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Proceedings of the 46th Annual Design Automation Conference最新文献

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Session details: Hardware authentication, characterization and trusted design 会话细节:硬件身份验证、特性描述和可信设计
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257704
Lin Yuan
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引用次数: 0
Session details: Space and time management in embedded applications 会话细节:嵌入式应用程序中的空间和时间管理
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257696
C. Pinello
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引用次数: 0
Session details: Network-on-chip advances for power, reliability and the memory bottleneck 会议细节:片上网络在电源、可靠性和内存瓶颈方面的进步
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257694
Joerg Henkel
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引用次数: 0
Session details: Timing simulation: optimized embedded software and MPSOCs 时间模拟:优化的嵌入式软件和mpsoc
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257665
L. Lavagno
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引用次数: 0
Session details: Routing: from chip to package 会话细节:路由:从芯片到封装
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257671
T. Gao
{"title":"Session details: Routing: from chip to package","authors":"T. Gao","doi":"10.1145/3257671","DOIUrl":"https://doi.org/10.1145/3257671","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133174298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Advances in core verification techniques 会议细节:核心验证技术的进展
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257685
Gila Kamhi
{"title":"Session details: Advances in core verification techniques","authors":"Gila Kamhi","doi":"10.1145/3257685","DOIUrl":"https://doi.org/10.1145/3257685","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133045546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Novel design and verification methodologies 会议细节:新颖的设计和验证方法
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257655
Yunhui Cao
{"title":"Session details: Novel design and verification methodologies","authors":"Yunhui Cao","doi":"10.1145/3257655","DOIUrl":"https://doi.org/10.1145/3257655","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127487477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Targeted test and diagnosis 会议细节:有针对性的测试和诊断
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257690
S. Mitra
{"title":"Session details: Targeted test and diagnosis","authors":"S. Mitra","doi":"10.1145/3257690","DOIUrl":"https://doi.org/10.1145/3257690","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134084363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Statistical methods in static timing analysis 会话细节:静态计时分析中的统计方法
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257659
Matthew R. Guthaus
{"title":"Session details: Statistical methods in static timing analysis","authors":"Matthew R. Guthaus","doi":"10.1145/3257659","DOIUrl":"https://doi.org/10.1145/3257659","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130013441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Speed path identification and silicon debug 会话细节:速度路径识别和硅调试
Proceedings of the 46th Annual Design Automation Conference Pub Date : 2009-07-26 DOI: 10.1145/3257672
T. Williams
{"title":"Session details: Speed path identification and silicon debug","authors":"T. Williams","doi":"10.1145/3257672","DOIUrl":"https://doi.org/10.1145/3257672","url":null,"abstract":"","PeriodicalId":181949,"journal":{"name":"Proceedings of the 46th Annual Design Automation Conference","volume":"526 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125021944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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