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Comparison between complete and simplified methods for determining the microwave noise parameters of HEMTs 确定hemt微波噪声参数的完整方法与简化方法的比较
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327068
A. Caddemi, M. Sannino
{"title":"Comparison between complete and simplified methods for determining the microwave noise parameters of HEMTs","authors":"A. Caddemi, M. Sannino","doi":"10.1109/ARFTG.1994.327068","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327068","url":null,"abstract":"Modem automatic noise parameter measuring systems are based on measurements of some values of F(rs ) for different values of IГs (more than four, for redundancy) realized by adjusting an admittance transformer (tuner) inserted between the noise source and the TUT mput . Such values are then manipulated by means of proper data processing techniques using eqn.( 1) [ 11. This measuring procedure is hereafter referred to as standard to point out that the old `Standards on methods of measuring noise in linear twoports´ published by the IRE Subcommittee on noise in 1960 is considered obsolete by all the experimenters.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"300 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133768172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The Multi-State Two-port: An Alternative Transfer Standard 多状态双端口:另一种传输标准
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327053
G. Engen, R. Judish, J. Juroshek
{"title":"The Multi-State Two-port: An Alternative Transfer Standard","authors":"G. Engen, R. Judish, J. Juroshek","doi":"10.1109/ARFTG.1994.327053","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327053","url":null,"abstract":"In a companion paper [1] the proposed use of a ¿stable solid state programmable impedance generator¿ as a calibration transfer and verification standard, for vector network analyzers, (VNA) has been suggested. An obvious requirement is that the multi-state device provide a high degree of stability and repeatability. This paper describes a series of preliminary tests, using the NIST six-port systems, to evaluate the parameters of interest. The application of this device in connector evaluation is also reported.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114482081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Manufacturing Microwave and RF Test Equipment To Meet The Requirements of ISO 9002 制造微波和射频测试设备以满足ISO 9002的要求
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327065
Benny R. Smith
{"title":"Manufacturing Microwave and RF Test Equipment To Meet The Requirements of ISO 9002","authors":"Benny R. Smith","doi":"10.1109/ARFTG.1994.327065","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327065","url":null,"abstract":"ISO 9002 specifies quality system requirements which must be met in order to demonstrate a supplier¿s capability to control processes that determine the acceptability of products supplied to a customer. These requirements are designed to detect and prevent any non-conformity during manufacturing and installation. In practice, ISO 9002 requires a supplier to establish the intent, implementation, and effectiveness of their quality system. The quality system includes all procedures, personnel, and resources involved in insuring that products meet their published specifications. The Microwave Instrument Division (MID) of Hewlett-Packard Co. achieved ISO 9002 registration in April, 1993. This paper explains how registration was achieved, with special emphasis on the testing of products.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132111710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Data Processing For Q Factor Measurement Q因子测量的数据处理
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327064
D. Kajfez
{"title":"Data Processing For Q Factor Measurement","authors":"D. Kajfez","doi":"10.1109/ARFTG.1994.327064","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327064","url":null,"abstract":"The Q factor and the coupling coefficient are determined from the file of reflection coefficient data measured with a vector network analyzer. The data processing is accomplished by a curve fitting procedure for a fractional linear mapping on a complex plane. The procedure is well suited for very high values of Q factor, and it is performed on a personal computer. The number of measured points is considerably higher than the number of unknowns to be determined, so that the results contain also the values of estimated errors.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"264 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121205270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated High-Power RF Microwave Tube Test Stand 自动化大功率射频微波管试验台
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327063
A. Young, D. Rees
{"title":"Automated High-Power RF Microwave Tube Test Stand","authors":"A. Young, D. Rees","doi":"10.1109/ARFTG.1994.327063","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327063","url":null,"abstract":"This paper describes an automated test stand used for testing the high-power klystron amplifiers for the Ground Test Accelerator (GTA). To verify klystron performance, we have developed an automated test system using data-acquisition and control programs based on LabVIEW¿, a program that readily interfaces with both the high-power transmitter¿s programmable logic controller and the GPIB interface test equipment. The automated test system also provides extensive analysis, improved data storage and processing, and documentation of the test conditions. This approach allows one to develop and operate a complex test system using an iconic-programming system. Three automated tests were developed and performed on the high-power klystron: swept-frequency, power-transfer, and voltage standing wave ration (VSWR) at several operating conditions. This paper describes the hardware used to test the klystrons, presents an example of the test data, provides block diagrams of the software used in the test stand, and characterizes all the capabilities for the automated test system. This test facility is being used by the GTA program to fully characterize the klystron amplifiers before they are placed into accelerator service, verify the factory acceptance tests, and determine optimal operating conditions for power levels below saturation. Currently, we are moving the test stand to the Los Alamos Meson Physics Facility (LAMPF) where we will test many klystrons used in their accelerator. These klystrons have been in operation for twenty years. Some of the amplifiers have been rebuilt and other amplifiers are in process of being retuned or decommissioned.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131481908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction 毫米波片上校准技术及其对HEMT参数提取的影响研究
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327054
M. Nishimoto, J. Laskar
{"title":"Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction","authors":"M. Nishimoto, J. Laskar","doi":"10.1109/ARFTG.1994.327054","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327054","url":null,"abstract":"A new procedure has been developed to identify which calibration techniques are most suitable for millimeter-wave, on-wafer measurements. This work quantifies the sources and types of error encountered with SOLT and LRM calibrations in relation to multi-line TRL calibrations at V-band. A sensitivity analysis studies these calibration effects upon InP HEMT parameter extraction at V-Band.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124723758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Microwave Probing Measurements with a Monolithic Six-Port Module (MSPM) 单片六端口模块(MSPM)微波探测测量
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327061
B. Huyart, R. Benelbar, D. Maurin, R. Bosisio
{"title":"Microwave Probing Measurements with a Monolithic Six-Port Module (MSPM)","authors":"B. Huyart, R. Benelbar, D. Maurin, R. Bosisio","doi":"10.1109/ARFTG.1994.327061","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327061","url":null,"abstract":"This paper presents the design of monolithic six-port module MSPM with resistive bridges. It shows how these simple structures may act as directional resistive couplers. Final MMIC circuit includes six-port junction and matched MESFET detectors covering an area of 1.2 mm2 in the frequency range 100 MHz to 3 GHz. The MSPM was bonded in a MIC structure with output coaxial connectors. Experimental results obtained using a commercial network analyzer and our measurement system are in good agreement. The magnitude and the phase variation between the two measurement systems are equal to .2dB and 2 degrees for respective modulus values of 0, 6, 12 dB. For a nominal 20 dB return loss load, the differences are respectively equal to 0.5dB and 5 degrees in the operational frequency band. In a second step, the measurement system was integrated inside the tips of a probe station and experimental results will be available at the ARFTG session.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124926854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Determining Uncertainty in Antenna Array Measurements 确定天线阵列测量中的不确定度
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327062
J. Cha, P. Koert, P. Elliot, R. Groff, Thomas Collins
{"title":"Determining Uncertainty in Antenna Array Measurements","authors":"J. Cha, P. Koert, P. Elliot, R. Groff, Thomas Collins","doi":"10.1109/ARFTG.1994.327062","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327062","url":null,"abstract":"Recently a 7X7 cross dipole array** was built and tested to compare its performance against the predicted calculations which were obtained using the Numerical Electromagnetic Code, version 4 (NEC-4). The cross dipole array was designed to operate at two bands: the lower band ranged from 56 MHz to 140 MHz and the upper band ranged from 130 MHz to 200 MHz. A vector network analyzer (Hewlett Packard 875 1 A), contr_plled by a PC compatible machine over the GPIB interface, was used to characterize the array and some of its subarrays (e.g., 3X3, 2X2, etc.). Over 1500 measurements were made.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127012930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Air Coplanar Wafer Probe 一种空气共面晶圆探头
43rd ARFTG Conference Digest Pub Date : 1994-05-27 DOI: 10.1109/ARFTG.1994.327060
E. Godshalk, Jeremy Burr, Jeff Williams
{"title":"An Air Coplanar Wafer Probe","authors":"E. Godshalk, Jeremy Burr, Jeff Williams","doi":"10.1109/ARFTG.1994.327060","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327060","url":null,"abstract":"A new wafer probe is presented based on using coplanar waveguide in air. The transmission line is called air coplanar waveguide, and the probe an air coplanar probe (ACP). The probe consists of a coaxial connector, a short piece of coaxial cable and finally the air coplanar waveguide which is formed into a probe tip. This air coplanar tip is made of beryllium copper (BeCu) and allows in excess of 500,000 contact cycles. Both the coaxial cable and air coplanar waveguide are very low loss allowing the ACP to have less than 1 dB insertion loss at 40 GHz. The flexible air coplanar waveguide exhibits high mechanical compliance and repeatable measurements for non planar DUT surfaces. For example either surface irregularities up to 25 um high, or 10 degrees of surface non-planarity cause less than -30 dB error in measured data up to 40 GHz. The air coplanar waveguide also allows better viewing of the contact pads of the DUT than previously attainable with wafer probes. A discussion will be included on the development of the probe and examples of it in use.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128232689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A Non-Linear High-Power MESFET Amplifier Model Verified by Waveform and Load-Pull Measurements 一种非线性高功率MESFET放大器模型，经波形和负载-拉力测量验证
43rd ARFTG Conference Digest Pub Date : 1994-05-01 DOI: 10.1109/ARFTG.1994.327067
C. Wei, Y. Lan, Y. Tkachenko, J. Hwang
{"title":"A Non-Linear High-Power MESFET Amplifier Model Verified by Waveform and Load-Pull Measurements","authors":"C. Wei, Y. Lan, Y. Tkachenko, J. Hwang","doi":"10.1109/ARFTG.1994.327067","DOIUrl":"https://doi.org/10.1109/ARFTG.1994.327067","url":null,"abstract":"A high-power metal-semiconductor field-effect transistor amplifier model was developed based on novel theoretical features and experimental verification techniques. The model accurately predicts the amplifier output characteristics, including power, efficiency and linearity, as functions of bias, input and load conditions. Detailed variation of intermodulation distortion with input power was explained. Self-biasing and tuning schemes to improve amplifier linearity were predicted and verified experimentally.","PeriodicalId":217908,"journal":{"name":"43rd ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122296471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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