2008 Annual Reliability and Maintainability Symposium最新文献_第5页

Electronics in harsh environments - product verification and validation 恶劣环境中的电子产品。产品验证和确认

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925839

K. Stentoft, M. L. Petersen

{"title":"Electronics in harsh environments - product verification and validation","authors":"K. Stentoft, M. L. Petersen","doi":"10.1109/RAMS.2008.4925839","DOIUrl":"https://doi.org/10.1109/RAMS.2008.4925839","url":null,"abstract":"The demand for robust electronics is continuously increasing, as electronics is used in almost any products and placed everywhere. The customer expects industrial products to operate at least 5 years without failures, no matter the location. In order to be able to design products which are robust against harsh environments, the specific conditions at the customers must be known and understood. Following, the requirements for the entire product and the single parts must be specified properly. The final product shall be able to pass robustness tests, such as aggressive gases, humidity and contamination. Requirements to the suppliers of single parts and components shall include cleanliness and lifetime data in harsh environments. Danfoss has developed a simple three step 'aggressive sub 3' test procedure for new products, which involves exposure in salt mist, aggressive gasses and cyclic humidity. These tests show good conformity with real life scenarios, but exact acceleration factors relative to the customer environment can not be established, since too many factors are unknown. However it is possible to make life tests with various stress levels and thereby determine acceleration factors for single or few stressors. Other 'must' tests are dust tests, condensing humidity tests and temperature cycling. It is also very important to analyze market feed-backs and thereby get more knowledge about the customers and the products, to be able to make ongoing improvements.","PeriodicalId":143940,"journal":{"name":"2008 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121644041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Risk analysis of phased-mission systems with multiple failure modes 多失效模式的分阶段任务系统风险分析

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925762

T. Kohda, S. Matsumoto, M. Nakagawa

引用次数: 3

Advanced human factors Process Failure Modes and Effects analysis 先进的人为因素，过程失效模式和影响分析

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925823

Mei Rong, Ting Zhao, Yang Yu

{"title":"Advanced human factors Process Failure Modes and Effects analysis","authors":"Mei Rong, Ting Zhao, Yang Yu","doi":"10.1109/RAMS.2008.4925823","DOIUrl":"https://doi.org/10.1109/RAMS.2008.4925823","url":null,"abstract":"Process Failure Mode and Effects analysis (PFMEA) is a technique to identify, analyze and evaluate the potential failure modes of a production process. The purpose is to suggest control measures to reduce the risk of the production process effectively. NASA has used the PFMEA technique to analyze human processes or tasks. This type of analysis can be referred to as a \"human factors process FMEA, HF-FMEA\". HF-FMEA breaks down a task process into discrete steps so the actions associated with a process step can be specifically analyzed for potential failure. For each action performed, all potential human errors are identified. Each error is then evaluated to identify positive and negative contributing factors, barriers, and controls. The aim of these works is to give risk reduction measures to minimize the risk of human process. Although HF-PFMEA has achieved significant achievements in the analysis of human factors, the technique itself is still to be improved. For example, the technique has no generic method to decompose the task, and it is difficult to identify human operational errors comprehensively. This paper proposes some solutions to the shortcomings of the conventional approach. Advanced HF-PFMEA integrates several important concepts that distinguish it from conventional HF-FMEA, including: (1) suggest a method to break down task process according to the sequence and logicality of task process, (2) use hazard and operability study (HAZOP) to analyze human operational errors. The operational errors can be identified by determining guidewords and process parameters.","PeriodicalId":143940,"journal":{"name":"2008 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132414073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Spare parts management considering new sales 备件管理，考虑新销售

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925847

H. Liao, Peng Wang, T. Jin, S. Repaka

引用次数: 8

Hybrid methodology and software platform for probabilistic risk assessment 概率风险评估的混合方法与软件平台

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925831

K. Groth, Dongfeng Zhu, A. Mosleh

引用次数: 5

Threat effects analysis: Applying FMEA to model computer system threats 威胁效应分析:应用FMEA对计算机系统威胁进行建模

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925840

J. Bowles, W. Hanczaryk

引用次数: 5

A methodology for quantitative evaluation of software reliability using static analysis 一种基于静态分析的软件可靠性定量评估方法

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925829

W. Schilling, M. Alam

{"title":"A methodology for quantitative evaluation of software reliability using static analysis","authors":"W. Schilling, M. Alam","doi":"10.1109/RAMS.2008.4925829","DOIUrl":"https://doi.org/10.1109/RAMS.2008.4925829","url":null,"abstract":"This paper proposes a methodology for quantitative evaluation of software reliability in updated COTS or Open Source components. The model combines static analysis of existing source code modules, limited testing with execution path capture, and a series of Bayesian Belief Networks. Static analysis is used to detect faults within the source code which may lead to failure. Code coverage is used to determine which paths within the source code are executed as well as their execution rate. A series of Bayesian Belief Networks is then used to combine these parameters and estimate the reliability for each method. A second series of Bayesian Belief Networks then combines the module reliabilities to estimate the net software reliability. A proof of concept for the model is provided, as the model is applied to five different open-source applications and the results are compared with reliability estimates using the STREW (Software Testing and Early Warning) metrics. The model is shown to be highly effective and the results are within the confidence interval for the STREW reliability calculations, and typically the results differed by less than 2%. This model offers many benefits to practicing software engineers. Through the usage of this model, it is possible to quickly assess the reliability of a given release of a software module supplied by an external vendor to determine whether it is more or less reliable than a previous release. The determination can be made independent of any knowledge of the developer's software development process and without any development metrics.","PeriodicalId":143940,"journal":{"name":"2008 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131346288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Changes in items' failure pattern during maintenance: An investigation of the perfect repair assumption 维修过程中物品失效模式的变化:对完美维修假设的调查

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925832

J. M. Block, Peter Söderholm, T. Tyrberg

{"title":"Changes in items' failure pattern during maintenance: An investigation of the perfect repair assumption","authors":"J. M. Block, Peter Söderholm, T. Tyrberg","doi":"10.1109/RAMS.2008.4925832","DOIUrl":"https://doi.org/10.1109/RAMS.2008.4925832","url":null,"abstract":"It is clear that the simple dasiaperfect repairpsila assumption is not immediately applicable to any of the studied types of hardware, i.e. cooling turbine., high-voltage generator, hydraulic accumulator, and radar transmitter. Hence, the assumption of 'perfect repair' needs to be validated for each specific type of item. Assumptions based on the type of physical hardware (e.g. mechanical item or avionics item) are not always trustworthy. Strangely enough the 'perfect repair' assumption fits best for the cooling turbine, which is a highly stressed mechanical item, while the fit is much poorer for the radar transmitter, which is an avionics item and for the hydraulic accumulator. For the radar transmitter the trend seems to be very scattered. For items with a large number of failures early in their life-cycle, repair is 'better than perfect', i.e. the items become more reliable after repair, presumably by elimination of less reliable subcomponents. However, this effect is not seen for items with few failures early in their life-cycle. For these items 'perfect repair' initially seems to be a valid model. However, in many casesrepair becomes 'less than perfect' later in the life-cycle. For the hydraulic accumulator this trend is even more accentuated and individual items seem to fall into two distinct subpopulations with opposite reliability trends.","PeriodicalId":143940,"journal":{"name":"2008 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115859714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Harvesting reliability data from the internet 从互联网上收集可靠性数据

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925816

H. Dussault, P.S. Zarubin, S. Morris, D. Nicholls

引用次数: 2

Uncertain failure thresholds in cumulative damage models 累积损伤模型的不确定失效阈值

2008 Annual Reliability and Maintainability Symposium Pub Date : 2008-01-28 DOI: 10.1109/RAMS.2008.4925818

A. Usynin, J. Hines, A. Urmanov

{"title":"Uncertain failure thresholds in cumulative damage models","authors":"A. Usynin, J. Hines, A. Urmanov","doi":"10.1109/RAMS.2008.4925818","DOIUrl":"https://doi.org/10.1109/RAMS.2008.4925818","url":null,"abstract":"This paper investigates the issues related to variability in degradation-based reliability models and how the variability affects the remaining useful life prognosis being made by those models. Particularly, uncertain failure thresholds in cumulative damage models are of primary interest in this study. Many degradation-based reliability approaches make use of a predefined deterministic value of the failure threshold. However, in real-world cases, the designer may not be aware of the precise critical degradation level. In such situations it is suitable to define the critical degradation level as a range of values having certain probabilities of being critical. If no prior information is available regarding the failure threshold; the critical value has to be estimated from experimental reliability data that are subject to uncertainty due to imperfect measurements and random deviations in reliability properties of the tested components. In these circumstances, it is desirable to model the critical threshold as a random variable. Otherwise, the model can be oversimplified since it neglects the failure threshold uncertainty, whose influence onto the reliability prediction can be significant. This paper presents uncertainty analysis regarding how variability in the failure threshold affects the reliability prediction in conjunction with cumulative damage models. Three types of cumulative damage models are investigated; these are a Markov chain-based model, a linear path degradation model, and a Wiener process with drift. Closed-form equations quantifying the threshold uncertainty propagation into the model prediction are given. A numerical example is presented to illustrate how the critical threshold uncertainty reshapes the predicted time-to-failure distribution, supporting the need for considering the critical threshold uncertainty in accurate reliability computations.","PeriodicalId":143940,"journal":{"name":"2008 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2008-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123720166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 18