该领域的简史

{"title":"该领域的简史","authors":"J. Cressler","doi":"10.1201/9781315218861-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":183786,"journal":{"name":"Measurement and Modeling of Silicon Heterestructure Devices","volume":"161 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"A Brief History of the Field\",\"authors\":\"J. Cressler\",\"doi\":\"10.1201/9781315218861-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":183786,\"journal\":{\"name\":\"Measurement and Modeling of Silicon Heterestructure Devices\",\"volume\":\"161 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement and Modeling of Silicon Heterestructure Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781315218861-2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement and Modeling of Silicon Heterestructure Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781315218861-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}