The International journal of microcircuits and electronic packaging最新文献

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Embedding a Passive Material Layer in Low Temperature Co‐Fired Packing 在低温共烧填料中嵌入钝化材料层
The International journal of microcircuits and electronic packaging Pub Date : 2012-04-03 DOI: 10.1002/9781118371107.CH28
E. Twiname, C. Randall, G. Messing
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引用次数: 2
Microstructural modeling and electronic interconnect reliability 微结构建模和电子互连可靠性
The International journal of microcircuits and electronic packaging Pub Date : 1997-12-01 DOI: 10.1108/09540919710777536
P. Winter, E. Wallach
{"title":"Microstructural modeling and electronic interconnect reliability","authors":"P. Winter, E. Wallach","doi":"10.1108/09540919710777536","DOIUrl":"https://doi.org/10.1108/09540919710777536","url":null,"abstract":"Initial development of microstructurally accurate finite element models of the soldered joints of electronic surface mount components is described. These models allow for the presence of lead and tin‐rich phases and copper‐tin intermetallic layers within the joints. The effect of these features on the strain distributions within the joints is shown. These strain distributions can be used to predict fatigue lives. This is demonstrated for homogeneous solder joints for which excellent correlation was shown between predicted lives and those measured experimentally by thermal cycling of actual components.","PeriodicalId":427713,"journal":{"name":"The International journal of microcircuits and electronic packaging","volume":"289 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123733389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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