结构中小面结的透射电镜研究
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-108
M. Barnett, M. Aindow, J. Abell, PJ Hirst, N. Chew, R. Humphreys
{"title":"TEM Study of Facet Junctions in YBa2Cu3O7-δ/PrBa2Cu3O7-δ Thin Film Patterned Multilayer Structures","authors":"M. Barnett, M. Aindow, J. Abell, PJ Hirst, N. Chew, R. Humphreys","doi":"10.1201/9781003063056-108","DOIUrl":"https://doi.org/10.1201/9781003063056-108","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125204199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of the tensile properties of bovine muscle at 20°C and 3°C by in situ dynamic measurements and imaging in high pressure scanning electron microscopy (HPSEM) 牛肌肉在20°C和3°C时拉伸性能的原位动态测量和高压扫描电镜(HPSEM)成像比较
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-65
T. Tsavalos, K. Hollis, Js Shah
{"title":"Comparison of the tensile properties of bovine muscle at 20°C and 3°C by in situ dynamic measurements and imaging in high pressure scanning electron microscopy (HPSEM)","authors":"T. Tsavalos, K. Hollis, Js Shah","doi":"10.1201/9781003063056-65","DOIUrl":"https://doi.org/10.1201/9781003063056-65","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131019625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Crystallography of faceted boundaries in SrTiO3 electronic ceramics SrTiO3电子陶瓷中分面边界的晶体学
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-134
Z. Mao, K. Knowles
{"title":"Crystallography of faceted boundaries in SrTiO3 electronic ceramics","authors":"Z. Mao, K. Knowles","doi":"10.1201/9781003063056-134","DOIUrl":"https://doi.org/10.1201/9781003063056-134","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133736208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A New Method to Obtain Long Camera Lengths and High Momentum Resolution in ω-q Patterns 在ω-q模式下获得长相机长度和高动量分辨率的新方法
Electron Microscopy and Analysis 1997 Pub Date : 2022-01-05 DOI: 10.1201/9781003063056-45
P. Midgley
{"title":"A New Method to Obtain Long Camera Lengths and High Momentum Resolution in ω-q Patterns","authors":"P. Midgley","doi":"10.1201/9781003063056-45","DOIUrl":"https://doi.org/10.1201/9781003063056-45","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124309528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书