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Comparative study of machine learning test case prioritization for continuous integration testing 持续集成测试中机器学习测试用例优先级的比较研究
3区 计算机科学
Software Quality Journal Pub Date : 2023-07-28 DOI: 10.1007/s11219-023-09646-0
Dusica Marijan
{"title":"Comparative study of machine learning test case prioritization for continuous integration testing","authors":"Dusica Marijan","doi":"10.1007/s11219-023-09646-0","DOIUrl":"https://doi.org/10.1007/s11219-023-09646-0","url":null,"abstract":"There is a growing body of research indicating the potential of machine learning to tackle complex software testing challenges. One such challenge pertains to continuous integration testing, which is highly time-constrained, and generates a large amount of data coming from iterative code commits and test runs. In such a setting, we can use plentiful test data for training machine learning predictors to identify test cases able to speed up the detection of regression bugs introduced during code integration. However, different machine learning models can have different fault prediction performance depending on the context and the parameters of continuous integration testing, for example, variable time budget available for continuous integration cycles, or the size of test execution history used for learning to prioritize failing test cases. Existing studies on test case prioritization rarely study both of these factors, which are essential for the continuous integration practice. In this study, we perform a comprehensive comparison of the fault prediction performance of machine learning approaches that have shown the best performance on test case prioritization tasks in the literature. We evaluate the accuracy of the classifiers in predicting fault-detecting tests for different values of the continuous integration time budget and with different lengths of test history used for training the classifiers. In evaluation, we use real-world and augmented industrial datasets from a continuous integration practice. The results show that different machine learning models have different performance for different size of test history used for model training and for different time budgets available for test case execution. Our results imply that machine learning approaches for test prioritization in continuous integration testing should be carefully configured to achieve optimal performance.","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135556996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Object coverage criteria for supporting object-oriented testing 支持面向对象测试的对象覆盖标准
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-30 DOI: 10.1007/s11219-023-09643-3
M. Ghoreshi, H. Haghighi
{"title":"Object coverage criteria for supporting object-oriented testing","authors":"M. Ghoreshi, H. Haghighi","doi":"10.1007/s11219-023-09643-3","DOIUrl":"https://doi.org/10.1007/s11219-023-09643-3","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47804249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Guest editorial: special issue on “IT quality challenges in a digital society” 客座社论:“数字社会中的IT质量挑战”特刊
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-23 DOI: 10.1007/s11219-023-09644-2
Antonio Vallecillo, Ricardo Pérez-Castillo, Joost Visser
{"title":"Guest editorial: special issue on “IT quality challenges in a digital society”","authors":"Antonio Vallecillo, Ricardo Pérez-Castillo, Joost Visser","doi":"10.1007/s11219-023-09644-2","DOIUrl":"https://doi.org/10.1007/s11219-023-09644-2","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45060454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implicit and explicit mixture of experts models for software defect prediction 用于软件缺陷预测的隐式和显式专家模型混合
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-20 DOI: 10.1007/s11219-023-09640-6
Aditya Shankar Mishra, Santosh Singh Rathore
{"title":"Implicit and explicit mixture of experts models for software defect prediction","authors":"Aditya Shankar Mishra, Santosh Singh Rathore","doi":"10.1007/s11219-023-09640-6","DOIUrl":"https://doi.org/10.1007/s11219-023-09640-6","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52456220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ReSuMo: a regression strategy and tool for mutation testing of solidity smart contracts resume:一种回归策略和工具,用于可靠性智能合约的突变测试
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-17 DOI: 10.1007/s11219-023-09637-1
Morena Barboni, A. Morichetta, A. Polini, F. Casoni
{"title":"ReSuMo: a regression strategy and tool for mutation testing of solidity smart contracts","authors":"Morena Barboni, A. Morichetta, A. Polini, F. Casoni","doi":"10.1007/s11219-023-09637-1","DOIUrl":"https://doi.org/10.1007/s11219-023-09637-1","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43737624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Towards an understanding of memory leak patterns: an empirical study in Python 对内存泄漏模式的理解:Python的经验研究
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-17 DOI: 10.1007/s11219-023-09641-5
Jing Chen, Dongjin Yu, Haiyang Hu
{"title":"Towards an understanding of memory leak patterns: an empirical study in Python","authors":"Jing Chen, Dongjin Yu, Haiyang Hu","doi":"10.1007/s11219-023-09641-5","DOIUrl":"https://doi.org/10.1007/s11219-023-09641-5","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46624085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Just-in-time defect prediction for mobile applications: using shallow or deep learning? 移动应用程序的实时缺陷预测:使用浅层学习还是深度学习?
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-09 DOI: 10.1007/s11219-023-09629-1
Raymon van Dinter, C. Catal, G. Giray, B. Tekinerdogan
{"title":"Just-in-time defect prediction for mobile applications: using shallow or deep learning?","authors":"Raymon van Dinter, C. Catal, G. Giray, B. Tekinerdogan","doi":"10.1007/s11219-023-09629-1","DOIUrl":"https://doi.org/10.1007/s11219-023-09629-1","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47669582","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Software fault prediction using deep learning techniques 利用深度学习技术进行软件故障预测
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-06-05 DOI: 10.1007/s11219-023-09642-4
Iqra Batool, T. Khan
{"title":"Software fault prediction using deep learning techniques","authors":"Iqra Batool, T. Khan","doi":"10.1007/s11219-023-09642-4","DOIUrl":"https://doi.org/10.1007/s11219-023-09642-4","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43212503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A microservice-based framework for multi-level testing of cyber-physical systems 基于微服务的网络物理系统多级测试框架
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-05-31 DOI: 10.1007/s11219-023-09639-z
I. Aldalur, Aitor Arrieta, Aitor Agirre, G. Sagardui, Maite Arratibel
{"title":"A microservice-based framework for multi-level testing of cyber-physical systems","authors":"I. Aldalur, Aitor Arrieta, Aitor Agirre, G. Sagardui, Maite Arratibel","doi":"10.1007/s11219-023-09639-z","DOIUrl":"https://doi.org/10.1007/s11219-023-09639-z","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49307555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Minimizing incident response time in real-world scenarios using quantum computing 使用量子计算最小化现实场景中的事件响应时间
IF 1.9 3区 计算机科学
Software Quality Journal Pub Date : 2023-05-26 DOI: 10.1007/s11219-023-09632-6
M. Serrano, L. E. Sánchez, Antonio Santos-Olmo, David García-Rosado, C. Blanco, Vita Santa Barletta, D. Caivano, E. Fernández-Medina
{"title":"Minimizing incident response time in real-world scenarios using quantum computing","authors":"M. Serrano, L. E. Sánchez, Antonio Santos-Olmo, David García-Rosado, C. Blanco, Vita Santa Barletta, D. Caivano, E. Fernández-Medina","doi":"10.1007/s11219-023-09632-6","DOIUrl":"https://doi.org/10.1007/s11219-023-09632-6","url":null,"abstract":"","PeriodicalId":21827,"journal":{"name":"Software Quality Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2023-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46833711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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