2015 International Conference on Industrial Instrumentation and Control (ICIC)最新文献_第10页

Determination of glucose concentration from near infrared spectra using least square support vector machine 用最小二乘支持向量机测定近红外光谱中的葡萄糖浓度

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150789

B. A. Malik

引用次数: 6

Measurement of a post-amplified CWDM system performance with EDFA-SOA amplifiers 用EDFA-SOA放大器测量后放大CWDM系统性能

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150904

Khadijah Ismail, P. Menon, S. Shaari, A. Ehsan, N. Arsad, A. Bakar

引用次数: 1

Design of Baugh Wooley and Wallace tree multiplier using two phase clocked adibatic static CMOS logic 采用两相时钟绝热静态CMOS逻辑设计Baugh Wooley和Wallace树乘法器

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150926

V. Muley, Anchu Tom, T. Vigneswaran

引用次数: 5

Performance analysis of cascaded H-bridge 13 level STATCOM during switch fault 开关故障时级联h桥13级STATCOM的性能分析

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150800

K. Varalakshmi, R. L. Narsimham, G. Tulasiramdas

引用次数: 2

Feature based dense disparity estimation 基于特征的密集视差估计

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150881

Shashi Poddar, Hemraj Sahu, Mohit R. Bangale, Vipan Kumar, Amod Kumar

{"title":"Feature based dense disparity estimation","authors":"Shashi Poddar, Hemraj Sahu, Mohit R. Bangale, Vipan Kumar, Amod Kumar","doi":"10.1109/IIC.2015.7150881","DOIUrl":"https://doi.org/10.1109/IIC.2015.7150881","url":null,"abstract":"Dense disparity estimation for stereo imaging is an important building block for several computer vision applications. Feature based disparity estimation technique provides disparity at only few of the known feature points and thus does not give a good estimate of the complete region. In this paper, a novel framework of dense disparity estimation using feature correspondences are proposed, which employs image segmentation and feature based segment matching technique as the core methodology. It avoids any optimization technique and is thus not an NP-hard problem. The initial features obtained using SURF detector is used for matching segments indirectly. Segments which do not contain any feature point are matched via epipolar constraint by randomly selecting keypoints in the reference image. The proposed technique has been compared with local window based matching technique and found to provide better texture conservation in the resultant dense image. The proposed algorithm sets a new mechanism for computing dense depth from sparse disparity points which though requires further improvement in terms of accuracy.","PeriodicalId":155838,"journal":{"name":"2015 International Conference on Industrial Instrumentation and Control (ICIC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125912467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Evanescent absorption based refractive index measurement at 1.3 µm 1.3µm处基于倏逝吸收的折射率测量

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150856

S. Chakraborty, K. Sinha, Prashanth Kumar

引用次数: 0

Sensitivity analysis of safety system architectures 安全系统架构敏感性分析

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150860

Ashutosh Kabra, G. Karmakar, M. Kumar, P. P. Marathe

引用次数: 2

Retinal blood vessel segmentation using graph cut analysis 利用图割分析进行视网膜血管分割

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150973

P. Wankhede, K. Khanchandani

引用次数: 18

A survey on offline signature recognition and verification schemes 离线签名识别与验证方案综述

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7150731

M. R. Deore, S. M. Handore

引用次数: 8

Beyond test pattern generation: Coverage analysis 测试模式生成之外:覆盖率分析

2015 International Conference on Industrial Instrumentation and Control (ICIC) Pub Date : 2015-05-28 DOI: 10.1109/IIC.2015.7151009

B. Bhowmik, J. Deka, S. Biswas

{"title":"Beyond test pattern generation: Coverage analysis","authors":"B. Bhowmik, J. Deka, S. Biswas","doi":"10.1109/IIC.2015.7151009","DOIUrl":"https://doi.org/10.1109/IIC.2015.7151009","url":null,"abstract":"The size and complexity of the very large scale integrated circuits are ever increasing because of rapid advancements of deep-submicron and nanometer technologies. It has become imperative to address and attack the problems associated with verification at earlier design stages. The paper proposes a high level design verification scheme for the circuits designed at the behavioral level. The scheme is based on selection of a goal node in a control flow graph representation of a design under test. The scheme focuses on generation of suitable test patterns that adds gaining confidence in correctness of the design via code coverage metrics. The scheme does complete verification for a design in two attempts. First time verification attempts testing that exercises a set of test patterns to ensure the correctness. Second time verification involves code coverage analysis with the generated test patterns that accounts amount of correctness of the design. Experiments have been accomplished on a number of custom-built as well as ITC'99 benchmark circuits and establish the scalability of the proposed scheme. Experimental results establish the fact that high code coverage guarantees quality circuit design.","PeriodicalId":155838,"journal":{"name":"2015 International Conference on Industrial Instrumentation and Control (ICIC)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130401997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3