First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.最新文献

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Costs improvements expected thanks to new demonstration process 由于新的示范流程,预计成本将有所改善
F. Pilarski
{"title":"Costs improvements expected thanks to new demonstration process","authors":"F. Pilarski","doi":"10.1109/IWOTA.2004.1428407","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428407","url":null,"abstract":"","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126392031","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Early metrics for object oriented designs 面向对象设计的早期指标
B. Baldassari, C. Robach, L. du Bousquet
{"title":"Early metrics for object oriented designs","authors":"B. Baldassari, C. Robach, L. du Bousquet","doi":"10.1109/IWOTA.2004.1428417","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428417","url":null,"abstract":"To produce high quality object-oriented systems, a strong emphasis on the development process is necessary. This implies two implicit and complementary goals. First, to ensure a full control over the whole process, enabling accurate cost and delay estimation, resource efficient management, and a better overall understanding. Second, to improve quality all along the system lifecycle at development and maintenance stage. On the client side, a steady control over the development process implies a better detection and elimination of faults, raising the viability and usability of the system. This paper introduces a realistic example of metrics integration in the development process of object-oriented software. By addressing early stages of the design (ie. class diagram), we can anticipate design-level errors or warnings thus enabling a reduction of immediate and further costs and problems. Metrics used are issued from state of the art object-oriented research, and integrated in the widespread unified process of software development.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114773545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Experimental boundary-scan environment for research and education 实验边界扫描环境的研究和教育
R. Sedevcic, U. Kac, F. Novak, A. Biasizzo
{"title":"Experimental boundary-scan environment for research and education","authors":"R. Sedevcic, U. Kac, F. Novak, A. Biasizzo","doi":"10.1109/IWOTA.2004.1428410","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428410","url":null,"abstract":"The paper presents the experimental boundary-scan (EBS) environment, a pedagogical tool for research and education in the area of electronic test. The EBS environment was conceived primarily as a simple laboratory test system and a basic teaching aid for the IEEE 1149.x family of testability standards. It is based on a widely available hardware supporting boundary-scan test techniques and on the open source Linux operating system.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128510629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical criteria to rationalize the choice of run-time observation points in embedded software 在嵌入式软件中合理选择运行时观测点的统计准则
P. Bourret, A. Fernandez, C. Seguin
{"title":"Statistical criteria to rationalize the choice of run-time observation points in embedded software","authors":"P. Bourret, A. Fernandez, C. Seguin","doi":"10.1109/IWOTA.2004.1428413","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428413","url":null,"abstract":"Runtime observation points are fixed once for all in embedded software in aircraft. Thus the selection should optimize the detection, explanation and isolation of all failures or errors that can occur Currently, this selection is based on expert practice. We propose to use statistical criteria to support this choice. In this paper, we present some criteria inspired by information theory and some experiments conducted to evaluate the criteria relevance.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115129399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
RT-level test point insertion for sequential circuits rt级测试点插入顺序电路
J. Raik, V. Govind, R. Ubar
{"title":"RT-level test point insertion for sequential circuits","authors":"J. Raik, V. Govind, R. Ubar","doi":"10.1109/IWOTA.2004.1428412","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428412","url":null,"abstract":"The current paper presents a new, coarse-grain method for test point insertion performed at the RT-level. The method relies on inserting testability components to the RTL VHDL description of the design. The approach is based on non-classical, simplified concept of controllability and observability. The insertion takes place based on the list of uncontrollable and unobservable faults obtained by a sequential ATPG. Such interaction with an ATPG and resynthesis of the device after each test structure insertion would be very time-consuming. The proposed method solves its task with just three iterations. First, a testability analysis is carried out and controllability structures are inserted to the modules containing uncontrollable faults. Then, the circuit is resynthesized and the ATPG is run. Second, the observability structures are added to the modules, with remaining unobservable faults. Finally, after resynthesis and an ATPG run the overhead area is minimized by removing observability structures from blocks, where there was no increase in fault coverage. A synthesizable VHDL library of dedicated generic components for testability structures has been implemented. Experiments on six RTL benchmarks show the efficiency of the approach.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"186 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124766773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Contract-based testing: from objects to components 基于契约的测试:从对象到组件
P. Collet, D. Deveaux, R. Rousseau
{"title":"Contract-based testing: from objects to components","authors":"P. Collet, D. Deveaux, R. Rousseau","doi":"10.1109/IWOTA.2004.1428408","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428408","url":null,"abstract":"Contracts on object-oriented classes have been first developed as a software design approach. They were also quickly used for supporting class testing, providing a form of design for testability. In this paper, we identify the tracks to extend the contract-based built-in test technique to hierarchical components. To do that, we build on our previous work on STclass, a framework supporting design by contract and built-in test for Java, and on ConFract, a contracting system for the Fractal component platform. Tests are embedded in the components and are generated with respect to a category of contract (library, interface, composition). In this paper we study how this approach, firstly dedicated to objects, can be valuable for component testability. As a result of the test process, the embedded contracts are more robust and offer an original way to improve the observability of the component-based system. Contracts make it aware of its execution, and thus able to detect erroneous behaviors at runtime.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122184375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Testability analysis of reactive software 响应式软件的可测试性分析
Thanh Binh Nguyen, C. Robach, M. Delaunay
{"title":"Testability analysis of reactive software","authors":"Thanh Binh Nguyen, C. Robach, M. Delaunay","doi":"10.1109/IWOTA.2004.1428409","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428409","url":null,"abstract":"This paper is about testability analysis for reactive software. We describe an application of the SATAN method, which allows testability of data-flow designs to be measured, to analyze testability of the source code of reactive software, such as avionics software. We first propose the transformation of the source code generated from data-flow designs into the static single assignment (SSA) form; then we describe the algorithm to automatically translate the SSA form into a testability model. Thus, analyzing the testability model can allow the detection of the software parts which induce a testability weakness.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130650836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improving the testability of UML class diagrams 改进UML类图的可测试性
B. Baudry, Y. Le Traon, G. Sunyé
{"title":"Improving the testability of UML class diagrams","authors":"B. Baudry, Y. Le Traon, G. Sunyé","doi":"10.1109/IWOTA.2004.1428418","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428418","url":null,"abstract":"This paper synthesizes our research efforts in the field of object-oriented test. These efforts have two different goals. First, we identify of recurrent design structures - or testability anti-patterns - that worsen software testability. Second, we use the UML extension mechanisms to better specify design information that can make implementation more testable. Although detecting testability anti-patterns during software design is a crucial task, one cannot expect from a non-specialist to make the right improvements, without guidance or automation. To overcome this limitation, each definition of an anti-pattern is associated with an alternative design solution.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121657316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Automatic testability analysis for data-flow designs of reactive systems 响应系统数据流设计的自动可测试性分析
H. Do, C. Robach, M. Delaunay
{"title":"Automatic testability analysis for data-flow designs of reactive systems","authors":"H. Do, C. Robach, M. Delaunay","doi":"10.1109/IWOTA.2004.1428416","DOIUrl":"https://doi.org/10.1109/IWOTA.2004.1428416","url":null,"abstract":"Reactive real-time systems require a very high level of confidence. The validation of these systems is very important since it ensures the confidence in these systems. Two main activities of the validation are the proof of some parts of the system, and the testing of the system. However, testing of reactive systems is complex and expensive. This is where a testability analysis can help, by appraising the ease with which testing can be undertaken. In this paper, we propose a method to analyze automatically the testability of data-flow designs of reactive real-time systems. This method, which is based on the SATAN technology, allows testability of reactive systems to be measured very soon during the specification stage. Thus, weaknesses of the design can be detected, and the system can be improved in terms of testability.","PeriodicalId":120954,"journal":{"name":"First International Workshop onTestability Assessment, 2004. IWoTA 2004. Proceedings.","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115024514","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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