发布求助
文献互助 智能选刊 最新文献

Biological Field Emission Scanning Electron Microscopy最新文献

筛选
英文 中文
New Opportunities for FIB/SEM EDX in Nanomedicine: Cancerogenesis Research 纳米医学中FIB/SEM EDX的新机遇:癌变研究
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH25
D. Drobne, Sara Novak, A. Erman, G. Dražič
{"title":"New Opportunities for FIB/SEM EDX in Nanomedicine: Cancerogenesis Research","authors":"D. Drobne, Sara Novak, A. Erman, G. Dražič","doi":"10.1002/9781118663233.CH25","DOIUrl":"https://doi.org/10.1002/9781118663233.CH25","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121081912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Element Analysis in the FEGSEM: Application and Limitations for Biological Systems FEGSEM中的元素分析:在生物系统中的应用和局限性
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH28
A. Warley, J. Skepper
{"title":"Element Analysis in the FEGSEM: Application and Limitations for Biological Systems","authors":"A. Warley, J. Skepper","doi":"10.1002/9781118663233.CH28","DOIUrl":"https://doi.org/10.1002/9781118663233.CH28","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125136591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Low-Voltage Scanning Electron Microscopy in Yeast Cells 酵母细胞的低压扫描电镜
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH16
M. Osumi
{"title":"Low-Voltage Scanning Electron Microscopy in Yeast Cells","authors":"M. Osumi","doi":"10.1002/9781118663233.CH16","DOIUrl":"https://doi.org/10.1002/9781118663233.CH16","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121474871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Scanning Electron Microscopy: Theory, History and Development of the Field Emission Scanning Electron Microscope 扫描电子显微镜:场发射扫描电子显微镜的理论、历史和发展
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH1
D. Joy
{"title":"Scanning Electron Microscopy: Theory, History and Development of the Field Emission Scanning Electron Microscope","authors":"D. Joy","doi":"10.1002/9781118663233.CH1","DOIUrl":"https://doi.org/10.1002/9781118663233.CH1","url":null,"abstract":"Since its initial development (Everhart and Thornley, 1958) the scanning electron microscope (SEM) has earned a reputation for being the most widely used, high performance, imaging technology that is available for applications ranging from imaging, fabrication, patterning, and chemical analysis, and for materials of all types and applications. It is estimated that 150 000 or so such instruments are now currently in use worldwide, varying in performance and complexity from simple desk-top systems to state-of-the-art field emission gun systems that can now cost in excess of $5 million. The basic principle of the scanning electron microscope is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of many thousands of times, and with an energy varying from 100 eV or less to a maximum of 30 keV or more. This beam spot is typically then scanned (Figure 1.1) in a linear “raster” pattern across the region of interest, although other patterns – such as a radial beam – are sometimes employed for special purposes. Typically the final deposited pattern will contain of the order of 1000 × 1000 or more individual imaging points. The incident beam electrons can interact with the sample atoms through either elastic or inelastic scattering. Elastic scattering is where the incident electrons are deflected with no loss of energy. Inelastic scattering involves a loss of energy, often by ionizing the sample atoms. The incident electrons will scatter (both elastically and inelastically) many times in","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125725751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Preparation of Vitrified Cells for TEM by Cryo-FIB Microscopy 用冷冻fib显微镜制备透射电镜玻璃化细胞
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH19
Y. Fukuda, A. Leis, A. Rigort
{"title":"Preparation of Vitrified Cells for TEM by Cryo-FIB Microscopy","authors":"Y. Fukuda, A. Leis, A. Rigort","doi":"10.1002/9781118663233.CH19","DOIUrl":"https://doi.org/10.1002/9781118663233.CH19","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115457381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A History of JEOL Field Emission Scanning Electron Microscopes with Reference to Biological Applications JEOL场发射扫描电子显微镜的历史及其生物学应用
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH4
K. Ogura, A. Yarwood
{"title":"A History of JEOL Field Emission Scanning Electron Microscopes with Reference to Biological Applications","authors":"K. Ogura, A. Yarwood","doi":"10.1002/9781118663233.CH4","DOIUrl":"https://doi.org/10.1002/9781118663233.CH4","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130637344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-Resolution Cryo-Scanning Electron Microscopy of Macromolecular Complexes 大分子复合物的高分辨率冷冻扫描电镜
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH12
Sebastian Tacke, F. Lucas, J. Woodward, H. Gross, R. Wepf
{"title":"High-Resolution Cryo-Scanning Electron Microscopy of Macromolecular Complexes","authors":"Sebastian Tacke, F. Lucas, J. Woodward, H. Gross, R. Wepf","doi":"10.1002/9781118663233.CH12","DOIUrl":"https://doi.org/10.1002/9781118663233.CH12","url":null,"abstract":"The beauty of Scanning Electron Microscopy (SEM) is its power to describe and integrate structural details, mainly surface related details, within the context of a complex system. Its unique ability compared to other Electron Microscopy techniques (STEM & TEM) is that handling and imaging of bulk samples is in principal possible and hence sectioning, thinning or replicating of the specimen is not essential when surfaces structures are to be investigated. With the introduction of Field Emission SEM (FESEM), especially in combination with improvements to the signal detection efficiency (\"in-lens\" detection and new type of detectors), high resolution SEM (HRSEM) has become a powerful approach to describe structural details even down to macromolecular dimensions (1-2nm) for structural studies in Biology and soft-material science.","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114263389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Chemical Fixation 化学固定
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.ch10
B. Humbel, H. Schwarz, E. Tranfield, R. Fleck
{"title":"Chemical Fixation","authors":"B. Humbel, H. Schwarz, E. Tranfield, R. Fleck","doi":"10.1002/9781118663233.ch10","DOIUrl":"https://doi.org/10.1002/9781118663233.ch10","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128903636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Correlative Array Tomography 相关阵列层析成像
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH21
Thomas Templier, Richard Hans Robert Hahnloser
{"title":"Correlative Array Tomography","authors":"Thomas Templier, Richard Hans Robert Hahnloser","doi":"10.1002/9781118663233.CH21","DOIUrl":"https://doi.org/10.1002/9781118663233.CH21","url":null,"abstract":"Correlative array tomography (CAT) makes use of the fixative agent glutaraldehyde and requires heavy metal staining for ultrastructural contrast. A key component of array tomography (AT) relies on the production of arrays of ultrathin sections from resin‐embedded biological samples. The need for correlative light and electron microscopy lies in the intrinsic properties of biological tissues, namely the intricate relationship between the molecular and physical architectures. Fixation, dehydration, and resin embedding are necessary steps in order to visualize biological tissue in electron microscopes. This chapter summarizes the key differences between CAT protocols for circuit tracing and for proteometric analysis. It briefly reviews several AT‐compatible techniques for the collection of ultrathin sections of resin‐embedded tissue. The chapter details imaging procedures for the two modalities: light microscopy and electron microscopy. Finally, it presents an application that demonstrates the power of CAT applied to the analysis of brain circuits.","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128517479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Field Emission Scanning Electron Microscopy in Food Research 场发射扫描电镜在食品研究中的应用
Biological Field Emission Scanning Electron Microscopy Pub Date : 2019-02-15 DOI: 10.1002/9781118663233.CH17
J. Hazekamp, Marjolein van Ruijven
{"title":"Field Emission Scanning Electron Microscopy in Food Research","authors":"J. Hazekamp, Marjolein van Ruijven","doi":"10.1002/9781118663233.CH17","DOIUrl":"https://doi.org/10.1002/9781118663233.CH17","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125178813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信