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Measurement and Modeling of Silicon Heterestructure Devices最新文献

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Compact Modeling of SiGe HBTs: Mextram SiGe HBTs的紧凑建模:Mextram
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2018-10-03 DOI: 10.1201/9781315218878-7
S. Mijalkovic
{"title":"Compact Modeling of SiGe HBTs: Mextram","authors":"S. Mijalkovic","doi":"10.1201/9781315218878-7","DOIUrl":"https://doi.org/10.1201/9781315218878-7","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125887921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Brief History of the Field 该领域的简史
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2017-12-19 DOI: 10.1201/9781315218861-2
J. Cressler
{"title":"A Brief History of the Field","authors":"J. Cressler","doi":"10.1201/9781315218861-2","DOIUrl":"https://doi.org/10.1201/9781315218861-2","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"161 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121406533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Best-Practice AC Measurement Techniques 最佳实践交流测量技术
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.2
R. Groves
{"title":"Best-Practice AC Measurement Techniques","authors":"R. Groves","doi":"10.1201/9781420026580.CH8.2","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.2","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117058524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transmission Lines on Si Si上的传输线
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.8
Y. Tretiakov
{"title":"Transmission Lines on Si","authors":"Y. Tretiakov","doi":"10.1201/9781420026580.CH8.8","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.8","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121396017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Overview: Measurement and Modeling 概述:测量和建模
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.PT8
J. Cressler
{"title":"Overview: Measurement and Modeling","authors":"J. Cressler","doi":"10.1201/9781420026580.PT8","DOIUrl":"https://doi.org/10.1201/9781420026580.PT8","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131900721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improved De-Embedding Techniques 改进的去嵌入技术
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.9
Qingqing Liang
{"title":"Improved De-Embedding Techniques","authors":"Qingqing Liang","doi":"10.1201/9781420026580.CH8.9","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.9","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131171508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CAD Tools and Design Kits CAD工具和设计套件
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.6
Sue E. Strang
{"title":"CAD Tools and Design Kits","authors":"Sue E. Strang","doi":"10.1201/9781420026580.CH8.6","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.6","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132257665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Compact Modeling of SiGe HBTs: HICUM SiGe HBTs的紧凑建模:HICUM
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.4
M. Schröter
{"title":"Compact Modeling of SiGe HBTs: HICUM","authors":"M. Schröter","doi":"10.1201/9781420026580.CH8.4","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.4","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115974960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Industrial Application of TCAD for SiGe Development TCAD在SiGe开发中的工业应用
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.3
D. Sheridan, Jeffrey B. Johnson, R. Krishnasamy
{"title":"Industrial Application of TCAD for SiGe Development","authors":"D. Sheridan, Jeffrey B. Johnson, R. Krishnasamy","doi":"10.1201/9781420026580.CH8.3","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.3","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129211401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs 硅锗射频设计中的寄生建模和降噪方法
Measurement and Modeling of Silicon Heterestructure Devices Pub Date : 2005-11-01 DOI: 10.1201/9781420026580.CH8.7
Raminderpal Singh
{"title":"Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs","authors":"Raminderpal Singh","doi":"10.1201/9781420026580.CH8.7","DOIUrl":"https://doi.org/10.1201/9781420026580.CH8.7","url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116823909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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