Discover electronicsPub Date : 2026-01-01Epub Date: 2026-05-05DOI: 10.1007/s44291-026-00218-7
Osita U Omeje, Luciano Olukanni, Daniel E Okojie, Candidus U Eya, Abiola B Aina
{"title":"Online event-triggered switching load frequency control of islanded microgrids through machine learning.","authors":"Osita U Omeje, Luciano Olukanni, Daniel E Okojie, Candidus U Eya, Abiola B Aina","doi":"10.1007/s44291-026-00218-7","DOIUrl":"10.1007/s44291-026-00218-7","url":null,"abstract":"<p><p>This paper presents the design and development of an adaptive online event-triggered load frequency control (LFC) framework for islanded microgrids using machine learning techniques. The proposed approach addresses the stability challenges and performance limitations of conventional LFC strategies arising from the dynamic and stochastic characteristics of modern microgrids with high renewable penetration. A Neural-PI controller, pre-trained to capture complex system dynamics, is employed to enable intelligent event-triggered switching and real-time adjustment of control gains, thereby enhancing frequency regulation and overall system stability. The framework is implemented in Python using a Jupyter Notebook environment and evaluated on the IEEE 14-bus test system, where results demonstrate its ability to dynamically adapt event thresholds under varying operating conditions, leading to improved stability and control efficiency. Accordingly, the Neural-PI controller markedly outperforms the conventional PID controller, achieving a 58% reduction in peak frequency deviations, a 33% improvement in settling time, and a 95% reduction in control actions through event-triggered switching, with particularly strong performance during periods of renewable intermittency. Its adaptive capability enabled 2.5 times more effective inertia mode changes, reduced oscillations and overshoot, and contributed to a 19% increase in renewable hosting capacity alongside a 37% reduction in load-frequency control operational costs, making it especially suitable for islanded and low-inertia grids.</p>","PeriodicalId":521158,"journal":{"name":"Discover electronics","volume":"3 1","pages":"65"},"PeriodicalIF":0.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13144237/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147849356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Discover electronicsPub Date : 2026-01-01Epub Date: 2026-02-01DOI: 10.1007/s44291-026-00164-4
T Schram, Q Smets, A Opdebeeck, S Ghosh, B Groven, P Kumar, H M Medina, D Cott, J-F deMarneffe, H Dongre, A Kruv, L Panarella, L F Pinotti, P Morin, G S Kar, C J Lockhart de la Rosa
{"title":"Integration and electrical evaluation of WS<sub>2</sub> and MoS<sub>2</sub> fets in a 300 mm pilot line.","authors":"T Schram, Q Smets, A Opdebeeck, S Ghosh, B Groven, P Kumar, H M Medina, D Cott, J-F deMarneffe, H Dongre, A Kruv, L Panarella, L F Pinotti, P Morin, G S Kar, C J Lockhart de la Rosa","doi":"10.1007/s44291-026-00164-4","DOIUrl":"10.1007/s44291-026-00164-4","url":null,"abstract":"<p><p>2D materials have the potential to extend and augment the CMOS scaling roadmap. However, upscaling from lab-based demonstrators to 300 mm-compatible integration modules presents unique challenges. In this work, we address these challenges through a 2D FET process flow developed within imec's 300 mm Si pilot line. FETs with monolayer 2D transition metal dichalcogenide (TMDC) channels are fabricated, and the flow serves as a research vehicle to advance 300 mm-compatible integration modules, including TMDC growth, transfer, cleaning, gate stack deposition, and contact optimization. Key integration challenges arising from the weakly van der Waals-bonded 2D materials are identified, and the motivation behind specific process choices is discussed in the context of fab-specific contamination control. The processing is followed by a rigorous electrical characterization with dedicated test structures to evaluate the FET performance metrics, gate stack scalability, device yield, variability, reliability and stability. This paper provides, for the first time, a comprehensive and systematic description of our 300 mm fab-compatible integration flow for planar 2D FETs, broken down into its individual process modules and supported by a full electrical evaluation.</p><p><strong>Supplementary information: </strong>The online version contains supplementary material available at10.1007/s44291-026-00164-4.</p>","PeriodicalId":521158,"journal":{"name":"Discover electronics","volume":"3 1","pages":"15"},"PeriodicalIF":0.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12862033/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146115526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Discover electronicsPub Date : 2026-01-01Epub Date: 2026-06-21DOI: 10.1007/s44291-026-00244-5
Dalal Z Zreiqat, Vinh Nguyen, Nathir A Rawashdeh
{"title":"Label quality as a bottleneck for YOLO detection in all-weather autonomous driving using the MUSES dataset.","authors":"Dalal Z Zreiqat, Vinh Nguyen, Nathir A Rawashdeh","doi":"10.1007/s44291-026-00244-5","DOIUrl":"10.1007/s44291-026-00244-5","url":null,"abstract":"<p><p>Autonomous-vehicle perception models perform well in clear daytime but degrade under adverse weather and low illumination. We quantify how annotation quality affects YOLO-based 2D detection using the forward-facing RGB subset of the MUSES dataset spanning clear, rain, fog, snow, and night. Focusing on lightweight detectors (YOLOv11n/YOLOv11s) to reflect embedded ADAS constraints, we observe systematic label noise (missing objects, mislocalized boxes, and class inconsistencies) that limits achievable accuracy. We therefore introduce a semi-automatic label-upgrading pipeline: a high-capacity teacher produces candidate labels, which are then verified and corrected by a human annotator. Under identical training settings, retraining on the cleaned annotations improves mAP@0.5 from approximately 0.13 to 0.56-0.62 across conditions, indicating that supervision quality is a major bottleneck for all-weather detection and that data-centric fixes can unlock large gains even for lightweight models.</p>","PeriodicalId":521158,"journal":{"name":"Discover electronics","volume":"3 1","pages":"91"},"PeriodicalIF":0.0,"publicationDate":"2026-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC13283147/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148304563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Discover electronicsPub Date : 2025-01-01Epub Date: 2025-12-12DOI: 10.1007/s44291-025-00136-0
S Haghgooye Shafagh, I Deen, M Packirisamy
{"title":"Improved electrical performance of PDMS and PEDOT: PSS composites with MWCNT and AgNP particles.","authors":"S Haghgooye Shafagh, I Deen, M Packirisamy","doi":"10.1007/s44291-025-00136-0","DOIUrl":"10.1007/s44291-025-00136-0","url":null,"abstract":"<p><p>The fabrication of conductive polymer composites (CPCs) using polydimethylsiloxane (PDMS) and poly(3,4-ethylene dioxythiophene): poly(4-styrene-sulfonate) (PEDOT: PSS) as a matrix with multi-walled carbon nanotubes (MWCNTs) and silver nanoparticles (AgNPs) as fillers was investigated to determine their potential for use in applications such as electromagnetic interference (EMI) shielding, sensors, and thermal switches/cut-offs. The effect of the fillers was investigated using MWCNTs of different sizes and including both MWCNTs and AgNPs at different ratios. Scanning electron microscopy (SEM) analyzed the morphology of the CPCs showed that the inclusion of AgNPs in the PDMS matrix resulted in a particle size gradient, with larger particles at the bottom of the CPC, although SEM confirmed that there was no separation between PDMS/AgNP and bulk PDMS. SEM of the PEDOT: PSS/MWCNT composites showed an anisotropic structure, with MWCNTs randomly oriented and dispersed throughout the polymer. Electrical characterization showed that the fabrication method and the MWCNT diameter and content affect the conductivity, with MWCNTs of smaller diameters at 45 wt% in CPCs synthesized using ultrasonication having the highest conductivity at 121.21 S/m. The analysis of CPCs synthesized with polyethylene glycol (PEG) and glycerol was also shown to be feasible and improved the flexibility of the composite, and resulted in a conductivity of 378.97 S/m, ~ 26% higher than that reported in the literature. Finally, thermal characterization showed that PDMS and PEDOT: PSS composites exhibit the thermoelectric (TE) effect, where a change in temperature creates an electric potential and vice versa, with the temperature of PDMS composites rising from room temperature (22℃) to approximately 70℃ when a 5 V potential was applied. Under the same conditions, PDMS composites with 50 wt% MWCNTs rose from room temperature to 106℃, while composites with 30 wt% MWCNTs only rose to 65℃. and 50 wt% MWCNTs. The PEDOT: PSS/MWCNT composites also exhibited the TE effect, with the measured resistance varying with temperature. These results demonstrate that CPCs exhibit tunable properties that are suitable for use in various electrical applications.</p><p><strong>Supplementary information: </strong>The online version contains supplementary material available at 10.1007/s44291-025-00136-0.</p>","PeriodicalId":521158,"journal":{"name":"Discover electronics","volume":"2 1","pages":"105"},"PeriodicalIF":0.0,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12713538/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145807202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}