D. Shindo, A. Taniyama, Y. Murakami, K. Hiraga, T. Oikawa, A. Kirkland
{"title":"Construction of a Database of HREM Images on the World Wide Web","authors":"D. Shindo, A. Taniyama, Y. Murakami, K. Hiraga, T. Oikawa, A. Kirkland","doi":"10.1201/9781003063056-30","DOIUrl":"https://doi.org/10.1201/9781003063056-30","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116795927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jun Yuan, N. Menon, G. Amaratunga, M. Chhowalla, Cj Keily
{"title":"Interpretation of Electron Energy Loss Spectra from Hard Elastic Carbon and Related Materials","authors":"Jun Yuan, N. Menon, G. Amaratunga, M. Chhowalla, Cj Keily","doi":"10.1201/9781003063056-41","DOIUrl":"https://doi.org/10.1201/9781003063056-41","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121052001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Transmission Electron Microscopy of the Low Temperature Oxidation of Nb3Al","authors":"Y. Kim, K. Knowles","doi":"10.1201/9781003063056-160","DOIUrl":"https://doi.org/10.1201/9781003063056-160","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129577725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Takeguchi, T. Honda, Y. Ishida, A. Kirkland, M. Tanaka, K. Furuya
{"title":"The development of an ultrahigh vacuum field emission electron microscope for the observation and analysis of crystal surfaces.","authors":"M. Takeguchi, T. Honda, Y. Ishida, A. Kirkland, M. Tanaka, K. Furuya","doi":"10.1201/9781003063056-13","DOIUrl":"https://doi.org/10.1201/9781003063056-13","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128591532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An investigation of the ‘omega-phase’ in Ni-rich Ni-Al","authors":"Y. Zheng, C. Boothroyd","doi":"10.1201/9781003063056-149","DOIUrl":"https://doi.org/10.1201/9781003063056-149","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126333673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The determination of the ionicity of sapphire using energy-filtered high resolution electron microscopy","authors":"S. Lloyd, R. E. Dunin-Borkowskit, C. Boothroyd","doi":"10.1201/9781003063056-28","DOIUrl":"https://doi.org/10.1201/9781003063056-28","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131956024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Barnett, M. Aindow, J. Abell, PJ Hirst, N. Chew, R. Humphreys
{"title":"TEM Study of Facet Junctions in YBa2Cu3O7-δ/PrBa2Cu3O7-δ Thin Film Patterned Multilayer Structures","authors":"M. Barnett, M. Aindow, J. Abell, PJ Hirst, N. Chew, R. Humphreys","doi":"10.1201/9781003063056-108","DOIUrl":"https://doi.org/10.1201/9781003063056-108","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125204199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of the tensile properties of bovine muscle at 20°C and 3°C by in situ dynamic measurements and imaging in high pressure scanning electron microscopy (HPSEM)","authors":"T. Tsavalos, K. Hollis, Js Shah","doi":"10.1201/9781003063056-65","DOIUrl":"https://doi.org/10.1201/9781003063056-65","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131019625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Crystallography of faceted boundaries in SrTiO3 electronic ceramics","authors":"Z. Mao, K. Knowles","doi":"10.1201/9781003063056-134","DOIUrl":"https://doi.org/10.1201/9781003063056-134","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133736208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A New Method to Obtain Long Camera Lengths and High Momentum Resolution in ω-q Patterns","authors":"P. Midgley","doi":"10.1201/9781003063056-45","DOIUrl":"https://doi.org/10.1201/9781003063056-45","url":null,"abstract":"","PeriodicalId":224848,"journal":{"name":"Electron Microscopy and Analysis 1997","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124309528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}