{"title":"Millimeter Wave Syntheisizer","authors":"K. Ishikawa","doi":"10.1109/ARFTG.1982.323526","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323526","url":null,"abstract":"A series of microprocessor controlled millimeter wave synthesizers are being developed based on phased-locked Impatt oscillators with tuning ranges of 8 to 15 GHz.(1,2,3) The design considerations in optimizing the performance of these synthesizers as well as their specifications are presented.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133716906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"NBS Six-Port ANA","authors":"D. Russell","doi":"10.1109/ARFTG.1982.323523","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323523","url":null,"abstract":"This paper describes a \"Turn-Key\" NBS-designed ANA utilizing the six-port principle to provide state-of-the-art measurement accuracy for power and scattering (S) parameters over a frequency range of 400 MHz to 18 GHz.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128458541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi-Port Characteristics","authors":"A. Lance","doi":"10.1109/ARFTG.1982.323518","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323518","url":null,"abstract":"This paper presents a detailed analysis of multi-port structures used as network analyzers to determine phase and magnitude of impedance (reflection coefficient) from measurements of magnitude only. Physical interprztations using phasor signals are used to illustrate, describe and compare mathematical solutions. complex plane representation and the corresponding magnituae measurements of voltage or power.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"266 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123368930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Personal Computer Based System for the Rapid Display of Smith Chart Curves Using 6-Ports","authors":"Gordon Rislet","doi":"10.1109/ARFTG.1982.323525","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323525","url":null,"abstract":"In an increasing number of applications it is required to accurately measure the reflection coefficient of a component in a transmission medium different from that of the RF test equipment through an adapter which may have a substantial mismatch. A classical example would be the measurement of a waveguide component using coaxial test equipment such as that based on 7mm line through a coax to waveguide adapter. In an ever increasing number of applications one is required to measure a component in stripline, NIC, or monalithic circuitry using coaxial test equipment. To obtain sufficient accuracy it is frequently necessary to perform a computerized correction for the error introduced by the adapter mismatch. In the first part of this paper it is demonstrated that the 6-port approach can lead to a very rapid determination of P, in those cases where computerized correction of measurement data is necessary, because of the simplicity of the mathematical computations involved. The second part of the paper describes a working system based on an 8 bit personal computer.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125548883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Examination of Parasitic Inductance at an Impedence Step","authors":"Harold Stinebelfer","doi":"10.1109/ARFTG.1982.323528","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323528","url":null,"abstract":"An impedance step from 50 to 60 ohms was computed with parasitic ductance to show how the effect modified the total reflection. This inductance was located before, at, and after the impedance step. The MAMA* program was used to identify the frequency and time-domain effects.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129425250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experiments on X-Band Automatic Impedance Measuring Scheme Using Three Fixed Probes","authors":"Chia-lun J. Hu","doi":"10.1109/ARFTG.1982.323530","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323530","url":null,"abstract":"Resulting from a two-month visiting research a t National Bureau of Standards, Boulder, Colorado, this Summer, the author was able t o virify w i t h real-time oscilloscope display, the theory he published two years ago conceming automatic impedance measuring schemes us ing multiple probes, (IEEE Trans. MTT, Dec. 1980). The system consists of three, non-resonating probes mounted on an X-band waveguide. The diode detected o u t p u t s from these probes are fed into a d.c. s i g n a l processor designed according to the theory described i n the quoted paper. The two outputs of the s i g n a l processor are then connected t o the x,y i n p u t s of a storage oscillo41","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130015795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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