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On isotropic scattering of electromagnetic radiation 电磁辐射的各向同性散射
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513806
S. Gov, S. Shtrikman
{"title":"On isotropic scattering of electromagnetic radiation","authors":"S. Gov, S. Shtrikman","doi":"10.1109/EEIS.1995.513806","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513806","url":null,"abstract":"We describe an infinitely thin U-shaped conductor which scatters unpolarized, coherent, electromagnetic radiation isotropically in power. The shape of this scatterer is defined and its relevant electrical characteristics such as current distribution, radiation pattern and Q-factor, are derived. We then examine the response of this scatterer to an incident unpolarized radiation. In addition, we study the effect of finite conductivity on the behaviour of the scatterer.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115365969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Accurate frequency estimation in power systems by DSP 基于DSP的电力系统精确频率估计
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.514182
V. Backmutsky, V. Zmudikov
{"title":"Accurate frequency estimation in power systems by DSP","authors":"V. Backmutsky, V. Zmudikov","doi":"10.1109/EEIS.1995.514182","DOIUrl":"https://doi.org/10.1109/EEIS.1995.514182","url":null,"abstract":"A method of integrating zero-crossing for accurate estimation of the actual power-line frequency is considered. It is based on integration of samples of power-line voltage and on interpolation of the integrated value near its zero-crossing. The main advantage of this method as compared to conventional zero-crossing technique is a significant increase in resolution and a decrease of round-off errors of A/D-converter. Due to its simplicity, rapidity and efficiency, this method can be used as a basis for prediction of the actual power-line frequency and for other DSP-applications. Theoretical and experimental data concerning proposed method are described and discussed.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127105764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
A comparison of neural network and Bayes recognition approaches to the diagnostic of multiple sclerosis 神经网络与贝叶斯识别在多发性硬化症诊断中的比较
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513773
Y. Nehmadi, H. Guterman
{"title":"A comparison of neural network and Bayes recognition approaches to the diagnostic of multiple sclerosis","authors":"Y. Nehmadi, H. Guterman","doi":"10.1109/EEIS.1995.513773","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513773","url":null,"abstract":"This article describes the application of a Multi-Layer Perceptron (MLP) to the problem of diagnosing Multiple Sclerosis (MS). The classification information is obtained by a Trigeminal Evoked Potential (TEP) test. The performance of the MLP is compared with that of the human experts and the Bayes classifier. The efficiency of the neural network and the classical classifiers in conjunction with 4 types of features - the Fourier transform (FT), the peak position, the ARX model coefficient and the temporal wave form - are examined. Although a large clinical data base would be necessary, before this approach can be fully validated, the initial results are very promising. The MLP was found to be less susceptible to the number of features used. The ability of the MLP classifier to generalize is far better than that of the Bayes classifier.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125169004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The PCS CDMA system overview PCS CDMA系统概述
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513791
E. Zehavi
{"title":"The PCS CDMA system overview","authors":"E. Zehavi","doi":"10.1109/EEIS.1995.513791","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513791","url":null,"abstract":"The Code Division Multiple Access (CDMA) protocol has been proposed to the TIA/ATIS Joint Technical Committee (JTC), along with other standards, to become the common air interface standard for the Personal Communications System (PCS). This paper gives an overview of some of the basic principles and concepts of the proposal and a high level description of the PCS CDMA system.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126746921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Detecting heavy ions and protons in space: single-events monitor 探测太空中的重离子和质子:单事件监测器
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.514195
J. Barak, E. Adler, Y. Lifshitz, J. Levinson
{"title":"Detecting heavy ions and protons in space: single-events monitor","authors":"J. Barak, E. Adler, Y. Lifshitz, J. Levinson","doi":"10.1109/EEIS.1995.514195","DOIUrl":"https://doi.org/10.1109/EEIS.1995.514195","url":null,"abstract":"The paper describes a single-board ionizing-radiation monitor which uses HM65162 SRAMs as sensors. They are sensitive to single event upsets and latchups, and can thus detect highly ionizing radiation and alarm in case of excess radiation conditions, like heavy solar flares. The monitor is a low cost, low weight (230 grams), extremely low power consumption (<15 /spl mu/W) unit and is easily implanted in any satellite. It will serve on board of TechSAT, the Technion satellite.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122712256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Super-resolution restoration of continuous image sequence using the LMS algorithm 基于LMS算法的连续图像序列超分辨率恢复
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513799
Michael Elad, A. Feuer
{"title":"Super-resolution restoration of continuous image sequence using the LMS algorithm","authors":"Michael Elad, A. Feuer","doi":"10.1109/EEIS.1995.513799","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513799","url":null,"abstract":"In this paper, we propose computationally efficient super-resolution restoration algorithm for blurred, noisy and down-sampled continuous image sequence. The proposed approach is based on a constrained least squares (CLS) super-resolution algorithm, applied recursively in time. An updating equation based on the instantaneous squared error gradient gives a block-LMS version algorithm. An adaptive regularization term is shown to improve the restored image sequence quality by forcing smoothness, while preserving edges. The computation complexity of the obtained algorithm is of the order O{L/sup 2/log(L)} per one output image, where L/sup 2/ is the number of pixels in the output image. Simulations carried out on test sequences prove this method to be applicable, efficient, and with very promising results. A frequency domain version (FDBLMS) of the algorithm is proposed for special cases, with further improvement in computational complexity, and rate of convergence.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"312 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116805767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Influence of high fluence neutron irradiation on forward current of semiconductor detectors 高通量中子辐照对半导体探测器正向电流的影响
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513840
M. Acciarri, N. Croitoru, C. Leroy, S. Pensotti, P. Rancoita, M. Redaelli, A. Seidman
{"title":"Influence of high fluence neutron irradiation on forward current of semiconductor detectors","authors":"M. Acciarri, N. Croitoru, C. Leroy, S. Pensotti, P. Rancoita, M. Redaelli, A. Seidman","doi":"10.1109/EEIS.1995.513840","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513840","url":null,"abstract":"Forward current-voltage (I-V) characteristics of non-irradiated and irradiated p/sup +/-n-n/sup +/ detectors, at neutron fluences (/spl phi/) up to 10/sup 14/ n/cm/sup 2/, were measured and the obtained data were analyzed. The I/sub f/-V/sub f/ characteristics confirmed the existence of a critical fluences (/spl phi//sub c/>5/spl times/10/sup 11/ n/cm/sup 2/), where abrupt changes in the dependence of forward current on voltage appear. We found that at /spl phi/>/spl phi//sub c/ a similar abrupt drop of the rectification ratio (Rec) appears, but a large reverse voltage could, nevertheless, be applied. The series resistivity (/spl rho/), calculated from the I/sub f/-V/sub f/ characteristics, for both non-irradiated (NI) and irradiated detectors, shows that for NI detectors the resistivity is of the same order of magnitude like that of the silicon bulk (1200 /spl Omega/ cm). The resistivity (/spl rho/) for irradiated devices increases (with increasing values of /spl phi/, of up to 10/sup 14/ n/cm/sup 2/), up to about 4/spl times/10/sup 3/ /spl Omega/ cm. As a result of the increase of /spl rho/ with /spl phi/, the initial p/sup +/-n-n/sup +/ diode becomes a p/sup +/-/spl nu/-n/sup +/ device. This study explains the rather good charge collection efficiency in spite of strongly affected physical properties.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114691635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Diffraction effects on degenerate transverse laser modes 简并横向激光模的衍射效应
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513830
T. Hurvits, S. Ruschin, M. Keselbrener
{"title":"Diffraction effects on degenerate transverse laser modes","authors":"T. Hurvits, S. Ruschin, M. Keselbrener","doi":"10.1109/EEIS.1995.513830","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513830","url":null,"abstract":"The influence of intracavity non-circular apertures on the frequency of degenerated transverse modes is studied and measured in a CO/sub 2/ laser. Beats were detected due to degeneracy lifting and their frequency was measured as a function of aperture's parameters. The effect of mirror tilt on the beat frequency was also measured and attributed to diffraction, since the limiting aperture is driven off-axis by the tilt. An analytical model based on Gaussian aperture was developed for the case of a symmetric slit introduced in the resonator, and experimental results mere confirmed also by numerical simulations. Cooperative frequency locking was observed in all cases, and the critical beat frequency for this effect was determined.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133551305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation of light beam propagation in nonlinear media 光束在非线性介质中的传播模拟
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513803
M. Zonnenschein, D. Censor
{"title":"Simulation of light beam propagation in nonlinear media","authors":"M. Zonnenschein, D. Censor","doi":"10.1109/EEIS.1995.513803","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513803","url":null,"abstract":"The present paper concerns the simulation of nonlinear wave propagation in the ray regime, i.e., in the limit of geometrical optics. The medium involved is nonlinear. Linear ray propagation is conventionally computed by using Hamilton's ray equations, whose inhomogeneous terms are derived from the dispersion equation. The formalism used to solve such a set of equations is the Runge-Kutta algorithm. In the present case of nonlinear propagation, the inhomogeneous terms depend on field amplitudes which are heuristically determined by the convergence (or divergence) of the rays in the beam. However, in the present case the varying convergence depends on the solution of the Hamilton equations, and it is therefore necessary to modify the original Runge-Kutta scheme, by building into it some iteration mechanism, such that the process converges to values which take into account the amplitude effect. As expected the results display self-focusing effects characteristic of nonlinear optics problems.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133106507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improving impedance matrix localization by a digital filtering approach 用数字滤波方法改进阻抗矩阵的局部化
Eighteenth Convention of Electrical and Electronics Engineers in Israel Pub Date : 1995-03-07 DOI: 10.1109/EEIS.1995.513782
Z. Baharav, Y. Leviatan
{"title":"Improving impedance matrix localization by a digital filtering approach","authors":"Z. Baharav, Y. Leviatan","doi":"10.1109/EEIS.1995.513782","DOIUrl":"https://doi.org/10.1109/EEIS.1995.513782","url":null,"abstract":"Wavelet bases have been employed recently in numerical solutions of integral equations encountered in electromagnetic scattering problems. The advantage of these bases lies in their ability to render the problem impedance matrix more localized. In this paper, we propose a digital filtering approach for integrating wavelet transforms into existing electromagnetic-scattering numerical-solvers. The suggested approach facilitates a much faster implementation of the transform. It also allows the incorporation of other ideas such as wave-packets and best-basis from the discipline of digital signal processing. A physical interpretation of the basis functions obtained by a few selected structures of digital filters is given, and their usefulness is explained. A numerical example is given for the case of TM scattering by a square cylinder.","PeriodicalId":219797,"journal":{"name":"Eighteenth Convention of Electrical and Electronics Engineers in Israel","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133840321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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