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Proposed for presentation at the MS&T 2020 held November 2-6, 2020 in virtual.最新文献

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Exploring Extreme Environments via In-situ Electron Microscopy. 通过原位电子显微镜探索极端环境。
Proposed for presentation at the MS&T 2020 held November 2-6, 2020 in virtual. Pub Date : 2020-11-01 DOI: 10.2172/1830990
K. Hattar
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引用次数: 0
Deep Convolutional Neural Networks as a Rapid Screening Tool for Complex Additively Manufactured Structures. 深度卷积神经网络作为复杂增材制造结构的快速筛选工具。
Proposed for presentation at the MS&T 2020 held November 2-6, 2020 in virtual. Pub Date : 2020-10-01 DOI: 10.2172/1829260
Brad L. Boyce, Anthony P. Garland, Benjamin White, B. Jared, M. Heiden, Emily A. Donahue
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引用次数: 0
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