发布求助
文献互助 智能选刊 最新文献

2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)最新文献

筛选
英文 中文
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits 大量的统计过程变化:测试纳米电子电路的巨大挑战
2010 International Conference on Dependable Systems and Networks Workshops (DSN-W) Pub Date : 2010-06-01 DOI: 10.1109/DSNW.2010.5542612
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich
{"title":"Massive statistical process variations: A grand challenge for testing nanoelectronic circuits","authors":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich","doi":"10.1109/DSNW.2010.5542612","DOIUrl":"https://doi.org/10.1109/DSNW.2010.5542612","url":null,"abstract":"Increasing parameter variations, high defect densities and a growing susceptibility to external noise in nanoscale technologies have led to a paradigm shift in design. Classical design strategies based on worst-case or average assumptions have been replaced by statistical design, and new robust and variation tolerant architectures have been developed. At the same time testing has become extremely challenging, as parameter variations may lead to an unacceptable behavior or change the impact of defects. Furthermore, for robust designs a precise quality assessment is required particularly showing the remaining robustness in the presence of manufacturing defects. The paper pinpoints the key challenges for testing nanoelectronic circuits in more detail, covering the range of variation-aware fault modeling via methods for statiscal testing and their algorithmic foundations to robustness analysis and quality binning.","PeriodicalId":124206,"journal":{"name":"2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)","volume":"260 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122464042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信