ATZelektronik最新文献

筛选
英文 中文
Future-Proof Cybersecurity für vernetzte Fahrwerksysteme im Kontext des Cyber Resilience Act 《网络弹性法案》背景下的网络悬挂系统的未来安全
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2076-0
Marcus Perner, Sebastian Wiegand, Marco Siebert, Christoph Wenzel
{"title":"Future-Proof Cybersecurity für vernetzte Fahrwerksysteme im Kontext des Cyber Resilience Act","authors":"Marcus Perner, Sebastian Wiegand, Marco Siebert, Christoph Wenzel","doi":"10.1007/s35658-025-2076-0","DOIUrl":"10.1007/s35658-025-2076-0","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"16 - 21"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nixperia Nixperia
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2093-z
Robert Unseld
{"title":"Nixperia","authors":"Robert Unseld","doi":"10.1007/s35658-025-2093-z","DOIUrl":"10.1007/s35658-025-2093-z","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"3 - 3"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Unternehmen + Produkte 公司+产品
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2091-1
{"title":"Unternehmen + Produkte","authors":"","doi":"10.1007/s35658-025-2091-1","DOIUrl":"10.1007/s35658-025-2091-1","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"34 - 37"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Kommunikation von Testautomation und Prüfsystem mit STEP-Middleware 测试自动化和测试系统与STEP中间件的通信
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2097-8
Hussam Hamzat, Rudolf Mittermeier
{"title":"Kommunikation von Testautomation und Prüfsystem mit STEP-Middleware","authors":"Hussam Hamzat, Rudolf Mittermeier","doi":"10.1007/s35658-025-2097-8","DOIUrl":"10.1007/s35658-025-2097-8","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"52 - 57"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
„Ziel ist es, vernetzte Fahrzeuge fit für das Quantenzeitalter zu machen“ “我们的目标是让联网汽车适应量子时代”。
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2090-2
Robert Unseld
{"title":"„Ziel ist es, vernetzte Fahrzeuge fit für das Quantenzeitalter zu machen“","authors":"Robert Unseld","doi":"10.1007/s35658-025-2090-2","DOIUrl":"10.1007/s35658-025-2090-2","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"22 - 25"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s35658-025-2090-2.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Prüfstände und Simulation 测试和模拟
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2099-6
Caroline Behle
{"title":"Prüfstände und Simulation","authors":"Caroline Behle","doi":"10.1007/s35658-025-2099-6","DOIUrl":"10.1007/s35658-025-2099-6","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"50 - 51"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Hansen Report 汉森报告
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2087-x
Paul Hansen
{"title":"The Hansen Report","authors":"Paul Hansen","doi":"10.1007/s35658-025-2087-x","DOIUrl":"10.1007/s35658-025-2087-x","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"31 - 31"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Kampf um die Produktionskosten 生产成本之战
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2088-9
Andreas Burkert
{"title":"Kampf um die Produktionskosten","authors":"Andreas Burkert","doi":"10.1007/s35658-025-2088-9","DOIUrl":"10.1007/s35658-025-2088-9","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"8 - 13"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s35658-025-2088-9.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
KI-gestützte Analyse bei Dauerlauftests zur erklärbaren Detektion von Anomalien 连续运行测试中的人工智能分析,以解释异常检测
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2098-7
Tharun Ganesh Jakkampudi, Jan Nowack, Thomas Flecke, Lukas Schäfers
{"title":"KI-gestützte Analyse bei Dauerlauftests zur erklärbaren Detektion von Anomalien","authors":"Tharun Ganesh Jakkampudi, Jan Nowack, Thomas Flecke, Lukas Schäfers","doi":"10.1007/s35658-025-2098-7","DOIUrl":"10.1007/s35658-025-2098-7","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"66 - 73"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantensicherheit für Fahrzeuge 汽车的量子安全
ATZelektronik Pub Date : 2025-12-05 DOI: 10.1007/s35658-025-2089-8
Hendrik Meer
{"title":"Quantensicherheit für Fahrzeuge","authors":"Hendrik Meer","doi":"10.1007/s35658-025-2089-8","DOIUrl":"10.1007/s35658-025-2089-8","url":null,"abstract":"","PeriodicalId":100144,"journal":{"name":"ATZelektronik","volume":"20 12","pages":"82 - 82"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书