{"title":"Spintronic-Based Memory and Logic Devices","authors":"J. Chatterjee, P. Sethi, C. Murapaka","doi":"10.1201/9781315163116-14","DOIUrl":"https://doi.org/10.1201/9781315163116-14","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121722282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of CNTFET for SRAM Cell Design","authors":"S. Bala, M. Khosla","doi":"10.1201/9781315163116-10","DOIUrl":"https://doi.org/10.1201/9781315163116-10","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132964610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Fundamental Overview of High Electron Mobility Transistor and Its Applications","authors":"D. Nirmal, J. Ajayan","doi":"10.1201/9781315163116-13","DOIUrl":"https://doi.org/10.1201/9781315163116-13","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115720993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Variability in Nanoscale Technology and EδDC MOS Transistor","authors":"S. Sengupta, Soumya Pandit","doi":"10.1201/9781315163116-2","DOIUrl":"https://doi.org/10.1201/9781315163116-2","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132337062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling of Double-Gate MOSFETs","authors":"D. Nirmal, J. Ajayan","doi":"10.1201/9781315163116-6","DOIUrl":"https://doi.org/10.1201/9781315163116-6","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"388 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125844103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of Ground Plane and Strained Silicon on Nanoscale FET Devices","authors":"S. Chaudhury, Avtar Singh","doi":"10.1201/9781315163116-3","DOIUrl":"https://doi.org/10.1201/9781315163116-3","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"160 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126931992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Operational Characteristics of Vertically Diffused Metal Oxide Semiconductor Field Effect Transistor","authors":"D. Bharti, A. Islam","doi":"10.1201/9781315163116-5","DOIUrl":"https://doi.org/10.1201/9781315163116-5","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133909113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"RRAM Devices: Underlying Physics, SPICE Modeling, and Circuit Applications *","authors":"F. Hatem, T. N. Kumar, H. Almurib","doi":"10.1201/9781315163116-16","DOIUrl":"https://doi.org/10.1201/9781315163116-16","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125942813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Simulation of Nanoscale Transistors from Quantum and Multiphysics Perspective","authors":"Zhipeng Dong, Wenchao Chen, W. Yin, Jing Guo","doi":"10.1201/9781315163116-1","DOIUrl":"https://doi.org/10.1201/9781315163116-1","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127937929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design of Ternary Logic Circuits Using CNFETs","authors":"C. Vudadha, M. Srinivas","doi":"10.1201/9781315163116-11","DOIUrl":"https://doi.org/10.1201/9781315163116-11","url":null,"abstract":"","PeriodicalId":160831,"journal":{"name":"Nanoscale Devices","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122717284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}