2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)最新文献_第2页

SAR Handbook Chapter: Measurements-based aging analysis SAR手册章节:基于测量的老化分析

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00093

Javier Alonso, K. Vaidyanathan, R. Pietrantuono

引用次数: 0

RSDA 2020 Workshop Keynote RSDA 2020研讨会主题演讲

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/issrew51248.2020.00021

引用次数: 0

Time-Series-Based Clustering for Failure Analysis in Hardware-in-the-Loop Setups: An Automotive Case Study 基于时间序列的聚类在环硬件故障分析:汽车案例研究

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00039

Claudius V. Jordan, Florian Hauer, Philipp Foth, A. Pretschner

{"title":"Time-Series-Based Clustering for Failure Analysis in Hardware-in-the-Loop Setups: An Automotive Case Study","authors":"Claudius V. Jordan, Florian Hauer, Philipp Foth, A. Pretschner","doi":"10.1109/ISSREW51248.2020.00039","DOIUrl":"https://doi.org/10.1109/ISSREW51248.2020.00039","url":null,"abstract":"Testing is an important cost driver in development projects. Especially in the automotive industry, immense efforts are spent to carry out validation facing increasingly complex systems. Hardware-in-the-Loop test benches are essential elements for (functional) validation. Naturally, failures commonly occur, whose analysis is challenging, time-consuming and oftentimes performed manually, making the diagnosis process one decisive cost-driving factor. By experience, many failures happen due to few underlying faults. We discuss our lessons learned when performing similarity-based clustering to identify representative tests for each fault for system-level testing where test execution times are high and the complexity of the system-under-test and also the test setup leads to complicated failure conditions. Results from an industrial automotive case study–a drive train system dataset consisting of 57 test runs–show that utilizing our general, project-agnostic approach can effectively reduce failure analysis time even with a limited set of data points.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126061447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Using Semantic Analysis and Graph Mining Approaches to Support Software Fault Fixation 使用语义分析和图挖掘方法支持软件故障定位

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00035

Maninder Singh, G. Walia

{"title":"Using Semantic Analysis and Graph Mining Approaches to Support Software Fault Fixation","authors":"Maninder Singh, G. Walia","doi":"10.1109/ISSREW51248.2020.00035","DOIUrl":"https://doi.org/10.1109/ISSREW51248.2020.00035","url":null,"abstract":"Software requirement specification (SRS) documents are written in natural language (NL) and are prone to contain faults due to the inherently ambiguous nature of NL. Inspections are employed to find and fix these faults during the early phases of development, where these are the most cost-effective to fix. Inspections being too manual are very tedious and time consuming to perform. After fixing a fault, the SRS author has to manually re-inspect the document to make sure if there are other similar requirements that need a fix, and also if fixing a fault does not reintroduce another fault in the document (i.e., change impact analysis). The proposed approach in this paper employs NL processing, machine learning, semantic analysis, and graph mining approaches to generate a graph of inter-related requirements (IRR) based on semantic similarity score. The IRR graph is next mined using graph mining approaches to analyze the impact of a change. Our approach when applied using a real SRS generated IRR and yielded promising results. Graph mining approaches resulted in a G-mean of more than 90% to accurately identify the highly similar requirements to support the CIA.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116219644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Multi-Language Web Vulnerability Detection 多语言Web漏洞检测

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00058

Alexandra Figueiredo, Tatjana Lide, M. Correia

引用次数: 0

Applying Modular Decomposition in Simulink 模块化分解在Simulink中的应用

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00033

Monika Jaskolka, Stephen Scott, Vera Pantelic, Alan Wassyng, M. Lawford

引用次数: 3

Software Aging in Image Classification Systems on Cloud and Edge 基于云和边缘的图像分类系统中的软件老化问题

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00099

E. Andrade, F. Machida, R. Pietrantuono, Domenico Cotroneo

{"title":"Software Aging in Image Classification Systems on Cloud and Edge","authors":"E. Andrade, F. Machida, R. Pietrantuono, Domenico Cotroneo","doi":"10.1109/ISSREW51248.2020.00099","DOIUrl":"https://doi.org/10.1109/ISSREW51248.2020.00099","url":null,"abstract":"Image classification systems using machine learning are rapidly adopted in many software application systems. Machine learning models built for image classification tasks are usually deployed on either cloud computing or edge computers close to data sources depending on the performance and resource requirements. However, software reliability aspects during the operation of these systems have not been properly explored. In this paper, we experimentally investigate the software aging phenomena in image classification systems that are continuously running on cloud or edge computing environments. By performing statistical analysis on the measurement data, we detected a suspicious phenomenon of software aging induced by image classification workloads in the memory usages for cloud and edge computing systems. Contrary to the expectation, our experimental results show that the edge system is less impacted by software aging than the cloud system that has four times larger allocated memory resources. We also disclose our software aging data set on our project web site for further exploration of software aging and rejuvenation research.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"110-111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132827829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

When Failure is (Not) an Option: Reliability Models for Microservices Architectures 当失败是(不是)一个选项:微服务架构的可靠性模型

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00031

L. Jagadeesan, V. Mendiratta

{"title":"When Failure is (Not) an Option: Reliability Models for Microservices Architectures","authors":"L. Jagadeesan, V. Mendiratta","doi":"10.1109/ISSREW51248.2020.00031","DOIUrl":"https://doi.org/10.1109/ISSREW51248.2020.00031","url":null,"abstract":"Modern application development and deployment is rapidly evolving to microservices based architectures, in which thousands of microservices communicate with one another and can be independently scaled and updated. While these architectures enable flexibility of deployment and frequency of upgrades, the naive use of thousands of communicating and frequently updated microservices can significantly impact the reliability of applications. To address these challenges, service meshes are used to rapidly detect and respond to microservices failures without necessitating changes to the microservices themselves. However, there are inherent tradeoffs that service meshes must make with regards to how quickly they assume a microservice has failed and the subsequent impact on overall application reliability. We present in this paper a modeling framework for microservices and service mesh reliability that takes these tradeoffs into account. Index Terms–microservices, service mesh, sidecars, circuit breakers, reliability, availability, resilience, reliability models, probabilistic model checking, PRISM.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"790 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116135290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

A Fault Localization and Debugging Support Framework driven by Bug Tracking Data 基于Bug跟踪数据的故障定位与调试支持框架

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/ISSREW51248.2020.00053

Thomas Hirsch

引用次数: 1

Message from the WoSAR 2020 Workshop Chairs 2020年WoSAR研讨会主席致辞

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI: 10.1109/issrew51248.2020.00016

引用次数: 0