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Einfluss der Anordnung von IC-Stromversorgung mit Stützkondensatoren auf die elektromagnetische Emission 带备用电容器的集成电路电源布置对电磁辐射的影响
e & i Elektrotechnik und Informationstechnik Pub Date : 2024-01-10 DOI: 10.1007/s00502-023-01200-x
B. Deutschmann, N. Juch
{"title":"Einfluss der Anordnung von IC-Stromversorgung mit Stützkondensatoren auf die elektromagnetische Emission","authors":"B. Deutschmann, N. Juch","doi":"10.1007/s00502-023-01200-x","DOIUrl":"https://doi.org/10.1007/s00502-023-01200-x","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"72 20","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139440610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ein modulares und skalierbares System zur Prüfung der elektromagnetischen Verträglichkeit von integrierten Schaltungen 用于测试集成电路电磁兼容性的模块化可扩展系统
e & i Elektrotechnik und Informationstechnik Pub Date : 2024-01-10 DOI: 10.1007/s00502-023-01199-1
Daniel Kircher, Simon Profanter, B. Deutschmann
{"title":"Ein modulares und skalierbares System zur Prüfung der elektromagnetischen Verträglichkeit von integrierten Schaltungen","authors":"Daniel Kircher, Simon Profanter, B. Deutschmann","doi":"10.1007/s00502-023-01199-1","DOIUrl":"https://doi.org/10.1007/s00502-023-01199-1","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"76 9","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139440825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Open-source design of integrated circuits 集成电路的开源设计
e & i Elektrotechnik und Informationstechnik Pub Date : 2024-01-09 DOI: 10.1007/s00502-023-01195-5
Patrick Fath, Manuel Moser, Georg Zachl, Harald Pretl
{"title":"Open-source design of integrated circuits","authors":"Patrick Fath, Manuel Moser, Georg Zachl, Harald Pretl","doi":"10.1007/s00502-023-01195-5","DOIUrl":"https://doi.org/10.1007/s00502-023-01195-5","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"35 36","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139442844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Von 65 nm bis 28 nm CMOS: Design analoger Bausteine von Frontend-Kanälen für Pixelsensoren in Hochenergiephysik-Experimenten 从 65 纳米到 28 纳米 CMOS：高能物理实验中像素传感器前端通道模拟组件的设计
e & i Elektrotechnik und Informationstechnik Pub Date : 2023-12-29 DOI: 10.1007/s00502-023-01198-2
Gianluca Traversi, Luigi Gaioni, Andrea Galliani
{"title":"Von 65 nm bis 28 nm CMOS: Design analoger Bausteine von Frontend-Kanälen für Pixelsensoren in Hochenergiephysik-Experimenten","authors":"Gianluca Traversi, Luigi Gaioni, Andrea Galliani","doi":"10.1007/s00502-023-01198-2","DOIUrl":"https://doi.org/10.1007/s00502-023-01198-2","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"1 2","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139146807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ein 0,46–0,52 THz volldifferenzieller quasi-monostatischer FMCW Radar-Sendeempfänger in 90 nm SiGe BiCMOS 采用 90 纳米 SiGe BiCMOS 的 0.46-0.52 THz 全差分准单稳态 FMCW 雷达收发器
e & i Elektrotechnik und Informationstechnik Pub Date : 2023-12-28 DOI: 10.1007/s00502-023-01196-4
Christoph Mangiavillano, Alexander Kaineder, A. Stelzer
{"title":"Ein 0,46–0,52 THz volldifferenzieller quasi-monostatischer FMCW Radar-Sendeempfänger in 90 nm SiGe BiCMOS","authors":"Christoph Mangiavillano, Alexander Kaineder, A. Stelzer","doi":"10.1007/s00502-023-01196-4","DOIUrl":"https://doi.org/10.1007/s00502-023-01196-4","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"62 8","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139150385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analyse und Kompensation von Stressauswirkungen auf CMOS-Referenzstromquellen CMOS 基准电流源应力效应分析与补偿
e & i Elektrotechnik und Informationstechnik Pub Date : 2023-12-22 DOI: 10.1007/s00502-023-01194-6
Andro Žamboki, Leo Gočan, Josip Mikulić, Gregor Schatzberger, Tomislav Marković, Adrijan Barić
{"title":"Analyse und Kompensation von Stressauswirkungen auf CMOS-Referenzstromquellen","authors":"Andro Žamboki, Leo Gočan, Josip Mikulić, Gregor Schatzberger, Tomislav Marković, Adrijan Barić","doi":"10.1007/s00502-023-01194-6","DOIUrl":"https://doi.org/10.1007/s00502-023-01194-6","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"40 8","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139164742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators 基于纳米级 CMOS 环形振荡器的统计随机电报噪声分析中的偏差依赖性
e & i Elektrotechnik und Informationstechnik Pub Date : 2023-12-21 DOI: 10.1007/s00502-023-01197-3
Semih Ramazanoglu, A. Michalowska-Forsyth, B. Deutschmann
{"title":"Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators","authors":"Semih Ramazanoglu, A. Michalowska-Forsyth, B. Deutschmann","doi":"10.1007/s00502-023-01197-3","DOIUrl":"https://doi.org/10.1007/s00502-023-01197-3","url":null,"abstract":"","PeriodicalId":502434,"journal":{"name":"e & i Elektrotechnik und Informationstechnik","volume":"37 2","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139167316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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