Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023最新文献

筛选
英文 中文
Ultrathin Metal Coatings as a Solution for Successful SEM Imaging of Nano-electrospinning Fibers. 超薄金属涂层作为纳米静电纺丝纤维成功扫描电镜成像的解决方案。
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.155
A. Walkiewicz
{"title":"Ultrathin Metal Coatings as a Solution for Successful SEM Imaging of Nano-electrospinning Fibers.","authors":"A. Walkiewicz","doi":"10.22443/rms.mmc2023.155","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.155","url":null,"abstract":"The raising amount of nanofibers applications, especially those produced in electrospinning process, creates a need of imaging them to the extent that allows to examine not only their alignment and diameter but also their discrete morphology. Electrospinning fibers are used in many fieldsfrom energy storage (solar cells, fuel cells), environmental engineering (membranes and filters) to healthcare (tissue engineering and drug delivery). Usually they are processed further through chemical modification that equip their surface with active molecules. Yet, before that can happen, it is essential to examine their native surface to govern the post-treatment process in the desired way. The fibers could have variety of diameters from hundreds to a few nanometers, where usually, the smallest diameters are in preference. They can be smooth or exhibit porosity. Close examination of such tiny polymeric structures is usually carried out by use of Scanning Electron Microscopy. Electrospinning fibers are made of polymers, they form stacks, where individual fibers touch each other but they are not connected. In SEM imaging such samples are the most challenging as fibers gather charge and might move when subjected to the electron beam. For successful SEM imaging of electrospinning fibers a layer of conducting coating is a necessity. Such coating has to be made of a metal with excellent SE yield that exhibits very small grain size. Only in such case the coating can be thin enough not to obscure the discrete morphology of a single fiber and allow for crisp and clear imaging. Q150V Plus coater allows to coat electrospinning fibers in such a way that it is possible to image even very small fibers and examine their discrete morphology. Gold coatings were chosen to present the effect of coating parameters as base vacuum and sputtering current on the quality of SEM imaging. Gold, iridium, molybdenum and tungsten coatings produced with use of high base vacuum were used to show the impact of a metal grain size on coating quality in ultrahigh resolution imaging. PVdF poly(vinylidene fluoride) electrospinning fibers were chosen as substrates for all metal coatings and subjected to imaging.","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114987938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microstructural Based Life Assessment of 1CrMoV Turbine Rotors 基于显微组织的1CrMoV涡轮转子寿命评估
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.142
{"title":"Microstructural Based Life Assessment of 1CrMoV Turbine Rotors","authors":"","doi":"10.22443/rms.mmc2023.142","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.142","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"45 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115367526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Chemical mapping of semiconducting nanostructures (sub-10 nm) with large area windowless EDS/EDX detector in SEM 利用大面积无窗EDS/EDX探测器在SEM中进行半导体纳米结构(10 nm以下)的化学作图
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.567
{"title":"Chemical mapping of semiconducting nanostructures (sub-10 nm) with large area windowless EDS/EDX detector in SEM","authors":"","doi":"10.22443/rms.mmc2023.567","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.567","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116649303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
4D-STEM for electric field mapping in semiconductor n-n junctions 半导体n-n结电场映射的4D-STEM
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.207
{"title":"4D-STEM for electric field mapping in semiconductor n-n junctions","authors":"","doi":"10.22443/rms.mmc2023.207","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.207","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116757870","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The technological challenges and strategies using electron microscopy in AMR preclinical research towards precision medicine 面向精准医学的AMR临床前研究中使用电子显微镜的技术挑战和策略
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.435
{"title":"The technological challenges and strategies using electron microscopy in AMR preclinical research towards precision medicine","authors":"","doi":"10.22443/rms.mmc2023.435","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.435","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121264018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Moving to STEM of Soft Matter 接下来是软物质的STEM
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.425
{"title":"Moving to STEM of Soft Matter","authors":"","doi":"10.22443/rms.mmc2023.425","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.425","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121338781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated precession assisted 4D-STEM for semiconductor analysis 自动进动辅助4D-STEM半导体分析
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.415
{"title":"Automated precession assisted 4D-STEM for semiconductor analysis","authors":"","doi":"10.22443/rms.mmc2023.415","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.415","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114251541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Progress update on the development of The User Adjustable Pole-piece 用户可调杆件开发的最新进展
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.170
{"title":"Progress update on the development of The User Adjustable Pole-piece","authors":"","doi":"10.22443/rms.mmc2023.170","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.170","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124743897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Understanding multi-phase nano-scale structural complexity of reacted SiC coating of TRISO particle using STEM and unsupervised clustering 利用STEM和无监督聚类技术研究TRISO颗粒反应SiC涂层的多相纳米级结构复杂性
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.129
{"title":"Understanding multi-phase nano-scale structural complexity of reacted SiC coating of TRISO particle using STEM and unsupervised clustering","authors":"","doi":"10.22443/rms.mmc2023.129","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.129","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129219343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transmission electron microscopy based cathode illuminance of cadmium telluride photovoltaics – a comparison of Xe and Ga ion milled lamella 基于透射电子显微镜的碲化镉光电阴极照度——Xe和Ga离子磨片的比较
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 Pub Date : 2023-07-06 DOI: 10.22443/rms.mmc2023.266
{"title":"Transmission electron microscopy based cathode illuminance of cadmium telluride photovoltaics – a comparison of Xe and Ga ion milled lamella","authors":"","doi":"10.22443/rms.mmc2023.266","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.266","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123987071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信