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Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement最新文献

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Session details: Inspections 会议详情:视察
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247181
D. Pfahl
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引用次数: 0
Session details: Empirical evidence and systematic review 会议细节:经验证据和系统回顾
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247190
D. Caivano
{"title":"Session details: Empirical evidence and systematic review","authors":"D. Caivano","doi":"10.1145/3247190","DOIUrl":"https://doi.org/10.1145/3247190","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129289098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Experience in process improvement 会议细节:过程改进经验
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247189
T. Gorschek
{"title":"Session details: Experience in process improvement","authors":"T. Gorschek","doi":"10.1145/3247189","DOIUrl":"https://doi.org/10.1145/3247189","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115332055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: From the programmers' trenches 会话细节:来自程序员的战壕
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247180
H. Erdogmus
{"title":"Session details: From the programmers' trenches","authors":"H. Erdogmus","doi":"10.1145/3247180","DOIUrl":"https://doi.org/10.1145/3247180","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130991225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: From the manager's trenches 会话细节:来自经理的战壕
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247185
P. Runeson
{"title":"Session details: From the manager's trenches","authors":"P. Runeson","doi":"10.1145/3247185","DOIUrl":"https://doi.org/10.1145/3247185","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131564896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Keynote address 会议详情:主题演讲
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247179
S. Elbaum
{"title":"Session details: Keynote address","authors":"S. Elbaum","doi":"10.1145/3247179","DOIUrl":"https://doi.org/10.1145/3247179","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115968816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Estimation models I 会话细节:估计模型1
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247177
C. Seaman
{"title":"Session details: Estimation models I","authors":"C. Seaman","doi":"10.1145/3247177","DOIUrl":"https://doi.org/10.1145/3247177","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"133 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133460594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Metrics and methodology 会话细节:度量和方法
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247182
M. Oivo
{"title":"Session details: Metrics and methodology","authors":"M. Oivo","doi":"10.1145/3247182","DOIUrl":"https://doi.org/10.1145/3247182","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128832824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Modeling and architecture 会话细节:建模和体系结构
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247178
J. Carver
{"title":"Session details: Modeling and architecture","authors":"J. Carver","doi":"10.1145/3247178","DOIUrl":"https://doi.org/10.1145/3247178","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131800977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Keynote address 会议详情:主题演讲
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement Pub Date : 2008-10-09 DOI: 10.1145/3247174
J. Münch
{"title":"Session details: Keynote address","authors":"J. Münch","doi":"10.1145/3247174","DOIUrl":"https://doi.org/10.1145/3247174","url":null,"abstract":"","PeriodicalId":111076,"journal":{"name":"Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123830846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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