Optics TechnologyPub Date : 1970-05-01DOI: 10.1016/0374-3926(70)90011-6
R. Anstiss
{"title":"Optical alignment device for lasers","authors":"R. Anstiss","doi":"10.1016/0374-3926(70)90011-6","DOIUrl":"10.1016/0374-3926(70)90011-6","url":null,"abstract":"<div><p>An optical alignment for lasers is described. Intended as a more convenient instrument than is commercially available, it eliminates troublesome ghost images.</p></div>","PeriodicalId":100989,"journal":{"name":"Optics Technology","volume":"2 2","pages":"Page 102"},"PeriodicalIF":0.0,"publicationDate":"1970-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0374-3926(70)90011-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88673218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optics TechnologyPub Date : 1970-05-01DOI: 10.1016/0374-3926(70)90005-0
H.J. Tiziani, B.H. Beyeler, W. Witz
{"title":"Opto-electronic pattern recognition system","authors":"H.J. Tiziani, B.H. Beyeler, W. Witz","doi":"10.1016/0374-3926(70)90005-0","DOIUrl":"10.1016/0374-3926(70)90005-0","url":null,"abstract":"<div><p>An opto-electronic technique for the classification of grains of photographic emulsions by shape is described. Fortunately, the shapes to be distinguished differ only in their two-dimensional rotational symmetry group. A special optical filtering procedure has been developed to take account of the implied positional and rotational invariance. The transfer from the optical to the electrical signal is obtained in a simple manner. The method works satisfactorily even for a rather complicated cluster. Some results are discussed.</p></div>","PeriodicalId":100989,"journal":{"name":"Optics Technology","volume":"2 2","pages":"Pages 75-79"},"PeriodicalIF":0.0,"publicationDate":"1970-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0374-3926(70)90005-0","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79793336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optics TechnologyPub Date : 1970-05-01DOI: 10.1016/0374-3926(70)90003-7
P.D. Townsend
{"title":"Ion beams in optics—an introduction","authors":"P.D. Townsend","doi":"10.1016/0374-3926(70)90003-7","DOIUrl":"10.1016/0374-3926(70)90003-7","url":null,"abstract":"<div><p>This article discusses effects, uses and accuracy of ion beams in glass polishing. Totally new horizons in lens design have been opened by ion bombardment. The technique has the inherent possibility of producing variations in refractive index across a surface and a highly polished surface in the same specimen. Controlled manufacture of aspheric lenses is possible and is cheaper and faster than conventional methods. Removal of residual sleeks from conventional polishing are reported. As beam energy increases, surface penetration increases and ion implantation is possible. Effects of ion beams on insulators are discussed and control of optical absorption and luminescence, as well as chemical stability and conductivity, is possible. The author concludes by pointing out the great scope for applications of irradiation damage in glass.</p></div>","PeriodicalId":100989,"journal":{"name":"Optics Technology","volume":"2 2","pages":"Pages 65-67"},"PeriodicalIF":0.0,"publicationDate":"1970-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0374-3926(70)90003-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73883725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optics TechnologyPub Date : 1970-05-01DOI: 10.1016/0374-3926(70)90007-4
A.C. Marchant, E.A. Ironside
{"title":"Influence of optical bench errors on accuracy of otf measurements","authors":"A.C. Marchant, E.A. Ironside","doi":"10.1016/0374-3926(70)90007-4","DOIUrl":"10.1016/0374-3926(70)90007-4","url":null,"abstract":"<div><p>Comparisons of the results of otf measurements made in different laboratories have shown that wide differences often occur at moderate to large field angles. A major cause of such differences may well be mechanical error in the optical bench which supports the lens under test. Ideally, the bench is required to be of such accuracy that the image-analysing system moves in a plane (the chosen image plane) parallel to the lens mounting face. Mechanical errors which cause the analyser to be displaced from this plane by only a few micrometres, may cause significant variations in the measured otf. In this note a method is described for measuring the perpendicular displacement, δz, of the image analyser from the image plane at different angular settings of the optical bench.</p></div>","PeriodicalId":100989,"journal":{"name":"Optics Technology","volume":"2 2","pages":"Pages 85-87"},"PeriodicalIF":0.0,"publicationDate":"1970-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0374-3926(70)90007-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88840383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optics TechnologyPub Date : 1970-05-01DOI: 10.1016/0374-3926(70)90004-9
H. Nieuwenhuijzen
{"title":"Lasers in astronomical spectroscopy-2","authors":"H. Nieuwenhuijzen","doi":"10.1016/0374-3926(70)90004-9","DOIUrl":"10.1016/0374-3926(70)90004-9","url":null,"abstract":"<div><p>In Part 1 electronic heterodyne spectroscopy using lasers was introduced. Part 2 discusses two experiments, one with a laser and a gas discharge as a laboratory source, the other with a laser and starlight collected by a telescope with a large receiving area. Results of these experiments are presented and optical and electronic instrumentation described. From results so far it seems possible to use the technique of optical mixing for absolute monochromatic flux and polarisation measurements on star-like objects. If laser line shifts become possible standard stellar lines could be analysed with high resolution and low Doppler shifts measured.</p></div>","PeriodicalId":100989,"journal":{"name":"Optics Technology","volume":"2 2","pages":"Pages 68-74"},"PeriodicalIF":0.0,"publicationDate":"1970-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0374-3926(70)90004-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77229749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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