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IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)最新文献

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Image registration using elastic contours and internal landmarks 图像配准使用弹性轮廓和内部地标
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.679827
T. Mitsa, J. Qian
{"title":"Image registration using elastic contours and internal landmarks","authors":"T. Mitsa, J. Qian","doi":"10.1109/IMTC.1998.679827","DOIUrl":"https://doi.org/10.1109/IMTC.1998.679827","url":null,"abstract":"In this paper, we present a regional image registration method. The basic idea is to use the contours of the regions and internal anatomical landmarks to assist the registration. Our method registers images by warping one image into the other. The warping transforms are derived from point based interpolation that passes through the contour and anatomical landmarks. The registration performance depends on the interpolation method used for warping. Two interpolation methods are investigated in the paper: the inverse distance weighted approach and the radial basis function approach. We also studied the effect of different combinations of internal and external points used for registration. CT images and mesh images are presented to illustrate the choice of interpolation methods and landmarks on the results of the image registration.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132974747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Cephalometric image measurement and prediction system 头颅图像测量与预测系统
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.679639
Changsheng Xu, Yan Xu, Songde Ma
{"title":"Cephalometric image measurement and prediction system","authors":"Changsheng Xu, Yan Xu, Songde Ma","doi":"10.1109/IMTC.1998.679639","DOIUrl":"https://doi.org/10.1109/IMTC.1998.679639","url":null,"abstract":"A practical automatic cephalometric measurement and facial prediction system is built by using adaptive filtering and edge detecting techniques and some artificial intelligent approaches. The system not only realizes the automation from landmark location to parameter measurement on the cephalogram, but also makes the preoperative diagnostic design of orthognathic surgery quantitive. Compared with manual prediction, it provides a new method to enable the diagnosis and treatment of dento-maxillofacial deformities more accurately. It is significant for clinical application and scientific research.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133039180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
New design criterion for improving the performance of SAW bandpass digital signal processing in communication systems 提高通信系统声波带通数字信号处理性能的新设计准则
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.676854
K. El-Shennawy
{"title":"New design criterion for improving the performance of SAW bandpass digital signal processing in communication systems","authors":"K. El-Shennawy","doi":"10.1109/IMTC.1998.676854","DOIUrl":"https://doi.org/10.1109/IMTC.1998.676854","url":null,"abstract":"This paper presents a new design criterion for improving the performance of bandpass signal processing in communication systems. The current research is a simulation and modeling of the theoretical distortionless SAW filters. The finite impulse response and the transfer function are analysed. Two methods of solutions are introduced. In the first method, the Fourier transformation based on the convolution theorem principle of the required transfer function and the convolving weighted sinc function of the window function, is explained. The second method uses the pre-envelope, complex envelope, and the conjugate theorem principle of the Fourier transformation. The transfer function is plotted for typical SAW filters with different carrier frequencies, bandwidths, and transducer lengths. The results show two conditions of the theoretical distortionless SAW devices. The first is the minimum occurring of the nonflat response in the passband (Fresnel ripples), sidelobe rejection in the stopband (Gibbs ripples) and the transition bandwidth. The second is a new criterion relating the carrier frequency and the transmission time delay of the bandpass system. This criterion is very important and should be taken into consideration during design techniques. Moreover, the transfer functions of these theoretical distortionless SAW filters are compared with that obtained by the laboratories.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131460817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The study of pressure distribution in sitting position on cushions for patient with SCI 脊髓损伤患者坐垫坐位压力分布的研究
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.679761
Y. Tanimoto, H. Takechi, H. Nagahata, H. Yamamoto
{"title":"The study of pressure distribution in sitting position on cushions for patient with SCI","authors":"Y. Tanimoto, H. Takechi, H. Nagahata, H. Yamamoto","doi":"10.1109/IMTC.1998.679761","DOIUrl":"https://doi.org/10.1109/IMTC.1998.679761","url":null,"abstract":"Pressure sores on the patient's sitting surface are a major problem for patients with spinal cord injuries (SCI). We measured the buttock pressure distribution on five kinds of wheelchair cushions using the Tekscan pressure measurement system. We calculated total weight, high pressure area, maximum and average pressure to evaluate the function of the cushions. As for pressure distribution, the air cushion is the best of the cushions. In the air cushion, the maximum pressure is influenced by the total weight, contact area and the quantity of air in the cushion.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127635863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Space compaction under generalized mergeability 广义归并下的空间压缩
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.679842
Sunil R. Das, E. Petriu, Tony F. Barakat, M. Assaf, A. Nayak
{"title":"Space compaction under generalized mergeability","authors":"Sunil R. Das, E. Petriu, Tony F. Barakat, M. Assaf, A. Nayak","doi":"10.1109/IMTC.1998.679842","DOIUrl":"https://doi.org/10.1109/IMTC.1998.679842","url":null,"abstract":"Generalized mergeability criteria for merging an arbitrary number of output sequences have been established under conditions of stochastic dependence and independence of line errors. In this paper, we report experimental results on ISCAS 85 benchmark circuits which were targeted for space compaction using these generalized mergeability criteria.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124391168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines 三坐标测量机上触控触发探头的动态误差特性
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.676895
Roland P. Johnson, Qingping Yang, C. Butler
{"title":"Dynamic error characteristics of touch trigger probes fitted to coordinate measuring machines","authors":"Roland P. Johnson, Qingping Yang, C. Butler","doi":"10.1109/IMTC.1998.676895","DOIUrl":"https://doi.org/10.1109/IMTC.1998.676895","url":null,"abstract":"This paper discusses the dynamic error characteristics of touch trigger probes used with coordinate measuring machines. During the investigation, a number of important parameters have been identified, including measurement speed, probe longitude, approach distance, probe latitude, stylus length/stylus tip diameter, probe orientation, operating mode (scanning and non-scanning), scan pitch, pre-load spring force (gauging force), probe type and the surface approach angle. This paper presents the detailed experimental design and the results obtained from the systematic experiments. These results have led to some useful recommendations for the reduction of the probe dynamic errors. Some of these recommendations included the selection of the optimum measurement speed, the setting of the pre-load spring force and the choice of the probe type.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"218 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114744247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
On the quality of a measurement process: a statistical approach for the variability evaluation 关于测量过程的质量:可变性评价的统计方法
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.679654
M. Catelani, G. Iuculano
{"title":"On the quality of a measurement process: a statistical approach for the variability evaluation","authors":"M. Catelani, G. Iuculano","doi":"10.1109/IMTC.1998.679654","DOIUrl":"https://doi.org/10.1109/IMTC.1998.679654","url":null,"abstract":"In the quality context for a measurement process it is necessary to monitor in real time the process, both globally and in its individual entities. The aim is to detect sudden or gradual deteriorations in order to assure that the probability of generating measurement results with maximum deviations not allowed with respect to the reference values remains within acceptable limits. The paper is focused on the evaluation of the overall variability of the measurement process by collecting several sets of repeated measurements. We propose a statistical approach that is based on the use of the control charts where the within-sample and the between-sample variability can be monitored and analysed.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116908072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Digital measuring techniques for high accuracy ultrasonic sensor application 数字测量技术在高精度超声波传感器中的应用
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.676885
G. Andria, F. Attivissimo, A. Lanzolla
{"title":"Digital measuring techniques for high accuracy ultrasonic sensor application","authors":"G. Andria, F. Attivissimo, A. Lanzolla","doi":"10.1109/IMTC.1998.676885","DOIUrl":"https://doi.org/10.1109/IMTC.1998.676885","url":null,"abstract":"Ultrasonic sensor level measurements are based on the determination of the time-of-flight (ToF). Owing to both the rise time and the time resolution, traditional techniques produce poor estimations of the ToF. Furthermore, the presence of noise is a cause of further inaccuracy. The main aim of the paper is to show how the accuracy of the ToF can be improved by adopting simple interpolation algorithms in conjunction with the wavelet transform (WT) technique. After examining and characterizing the different error components, brief theoretical considerations on the WT are reported and the effects of this choice on the accuracy are examined. It is proved that in this case the accuracy of the level measurements is very high. Finally, the performance of the proposed algorithms has been verified by means of computer simulations and experiments.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123531084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Thermal performance of plastic-encapsulated and hermetically sealed components for automotive applications 汽车用塑料封装和密封部件的热性能
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.676911
L. Musiejovsky, J. Nicolics, H. Hauser, G. Brasseur
{"title":"Thermal performance of plastic-encapsulated and hermetically sealed components for automotive applications","authors":"L. Musiejovsky, J. Nicolics, H. Hauser, G. Brasseur","doi":"10.1109/IMTC.1998.676911","DOIUrl":"https://doi.org/10.1109/IMTC.1998.676911","url":null,"abstract":"In automotive applications reliability and lifetime of electronic components are mainly influenced by aging processes related to superposing effects of mechanical vibrations, thermomechanically induced stress and thermal load. Two of these factors can be minimized by optimizing the component's thermal design. In this work measured and simulated thermal qualities of plastic-encapsulated and ceramic packages are compared. The experimental test procedure and main features of a new thermal simulation tool especially designed for the prediction of thermal characteristics of mono-chip and multi-chip components are discussed. Although, the thermal conductivity of ceramic is high compared to plastic moldings our results clearly show that plastic packages can compete with their ceramic counterparts.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124035589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
System identification for data acquisition characterization 数据采集特性的系统识别
IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) Pub Date : 1998-05-18 DOI: 10.1109/IMTC.1998.676917
G. Vandersteen, Y. Rolain, J. Schoukens
{"title":"System identification for data acquisition characterization","authors":"G. Vandersteen, Y. Rolain, J. Schoukens","doi":"10.1109/IMTC.1998.676917","DOIUrl":"https://doi.org/10.1109/IMTC.1998.676917","url":null,"abstract":"This paper describes a robust and efficient identification algorithm to identify the nonlinear distortion and the time base distortion of a data acquisition channel using sine wave measurements. The proposed method is compared with existing methods using simulations. Its applicability is demonstrated on measurements of high frequency sampling scopes.","PeriodicalId":160058,"journal":{"name":"IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124772342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
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