{"title":"Practical Aspects of Quantitative and High-Fidelity STEM Data Recording","authors":"L. Jones","doi":"10.1201/9780429243011-2","DOIUrl":"https://doi.org/10.1201/9780429243011-2","url":null,"abstract":"","PeriodicalId":124735,"journal":{"name":"Scanning Transmission Electron Microscopy","volume":"296 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116317150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Ponce, J. L. Reyes-Rodríguez, E. Ortega, Prakash Parajuli, M. Hoque, A. Gazder
{"title":"Large Dataset Electron Diffraction Patterns for the Structural Analysis of Metallic Nanostructures","authors":"A. Ponce, J. L. Reyes-Rodríguez, E. Ortega, Prakash Parajuli, M. Hoque, A. Gazder","doi":"10.1201/9780429243011-5","DOIUrl":"https://doi.org/10.1201/9780429243011-5","url":null,"abstract":"","PeriodicalId":124735,"journal":{"name":"Scanning Transmission Electron Microscopy","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132080618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Machine Learning for Electron Microscopy","authors":"A. Belianinov","doi":"10.1201/9780429243011-3","DOIUrl":"https://doi.org/10.1201/9780429243011-3","url":null,"abstract":"","PeriodicalId":124735,"journal":{"name":"Scanning Transmission Electron Microscopy","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115461714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}