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Soft Error Reliability of VLSI Circuits最新文献

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Introduction: Soft Error Modeling 介绍:软误差建模
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_1
B. Ghavami, Mohsen Raji
{"title":"Introduction: Soft Error Modeling","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_1","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_1","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125027448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Soft Error Rate Estimation of VLSI Circuits VLSI电路的软错误率估计
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_2
B. Ghavami, Mohsen Raji
{"title":"Soft Error Rate Estimation of VLSI Circuits","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_2","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_2","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130014227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits 数字电路软误码率估计的FPGA硬件加速
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_5
B. Ghavami, Mohsen Raji
{"title":"FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_5","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_5","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130670577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing 基于栅极分割的软容错电路设计
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_6
B. Ghavami, Mohsen Raji
{"title":"Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_6","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_6","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121964627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Process Variation-Aware Soft Error Rate Estimation Method for Integrated Circuits 集成电路过程变化感知软错误率估计方法
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_3
B. Ghavami, Mohsen Raji
{"title":"Process Variation-Aware Soft Error Rate Estimation Method for Integrated Circuits","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_3","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_3","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125180854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Resynthesize Technique for Soft Error-Tolerant Design of Combinational Circuits 组合电路软容错设计的再合成技术
Soft Error Reliability of VLSI Circuits Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-51610-9_7
B. Ghavami, Mohsen Raji
{"title":"Resynthesize Technique for Soft Error-Tolerant Design of Combinational Circuits","authors":"B. Ghavami, Mohsen Raji","doi":"10.1007/978-3-030-51610-9_7","DOIUrl":"https://doi.org/10.1007/978-3-030-51610-9_7","url":null,"abstract":"","PeriodicalId":431123,"journal":{"name":"Soft Error Reliability of VLSI Circuits","volume":"185 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116783663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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