Ieej Transactions on Fundamentals and Materials最新文献

筛选
英文 中文
研究グループ 紹介:九州大学 大学院システム情報科学研究院 電気システム工学部門 吉田研究室 研究小组:九州大学系统信息研究生院电气系统工学系吉田研究室
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-02-01 DOI: 10.1541/ieejfms.144.nl2_4
敬介 吉田
{"title":"研究グループ 紹介:九州大学 大学院システム情報科学研究院 電気システム工学部門 吉田研究室","authors":"敬介 吉田","doi":"10.1541/ieejfms.144.nl2_4","DOIUrl":"https://doi.org/10.1541/ieejfms.144.nl2_4","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"12 2","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139872605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ベッド内要介護者・患者の行動推定のためのマイク対配列による音源像生成 通过麦克风对阵列生成声源图像,用于床上护理人员/病人行为估算。
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-02-01 DOI: 10.1541/ieejfms.144.38
Hajime Nakajima
{"title":"ベッド内要介護者・患者の行動推定のためのマイク対配列による音源像生成","authors":"Hajime Nakajima","doi":"10.1541/ieejfms.144.38","DOIUrl":"https://doi.org/10.1541/ieejfms.144.38","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"3 10","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139818484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
QAM Signal Measurement Method based on Under-sampling 基于欠采样的 QAM 信号测量方法
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.23
Masatsugu Shimoda, Akihito Otani
{"title":"QAM Signal Measurement Method based on Under-sampling","authors":"Masatsugu Shimoda, Akihito Otani","doi":"10.1541/ieejfms.144.23","DOIUrl":"https://doi.org/10.1541/ieejfms.144.23","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"51 18","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139128025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
基礎・材料・共通部門役員会・委員会名簿 基础部、材料部和普通部董事会和委员会名单。
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.l1_1
{"title":"基礎・材料・共通部門役員会・委員会名簿","authors":"","doi":"10.1541/ieejfms.144.l1_1","DOIUrl":"https://doi.org/10.1541/ieejfms.144.l1_1","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"35 22","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139125704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
研究グループ 紹介:東京理科大学 創域理工学部 電気電子情報工学科 永田研究室 研究小组介绍:东京理科大学电气、电子和信息工程系永田实验室
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.nl1_4
肇 永田
{"title":"研究グループ 紹介:東京理科大学 創域理工学部 電気電子情報工学科 永田研究室","authors":"肇 永田","doi":"10.1541/ieejfms.144.nl1_4","DOIUrl":"https://doi.org/10.1541/ieejfms.144.nl1_4","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"30 23","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139130008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Forefront of Informatics Applications in Metallic and Ceramics Materials Technologies 金属和陶瓷材料技术中的信息学应用前沿
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.19
Akiyasu Yamamoto
{"title":"The Forefront of Informatics Applications in Metallic and Ceramics Materials Technologies","authors":"Akiyasu Yamamoto","doi":"10.1541/ieejfms.144.19","DOIUrl":"https://doi.org/10.1541/ieejfms.144.19","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"58 33","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139125437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
誘電体レンズを用いるミリ波帯透過係数測定装置 使用介质透镜的毫米波波段传输系数测量系统。
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.35
Shin-ichiro Yamamoto, Satoru Aikawa
{"title":"誘電体レンズを用いるミリ波帯透過係数測定装置","authors":"Shin-ichiro Yamamoto, Satoru Aikawa","doi":"10.1541/ieejfms.144.35","DOIUrl":"https://doi.org/10.1541/ieejfms.144.35","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"124 35","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139128453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent Activities of Frontiers in Education Committee of IEE Japan, from 2022 to 2023 国际电气工程师学会日本分会教育前沿委员会近期活动(2022-2023 年
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.1
Itaru Nakamura
{"title":"Recent Activities of Frontiers in Education Committee of IEE Japan, from 2022 to 2023","authors":"Itaru Nakamura","doi":"10.1541/ieejfms.144.1","DOIUrl":"https://doi.org/10.1541/ieejfms.144.1","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"48 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139127614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent Topics on Electrical Discharges, Plasma, and Pulsed Power Technologies 有关放电、等离子体和脉冲功率技术的最新主题
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.10
Hiroki Kojima
{"title":"Recent Topics on Electrical Discharges, Plasma, and Pulsed Power Technologies","authors":"Hiroki Kojima","doi":"10.1541/ieejfms.144.10","DOIUrl":"https://doi.org/10.1541/ieejfms.144.10","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"82 10","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139125043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
電気技術史技術委員会の最近の活動状況 电气技术史技术委员会近期的活动
Ieej Transactions on Fundamentals and Materials Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.3
Toshiko Nakagawa, Toshiyuki Sawa, Satoshi Marushima
{"title":"電気技術史技術委員会の最近の活動状況","authors":"Toshiko Nakagawa, Toshiyuki Sawa, Satoshi Marushima","doi":"10.1541/ieejfms.144.3","DOIUrl":"https://doi.org/10.1541/ieejfms.144.3","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"19 22","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139129190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信