{"title":"Practical Aspects of Quantitative and High-Fidelity STEM Data Recording","authors":"L. Jones","doi":"10.1201/9780429243011-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":124735,"journal":{"name":"Scanning Transmission Electron Microscopy","volume":"296 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scanning Transmission Electron Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9780429243011-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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