2012 IEEE 23rd International Symposium on Software Reliability Engineering最新文献

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Software Life-Extension: A New Countermeasure to Software Aging 软件寿命延长:应对软件老化的新对策
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.19
F. Machida, Jianwen Xiang, Kumiko Tadano, Y. Maeno
{"title":"Software Life-Extension: A New Countermeasure to Software Aging","authors":"F. Machida, Jianwen Xiang, Kumiko Tadano, Y. Maeno","doi":"10.1109/ISSRE.2012.19","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.19","url":null,"abstract":"This paper presents software life-extension, a new technique for counteracting software aging by preventive operation to extend the lifetime of software execution. Software aging is a phenomenon of progressive degradation of execution environment due to aging-related software faults and it might cause resource depletion resulting in system failures. To extend the lifetime of the software affected by aging, we use a virtual machine to execute the software and allocate additional memory to the virtual machine upon software aging detection. Although software life-extension is a temporal solution as it only postpones the occurrence of a failure, it provides a simple, cost-effective, and non-intrusive countermeasure to software aging. The feasibility and effectiveness of software life-extension are studied by the experiments on memcached, a widely adopted general-purpose in-memory cache server. From the experimental results, we present a Semi-Markov process (SMP) describing the general behavior of software life-extension and analyze the model which gives the prediction of the system availability as well as the user-perceived availability.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"146 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128836815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Shared Execution for Efficiently Testing Product Lines 共享执行,有效地测试产品线
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.23
C. Kim, S. Khurshid, D. Batory
{"title":"Shared Execution for Efficiently Testing Product Lines","authors":"C. Kim, S. Khurshid, D. Batory","doi":"10.1109/ISSRE.2012.23","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.23","url":null,"abstract":"A software product line (SPL) is a family of related programs, each of which is uniquely defined by a combination of features. Testing an SPL requires running each of its programs, which may be computationally expensive as the number of programs in an SPL is potentially exponential in the number of features. It is also wasteful since instructions common to many programs must be repeatedly executed, rather than just once. To reduce this waste, we propose the idea of shared execution, which runs instructions just once for a set of programs until a variable read yields multiple values, causing execution to branch for each value until a common execution point that allows shared execution to resume. Experiments show that shared execution can be faster than conventionally running each program from start to finish, despite its overhead.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130478393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 61
Using Non-redundant Mutation Operators and Test Suite Prioritization to Achieve Efficient and Scalable Mutation Analysis 使用非冗余突变算子和测试套件优先级实现高效和可扩展的突变分析
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.31
René Just, G. M. Kapfhammer, F. Schweiggert
{"title":"Using Non-redundant Mutation Operators and Test Suite Prioritization to Achieve Efficient and Scalable Mutation Analysis","authors":"René Just, G. M. Kapfhammer, F. Schweiggert","doi":"10.1109/ISSRE.2012.31","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.31","url":null,"abstract":"Mutation analysis is a powerful and unbiased technique to assess the quality of input values and test oracles. However, its application domain is still limited due to the fact that it is a time consuming and computationally expensive method, especially when used with large and complex software systems. Addressing these challenges, this paper makes several contributions to significantly improve the efficiency of mutation analysis. First, it investigates the decrease in generated mutants by applying a reduced, yet sufficient, set of mutants for replacing conditional (COR) and relational (ROR) operators. The analysis of ten real-world applications, with 400,000 lines of code and more than 550,000 generated mutants in total, reveals a reduction in the number of mutants created of up to 37% and more than 25% on average. Yet, since the isolated use of non-redundant mutation operators does not ensure that mutation analysis is efficient and scalable, this paper also presents and experimentally evaluates an optimized workflow that exploits the redundancies and runtime differences of test cases to reorder and split the corresponding test suite. Using the same ten open-source applications, an empirical study convincingly demonstrates that the combination of non-redundant operators and prioritization leveraging information about the runtime and mutation coverage of tests reduces the total cost of mutation analysis further by as much as 65%.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130669110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 67
Mutation Testing of Event Processing Queries 事件处理查询的突变测试
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.20
Lorena Gutiérrez-Madroñal, H. Shahriar, Mohammad Zulkernine, J. Domínguez-Jiménez, I. Medina-Bulo
{"title":"Mutation Testing of Event Processing Queries","authors":"Lorena Gutiérrez-Madroñal, H. Shahriar, Mohammad Zulkernine, J. Domínguez-Jiménez, I. Medina-Bulo","doi":"10.1109/ISSRE.2012.20","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.20","url":null,"abstract":"Event processing queries are intended to process continuous event streams. These queries are partially similar to traditional SQL queries, but provide the facilities to express rich features (e.g., pattern expression, sliding window of length and time). An error while implementing a query may result in abnormal program behaviors and lost business opportunities. Moreover, queries can be generated with unsanitized inputs and the structure of intended queries might be altered. Thus, a tester needs to test the behavior of queries in presence of malicious inputs. Mutation testing has been found to be effective to assess test suites quality and generating new test cases. Unfortunately, there is no effort to perform mutation testing of event processing queries. In this work, we propose mutation-based testing of event processing queries. We choose Event Processing Language (EPL) as our case study and develop necessary mutation operators and killing criteria to generate high quality event streams and malicious inputs. Our proposed operators modify different features of EPL queries (pattern expression, windows of length and time, batch processing of events). We develop an architecture to generate mutants for EPL and perform mutation analysis. We evaluate our proposed EPL mutation testing approach with a set of developed benchmark containing diverse types EPL queries. The evaluation results indicate that the proposed operators and mutant killing criteria are effective to generate test cases capable of revealing anomalous program behaviors (e.g., event notification failure, delay of event reporting, unexpected event), and SQL injection attacks. Moreover, the approach incurs less manual effort and can complement other testing approach such as random testing.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128068758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Using Population Characteristics to Build Forecasting Models for Computer Security Incidents 利用群体特征建立计算机安全事件预测模型
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.34
Edward M. Condon, M. Cukier
{"title":"Using Population Characteristics to Build Forecasting Models for Computer Security Incidents","authors":"Edward M. Condon, M. Cukier","doi":"10.1109/ISSRE.2012.34","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.34","url":null,"abstract":"Computer and network security incidents have financial and other consequences to organizations, such as direct business losses from theft of proprietary information or from just reputational damage. There are also costs for restoring operations and protecting against threats. Being able to quantify the impact of different factors within an organization may provide additional context for prevention and remediation efforts. This paper examines a large set of security incident data along with some population characteristic data from an organization's network. We discuss the rationale for examining the different population characteristics and their potential influence on computer security incidents. We then create logistic regression models using the population characteristics to forecast which machines in the population may be involved in a computer security incident. We evaluate the models using the forecasts as a set of unequal probability weights combined with repeated sampling. We also explore different time windows used for the inclusion of data during model creation.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127503334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Lightweight Static Analysis for GUI Testing 用于GUI测试的轻量级静态分析
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.25
Stephan Arlt, A. Podelski, C. Bertolini, Martin Schäf, Ishan Banerjee, A. Memon
{"title":"Lightweight Static Analysis for GUI Testing","authors":"Stephan Arlt, A. Podelski, C. Bertolini, Martin Schäf, Ishan Banerjee, A. Memon","doi":"10.1109/ISSRE.2012.25","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.25","url":null,"abstract":"GUI testing is an active research area. The open challenge is the judicious generation of event sequences (an event sequence encodes a user interaction). A major advance in this direction is the use of a black-box model to systematically generate event sequences that are executable on the GUI. The black-box model can be, e.g., an Event Flow Graph (EFG) or an Event Sequence Graph (ESG). In this paper we propose a new approach to select relevant event sequences among the event sequences generated by a black-box model. We express the relevance of an event sequence by a precisely defined dependency between a fixed number of events in the event sequence. Departing from a pure black-box approach we apply a static analysis to the byte code of the application. This allows us to infer a dependency graph, which we call Event Dependency Graph (EDG). We use the EDG together with a black-box model to construct a set of relevant event sequences among the executable ones. We have implemented our approach in a new tool. We evaluate the approach on four open source GUI applications. With the specific choice of a lightweight static analysis, the approach scales to large applications and, at the same time, leads to an informed selection of event sequences. Using our approach we are able to find previously undetected bugs.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127049738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 63
On the Aging Effects Due to Concurrency Bugs: A Case Study on MySQL 并发错误导致的老化效应:以MySQL为例
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.50
Antonio Bovenzi, Domenico Cotroneo, R. Pietrantuono, S. Russo
{"title":"On the Aging Effects Due to Concurrency Bugs: A Case Study on MySQL","authors":"Antonio Bovenzi, Domenico Cotroneo, R. Pietrantuono, S. Russo","doi":"10.1109/ISSRE.2012.50","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.50","url":null,"abstract":"This study investigates software aging effects caused by the activation of concurrency bugs in a wellknown  database management system (DBMS), namely MySQL. Experiments with different workloads are performed in order to reproduce the most likely conditions for concurrency bugs activation. Besides the typical aging effects observed in many operational systems (i.e., a gradual degradation over time), results highlight that both available resources and DBMS performance (e.g. service rate, service time, and connection latency) can decrease with time in a hard-to-predict way. We observed that, due to the activation of concurrency bug, the DBMS enters a degraded state in which: i) the estimation of Time-To-Failure (TTF) by means of memory depletion trend analysis is highly inaccurate, and ii) the failure rate does not  depend on the instantaneous and/or mean accumulated work.  Results suggest that, in such cases, finer-grained indicators and/or different techniques need to be taken into account for properly preventing failures.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"5 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120808734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
A MARTE Extension for Global Scheduling Analysis of Multiprocessor Systems 多处理机系统全局调度分析的MARTE扩展
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.2
A. Magdich, Y. H. Kacem, A. Mahfoudhi, M. Abid
{"title":"A MARTE Extension for Global Scheduling Analysis of Multiprocessor Systems","authors":"A. Magdich, Y. H. Kacem, A. Mahfoudhi, M. Abid","doi":"10.1109/ISSRE.2012.2","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.2","url":null,"abstract":"Real-Time Systems are subject to Soft/Hard temporal constraints. Besides, a tasks scheduling step is required to meet the maximum of deadlines, for which there are different scheduling algorithms to do. However, nowadays real-time systems represent a serious issue for the worldwide industry due to their growing complexity. Indeed, since they are more susceptible to failures and deficiencies of development, it is crucial to rely on high level development methods. In this context, some researchers have proposed scheduling analysis within the new profile Modeling and Analysis of Real-Time and Embedded systems (MARTE), which supports both monoprocessor and multiprocessor scheduling algorithms. While supported multiprocessor scheduling algorithms are part of the partitioned approach, global approach algorithms have not been backed by MARTE yet. In the present paper, we seek to improve the meta-models of MARTE stereotypes to establish scheduling analysis for the global approach.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117032215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
An Exploratory Study of Higher Order Mutation Testing in Aspect-Oriented Programming 面向方面编程中高阶突变测试的探索性研究
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.6
Elmahdi Omar, Sudipto Ghosh
{"title":"An Exploratory Study of Higher Order Mutation Testing in Aspect-Oriented Programming","authors":"Elmahdi Omar, Sudipto Ghosh","doi":"10.1109/ISSRE.2012.6","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.6","url":null,"abstract":"Higher order mutation testing is a relatively new area of research. Researchers have claimed that higher order mutants have the potential to increase test effectiveness and reduce test effort. However, these claims have not been evaluated in the context of the aspect-oriented programming paradigm, which introduces new and unique concepts and constructs, and consequently new testing challenges. We present an exploratory study of higher order mutation testing in the context of AspectJ, which is the most widely used aspect-oriented programming language. Based on published fault-models, we propose four approaches to constructing higher order mutants in AspectJ programs. We evaluate the approaches in terms of their ability to create higher order mutants that result in higher test effectiveness and lower test effort compared to first order mutants. The approaches (1) insert two faults in a single base class or two faults in a single aspect, (2) insert two faults in two different base classes, (3) insert two faults in two different aspects, and (4)~insert one fault in a base class and one in an aspect. We developed a prototype tool that automates the process of generating, compiling, and executing higher order mutants. The first approach produced a larger percentage of higher order mutants that were harder to kill than the constituent first order mutants as compared to the last three approaches. The first approach lowered the total number of mutants to be compiled and executed to a greater extent than the last three approaches. The last three approaches produced a lower density of equivalent mutants but the absolute number of equivalent mutants is greater for higher order mutants than for first order mutants.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124191949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Hybrid Statistical Model Checking Technique for Reliable Safety Critical Systems 可靠安全关键系统的混合统计模型检验技术
2012 IEEE 23rd International Symposium on Software Reliability Engineering Pub Date : 2012-11-27 DOI: 10.1109/ISSRE.2012.35
Young Joo Kim, Moonzoo Kim
{"title":"Hybrid Statistical Model Checking Technique for Reliable Safety Critical Systems","authors":"Young Joo Kim, Moonzoo Kim","doi":"10.1109/ISSRE.2012.35","DOIUrl":"https://doi.org/10.1109/ISSRE.2012.35","url":null,"abstract":"Reliability of safety critical systems such as nuclear power plants and automobiles has become a significant issue to our society. As more computing systems are utilized in these safety critical systems, there are high demands for verification and validation (V&V) techniques to assure the reliability of such complex computing systems. However, as the complexity of computing systems increases, conventional V&V techniques such as testing and model checking have limitations, since such systems often control highly complex continuous dynamics. To improve the reliability of such systems, statistical model checking (SMC) techniques have been proposed. SMC techniques can check if a target system satisfies given requirements through statistical methods. In this paper, we propose a new hybrid SMC technique that integrates sequential probability ratio test (SPRT) technique and Bayesian interval estimation testing (BIET) technique to achieve precise verification results quickly. In our experiment, the new hybrid SMC was up to 20% faster than BIET. In addition, we demonstrate the effectiveness and efficiency of this hybrid SMC technique by applying the hybrid SMC technique to three safety critical systems in the automobile domain.","PeriodicalId":172003,"journal":{"name":"2012 IEEE 23rd International Symposium on Software Reliability Engineering","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132572807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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