Springer Handbook of Microscopy最新文献

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Aberration Correctors, Monochromators, Spectrometers 像差校正器,单色器,光谱仪
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1_13
P. Hawkes, O. Krivanek
{"title":"Aberration Correctors, Monochromators, Spectrometers","authors":"P. Hawkes, O. Krivanek","doi":"10.1007/978-3-030-00069-1_13","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1_13","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124651409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Scanning Transmission Electron Microscopy 扫描透射电子显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-0-387-49762-4_2
P. Nellist
{"title":"Scanning Transmission Electron Microscopy","authors":"P. Nellist","doi":"10.1007/978-0-387-49762-4_2","DOIUrl":"https://doi.org/10.1007/978-0-387-49762-4_2","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126512619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 74
Fluorescence Microscopy with Nanometer Resolution 纳米分辨率荧光显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1_22
S. Sahl, A. Schönle, S. Hell
{"title":"Fluorescence Microscopy with Nanometer Resolution","authors":"S. Sahl, A. Schönle, S. Hell","doi":"10.1007/978-3-030-00069-1_22","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1_22","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127075465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Atomic Force Microscopy in the Life Sciences 生命科学中的原子力显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1_31
M. Amrein, D. Stamov
{"title":"Atomic Force Microscopy in the Life Sciences","authors":"M. Amrein, D. Stamov","doi":"10.1007/978-3-030-00069-1_31","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1_31","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116338373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Zone-Plate X-Ray Microscopy 区板x射线显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1_23
C. Jacobsen, M. Howells, T. Warwick
{"title":"Zone-Plate X-Ray Microscopy","authors":"C. Jacobsen, M. Howells, T. Warwick","doi":"10.1007/978-3-030-00069-1_23","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1_23","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129275850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Atomic Resolution Transmission Electron Microscopy 原子分辨率透射电子显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-0-387-49762-4_1
A. Kirkland, S. Chang, J. Hutchison
{"title":"Atomic Resolution Transmission Electron Microscopy","authors":"A. Kirkland, S. Chang, J. Hutchison","doi":"10.1007/978-0-387-49762-4_1","DOIUrl":"https://doi.org/10.1007/978-0-387-49762-4_1","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121275000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Springer Handbook of Microscopy 施普林格显微镜手册
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1
P. Hawkes, J. Spence
{"title":"Springer Handbook of Microscopy","authors":"P. Hawkes, J. Spence","doi":"10.1007/978-3-030-00069-1","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126952272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 59
Spectroscopy with the Low Energy Electron Microscope 低能电子显微镜光谱学
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-00069-1_11
R. Tromp
{"title":"Spectroscopy with the Low Energy Electron Microscope","authors":"R. Tromp","doi":"10.1007/978-3-030-00069-1_11","DOIUrl":"https://doi.org/10.1007/978-3-030-00069-1_11","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125501690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Scanning Electron Microscopy 扫描电子显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-0-387-49762-4_3
R. Reichelt
{"title":"Scanning Electron Microscopy","authors":"R. Reichelt","doi":"10.1007/978-0-387-49762-4_3","DOIUrl":"https://doi.org/10.1007/978-0-387-49762-4_3","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117182663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Scanning Tunneling Microscopy in Surface Science 表面科学中的扫描隧道显微镜
Springer Handbook of Microscopy Pub Date : 1900-01-01 DOI: 10.1007/978-0-387-49762-4_15
P. Sutter
{"title":"Scanning Tunneling Microscopy in Surface Science","authors":"P. Sutter","doi":"10.1007/978-0-387-49762-4_15","DOIUrl":"https://doi.org/10.1007/978-0-387-49762-4_15","url":null,"abstract":"","PeriodicalId":196588,"journal":{"name":"Springer Handbook of Microscopy","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123032595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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