{"title":"Simulation of multi-chip module package resonance using commercial finite element electromagnetic software","authors":"R. Clark, A. Agrawal, S. Miller","doi":"10.1109/EPEP.1994.594109","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594109","url":null,"abstract":"Techniques have been developed to predict package resonance frequencies in multiple cavity, MMIC based, T/R modules, using the HP High Frequency Structure Simulator package. This method accounts for partially filled wave guide modes, perturbations due to GaAs MMICs and their metal spacers, and the effects of imperfect cavity end walls. Calculated results are compared to measured package resonances and module performance data.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116304671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electromagnetic modeling of simultaneous switching noise in power and ground planes in electronic packages","authors":"R. Mittra, S. Chebolu","doi":"10.1109/EPEP.1994.594146","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594146","url":null,"abstract":"Accurate modeling of power and ground planes in electronic packages is an important problem from the point of view of extracting the equivalent effective inductance and using it to estimate the simultaneous switching noise (SSO). In this paper, we present two different approaches to calculating the effective inductance of power and ground planes. The first of these, which is based upon a quasi-magnetostatic analysis using the Method of Moments, is applied to the problem of computing the self and mutual inductances of the pins in a typical TAB package. Next, the Finite Difference Time Domain (FDTD) approach is used to model complex power plane structures with multiple planes, transmission lines and vias, and a technique for extracting the effective inductance of such structures is described. A discussion on the relative advantages and disadvantages of the two methods is included in the paper.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123851688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Accuracy in time domain transmission line measurements","authors":"L. A. Hayden, R. Marks","doi":"10.1109/EPEP.1994.594133","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594133","url":null,"abstract":"This paper examines time domain methods for characterizing signal propagation in uniform transmission lines. The impact of the limitations associated with time domain instrumentation and methodologies are examined and guidelines for minimizing errors are presented.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132226670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Use of periodic structure approach to model packaged MMIC and interconnects","authors":"P. Petre, K. Kottapalli, M. Swaminathan","doi":"10.1109/EPEP.1994.594111","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594111","url":null,"abstract":"An approach based on the periodic structure model is developed for full-wave electromagnetic analysis of shielded microstrip components and interconnects on multilayered substrate. The spectral domain integral equation approach is employed in conjunction with the Method of Moments and the Galerkin testing procedure. General planar and certain three dimensional structures such as vias, air bridges and bond wires are analyzed efficiently using the presented technique. The method has been recently extended to analyze open MMIC, so EMC/EMI effects such as radiation from interconnect structures and packaged systems can also be analyzed efficiently. The presented approach includes package resonances and radiation losses. Scattering parameters for MMIC and interconnects in both open and packaged environment are shown.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133983243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effects of discontinuities (vias) on high speed interconnects","authors":"S. Venkataraman, J. Prince, A. Cangellaris","doi":"10.1109/EPEP.1994.594087","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594087","url":null,"abstract":"Vias and bends are commonly encountered as nonuniformities along traces of interconnect on high performance multichip modules. The extent of degradation of signal propagation characteristics due to the presence of discontinuities has been investigated by developing and using a simulator based on the transmission (ABCD) matrix parameters, which facilitates concatenation of many transmission line systems. The approach models the reactive energy stored in a discontinuity as a lumped tee-network using three dimensional parameter extractors. A case study on the thick film geometry of the IBM ES9000 module investigates the effects of vias on propagation delay time, signal distortion, characteristic impedance and additional noise generated due to reflections at the termination and at the source for different input rise times.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124376809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lossy interconnect modeling from TDR/T measurements","authors":"J. Jong, V. K. Tripathi, L. A. Hayden, B. Janko","doi":"10.1109/EPEP.1994.594112","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594112","url":null,"abstract":"An experimental technique for the equivalent circuit modeling of lossy interconnects is presented. The technique is based on the extended peeling algorithm and is used to extract the circuit model from the TDR/T measured data. The accuracy of the circuit model is affirmed by comparing the measured results with the simulated results for a thin film microstrip line.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114609780","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Circuit modelling of two-port interconnection structures based on causality","authors":"S. Sercu, L. Martens","doi":"10.1109/EPEP.1994.594142","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594142","url":null,"abstract":"In this paper a new mixed time-frequency domain procedure is described for the construction of circuit models of interconnection structures. This method extracts hybrid circuit models from reflection and transmission measurements and is based on the principle of causality. The measurements can be performed in the time or the frequency domain. To validate the accuracy of the circuit models, SPICE simulated results for the derived circuit models are compared with the measured data.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123993745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A low cost, multilayer, thick film based, T/R module package for phased array applications","authors":"S. Miller, A. Miller, R. Clark","doi":"10.1109/EPEP.1994.594128","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594128","url":null,"abstract":"Low cost T/R module packaging is a cornerstone of economical active phased array technology. This paper describes an MMIC-based T/R module which includes composite metal matrix baseplate, multi-layer thick film substrate, soldered metal seal wall, and unique RF transitions, which provided a low cost solution for a C-band active array application. Emphasis is placed on the RF feed-through design and the packaging material choices.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128671891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A model to hardware comparison of simultaneous switching noise on a CMOS chip","authors":"B. McCredie, S. Kuppinger, G. Katopis, W. Becker","doi":"10.1109/EPEP.1994.594066","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594066","url":null,"abstract":"The simultaneous switching noise simulation and the comparison of those simulations to laboratory measurements of noise on a specially designed CMOS test chip on a multilayer ceramic SCM are presented.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132946005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Packaging for wireless communications","authors":"W. E. Pence","doi":"10.1109/EPEP.1994.594124","DOIUrl":"https://doi.org/10.1109/EPEP.1994.594124","url":null,"abstract":"The key packaging problems which remain to be addressed for wireless communication adapters are: 1) packaging technologies supporting very low-profile card design, such as direct chip attach for 5-mm thick PCMCIA applications; 2) packaging for filter and discrete passive components; 3) integration of antennas into the enclosure, using printed planar antenna approaches; 4) low-cost RF packaging technology reducing the parasitic effects of single-chip packaging; and 5) techniques providing shielding between subsystems and between the sensitive transceiver and the computer system emissions. Good EMI suppression is also essential since FCC qualification has been a problem for a number of wireless PCMCIA products. In the future wireless communication adapters for the mobile PC market will use standard packaging technology for low-cost. PC board materials will be selected for low dielectric losses, but wherever possible, standard single-chip packaging will be preferred over hybrids or MCMs. There are unique aspects to wireless transceiver design, however, which require new design tools for layout, field calculations, and noise coupling analysis. Discrete components and filters are used extensively in RF designs, and they will remain the most challenging problem from a packaging perspective, with considerable opportunity for cost and size reduction.","PeriodicalId":198939,"journal":{"name":"Proceedings of 1994 IEEE Electrical Performance of Electronic Packaging","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125421946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}