{"title":"Secure Scan Design with Dynamically Configurable Connection","authors":"Yuta Atobe, Youhua Shi, M. Yanagisawa, N. Togawa","doi":"10.1109/PRDC.2013.47","DOIUrl":"https://doi.org/10.1109/PRDC.2013.47","url":null,"abstract":"Scan test is a powerful test technique which can control and observe the internal states of the circuit under test through scan chains. However, it has been reported that it's possible to retrieve secret keys from cryptographic LSIs through scan chains. Therefore new secure test methods are required to satisfy both testability and security requirements. In this paper, a secure scan design is proposed to achieve adequate security requirement as a countermeasure against scan-based attacks, while still maintain high testability like normal scan testing. In our method, the internal scan chain is divided into several sub chains, and the connection order of sub chains can be dynamically changed. In addition, how to decide the connection order of those sub chains so that it can't be identified by an attacker is also proposed in this paper. The proposed method is implemented on an AES circuit to show its effectiveness, and a security analysis is also given to show how the proposed approach can be used as a countermeasure against those known scan-based attacks.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117188927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xun Jian, Nathan Debardeleben, S. Blanchard, Vilas Sridharan, Rakesh Kumar
{"title":"Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/Correct","authors":"Xun Jian, Nathan Debardeleben, S. Blanchard, Vilas Sridharan, Rakesh Kumar","doi":"10.1109/PRDC.2013.18","DOIUrl":"https://doi.org/10.1109/PRDC.2013.18","url":null,"abstract":"Chip kill correct is an advanced type of error correction used in memory sub-systems. Existing analytical approaches for modeling the reliability of memory sub-systems with chipkill correct are limited to those with chip kill-correct solutions that guarantee correction of errors in a single DRAM device. However, stronger chip kill correct solutions that are capable of guaranteeing the detection and even correction of errors in up to two DRAM devices have become common in existing HPC systems. Analytical reliability models are needed for such memory subsystems. This paper proposes analytical models for the reliability of double-chipkill detect and/or correct. Validation against Monte Carlo simulations shows that the output of our analytical models are within 3.9% of Monte Carlo simulations, on average. We used the analytical models to study various aspects of the reliability of memory sub-systems protected by double-chip kill detect and/or correct. Our studies provide several insights into the dependence of reliability of these systems on scale, device fault rate, memory organization, and memory-scrubbing policy.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130109846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Probabilistic Modeling of Failure Dependencies Using Markov Logic Networks","authors":"Shalini Ghosh, W. Steiner, G. Denker, P. Lincoln","doi":"10.1109/PRDC.2013.35","DOIUrl":"https://doi.org/10.1109/PRDC.2013.35","url":null,"abstract":"We present a methodology for the probabilistic modeling of failure dependencies in large, complex systems using Markov Logic Networks (MLNs), a state-of-the-art probabilistic relational modeling technique in machine learning. We illustrate this modeling methodology on example system architectures, and show how the the Probabilistic Consistency Engine (PCE) tool can create and analyze failure-dependency models. We compare MLN-based analysis with analytical symbolic analysis to validate our approach. The latter method yields bounds on the expected system behaviors for different component-failure probabilities, but it requires closed-form representations and is therefore often an impractical approach for complex system analysis. The MLN-based method facilitates techniques of early design analysis for reliability (e.g., probabilistic sensitivity analysis). We analyze two examples - a portion of the Time-Triggered Ethernet (TTEthernet) communication platform used in space, and an architecture based on Honeywell's Cabin Air Compressor(CAC) - that highlight the value of the MLN-based approach for analyzing failure dependencies in complex cyber-physical systems.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127825705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Carlos Gómez-Calzado, A. Lafuente, M. Larrea, M. Raynal
{"title":"Fault-Tolerant Leader Election in Mobile Dynamic Distributed Systems","authors":"Carlos Gómez-Calzado, A. Lafuente, M. Larrea, M. Raynal","doi":"10.1109/PRDC.2013.17","DOIUrl":"https://doi.org/10.1109/PRDC.2013.17","url":null,"abstract":"This paper addresses the leader election problem in dynamic distributed systems with mobile processes. To do so, it is assumed that the system alternates periods of good and bad behavior, in the line of the timed asynchronous model of Cristian and Fetzer. We extend the eventual leadership properties recently proposed by Larrea et al. for non-mobile dynamic systems, defining two new properties that take into account graph joins/fragmentations due to process mobility. We also propose a new leader election algorithm in a weak mobile dynamic distributed system model. Using a categorization framework, we compare our system model with a number of models proposed in the literature, showing that our leader election algorithm works in a model which is weaker than the rest.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115528809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
U. Habiba, Abdul Ghafoor Abbasi, Rahat Masood, M. A. Shibli
{"title":"Assessment Criteria for Cloud Identity Management Systems","authors":"U. Habiba, Abdul Ghafoor Abbasi, Rahat Masood, M. A. Shibli","doi":"10.1109/PRDC.2013.39","DOIUrl":"https://doi.org/10.1109/PRDC.2013.39","url":null,"abstract":"Cloud computing offers many benefits to the IT industry by making available the services and resources that helps them to proliferate or decrease their organizational resources automatically on demand. On the other hand, organizations are still uncertain about the security and privacy of their sensitive information (for instance the identity credentials) in the multitenant environment of the Cloud. Many security systems have been devised for the protection of resources in Cloud environments. Identity Management Systems, in this regard, play a vital role in ensuring effective user authentication, provisioning, de-provisioning and access control decisions. Many Cloud IDMSs have been proposed until now claiming to offer flexibility, agility and robustness. However, no comparative analysis of such Cloud based IDMSs has been performed so far, as to the best of our knowledge there exists no specific criteria against which one can evaluate an IDMS on Cloud. This paper proposes an assessment criterion for the evaluation of Cloud based IDMSs, comprising of potential security features that are positively imminent for the assessment of Cloud based IDMSs. Furthermore, analysis of Cloud IDMSs is presented based on the proposed assessment criteria. Potential research directions in the area of Cloud identity management and security are also discussed.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129778804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Sharma, Arvind Haran, Zvonimir Rakamaric, G. Gopalakrishnan
{"title":"Towards Formal Approaches to System Resilience","authors":"V. Sharma, Arvind Haran, Zvonimir Rakamaric, G. Gopalakrishnan","doi":"10.1109/PRDC.2013.14","DOIUrl":"https://doi.org/10.1109/PRDC.2013.14","url":null,"abstract":"Technology scaling and techniques such as dynamic voltage/frequency scaling are predicted to increase the number of transient faults in future processors. Error detectors implemented in hardware are often energy inefficient, as they are \"always on.\" While software-level error detection can augment hardware-level detectors, creating detectors in software that are highly effective remains a challenge. In this paper, we first present anew LLVM-level fault injector called KULFI that helps simulate faults occurring within CPU state elements in a versatile manner. Second, using KULFI, we study the behavior of a family of well-known and simple algorithms under error injection. (We choose a family of sorting algorithms for this study.) We then propose a promising way to interpret our empirical results using a formal model that builds on the idea of predicate state transition diagrams. After introducing the basic abstraction underlying our predicate transition diagrams, we draw connections to the level of resilience empirically observed during fault injection studies. Building on the observed connections, we develop a simple, and yet effective, predicate-abstraction-based fault detector. While in its initial stages, ours is believed to be the first study that offers a formal way to interpret and compare fault injection results obtained from algorithms from within one family. Given the absolutely unpredictable nature of what a fault can do to a computation in general, our approach may help designers choose amongst a class of algorithms one that behaves most resilient of all.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"28 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127207942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Survivability Evaluation of Fluid Critical Infrastructures Using Hybrid Petri Nets","authors":"H. Ghasemieh, Anne Remke, B. Haverkort","doi":"10.1109/PRDC.2013.34","DOIUrl":"https://doi.org/10.1109/PRDC.2013.34","url":null,"abstract":"In this paper we propose a formal, model-checking based procedure to evaluate the survivability of fluid critical infrastructures. To do so, we introduce the Stochastic Time Logic (STL), which allows to precisely express intricate state-based and until-based properties for an important class of hybrid Petri nets. We present an efficient model checking procedure which recursively traverses the underlying state-space of the hybrid Petri net model, and identifies those regions (subsets of the discrete-continuous state space) that satisfy STL formulae. A case study studying the survivability of a water refinery and distribution plant shows the feasibility of our approach.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125212159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Acceleration of Random Testing for Software","authors":"Shengfeng Wu, Yue Wu, Shiyi Xu","doi":"10.1109/PRDC.2013.15","DOIUrl":"https://doi.org/10.1109/PRDC.2013.15","url":null,"abstract":"Random testing has been widely used in both software and hardware testing areas for years, which is applied as black box testing in software testing. This paper takes advantage of the common features of hardware and software random testing, applying the new concept of the maximum distance among test patterns called Quasi Perfect Maximum Distance Test Sequence (QPMDTS) into software. It is an effective extension from the hardware point of view to fit software testing by using some suitable transformations and improvements so that the random testing procedure can be greatly accelerated. A number of experiments on 39 mutant versions of benchmark program and empirical experiments on four subject programs from numerical recipes have been completed and the favorable results have shown the real effectiveness of the proposed method compared with other random testing techniques. It concludes that the proposed method of test cases generation for software can not only bring higher fault coverage but also a lower test cost compared with the conventional software random testing.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132987812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power of One Bit: Increasing Error Correction Capability with Data Inversion","authors":"R. Maddah, Sangyeun Cho, R. Melhem","doi":"10.1109/PRDC.2013.42","DOIUrl":"https://doi.org/10.1109/PRDC.2013.42","url":null,"abstract":"Phase-change memory (PCM) has emerged as a candidate that overcomes the physical limitations faced by DRAM and NAND flash memory. While PCM has desirable properties in terms of scalability and energy, it suffers from limited endurance. Repeated writes cause PCM cells to wear out and get permanently stuck at either 0 or 1. Recovering from stuck-at faults through a proactive error correction scheme is essential for the widespread adoption of PCM. In this paper, we propose data inversion as a practical technique to increase the number of faults that an error correction code can cover. Since stuck-at cells can still be read, errors are manifested only when a worn-out cell is programmed with a bit value different than the value it is stuck at. After a write operation fails for a given block of data, data inversion attempts another write operation with all original data bits inverted. Inverting the data is likely to bring the number of errors within the nominal capability of the deployed error correction code. Requiring only one additional auxiliary bit, data inversion can double the capability of an error correction code and extends the lifetime by up to 34.5%.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134551414","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EDFI: A Dependable Fault Injection Tool for Dependability Benchmarking Experiments","authors":"Cristiano Giuffrida, A. Kuijsten, A. Tanenbaum","doi":"10.1109/PRDC.2013.12","DOIUrl":"https://doi.org/10.1109/PRDC.2013.12","url":null,"abstract":"Fault injection is a pivotal technique in dependability benchmarking. Unfortunately, existing general-purpose fault injection tools either inject faults in predetermined memory locations or resort to random injection, approaches that generally result in poor fault coverage and controllability guarantees. This makes it difficult to reproduce or compare experiments across different systems or workloads. This paper presents EDFI, a new tool for dependable general-purpose fault injection experiments. EDFI combines static and dynamic program instrumentation to perform execution-driven fault injection, a technique which allows realistic software faults to be injected in a controlled way as the target system executes. Our instrumentation strategy guarantees a predetermined fault load distribution during the entirety of the experiment, independently of the particular system or workload considered. Our evaluation confirms that EDFI significantly improves the precision and controllability of prior tools, at the cost of only modest memory and performance overhead during fault-free execution.","PeriodicalId":187326,"journal":{"name":"2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133949858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}