{"title":"Reliability and Risk Analysis","authors":"E. Zio, P. Baraldi, F. Cadini","doi":"10.1142/9789814360685","DOIUrl":"https://doi.org/10.1142/9789814360685","url":null,"abstract":"","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133168670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Encyclopedia and Handbook of Process Capability Indices - A Comprehensive Exposition of Quality Control Measures","authors":"W. Pearn, S. Kotz","doi":"10.1142/6092","DOIUrl":"https://doi.org/10.1142/6092","url":null,"abstract":"The Cp Index The Ca Index The Cpk Index The Cpm Index The Loss Indices The Cpmk Index The Spk Index The Cpu/CPL Index Multi-Process Performance Analysis Chart (MPPAC) PCIs with Asymmetric Specification Limits Supplier Selection Based on PCIs Acceptance Sampling Plans Based on PCIs Process Capability Measures in the Presence of Gauge Measurement Error Process Capability Assessment with Tool Wear Process Capability Assessment for Non-Normal Processes Multivariate Process Capability Indices.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127568894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Alyson G. Wilson, N. Limnios, S. Keller-McNulty, Y. Armijo
{"title":"Modern Statistical and Mathematical Methods in Reliability","authors":"Alyson G. Wilson, N. Limnios, S. Keller-McNulty, Y. Armijo","doi":"10.1142/5844","DOIUrl":"https://doi.org/10.1142/5844","url":null,"abstract":"# Competing Risk Modeling in Reliability (T Bedford) # Game-Theoretic and Reliability Methods in Counter-Terrorism and Security (V Bier) # Regression Models for Reliability Given the Usage Accumulation History (T Duchesne) # Bayesian Methods for Assessing System Reliability: Models and Computation (T Graves & M Hamada) # Dynamic Modeling in Reliability and Survival Analysis (E A Pena & E Slate) # End of Life Analysis (H Wynn et al.) # and other papers","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134485839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Response Modeling Methodology - Empirical Modeling for Engineering and Science","authors":"H. Shore","doi":"10.1142/5708","DOIUrl":"https://doi.org/10.1142/5708","url":null,"abstract":"Models of Systematic Variation in Engineering and the Sciences General Approaches to Modeling Systematic Variation General Models of Random Variation Empirical Modeling Axiomatic Derivation of the RMM Model Estimation Procedures The Error Distribution Modeling Systematic Variation-Applications: Hardware Reliability Models, Software Reliability-growth Models,Chemical-Engineering Models, Modeling and Forecasting S-shaped Diffusion Processes Modeling Random Variation-Applications: Distributional Approximations, General Control Charts for Attributes and for Variables, Inventory Analysis.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121650069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi-State System Reliability - Assessment, Optimization and Applications","authors":"A. Lisnianski, G. Levitin","doi":"10.1142/5221","DOIUrl":"https://doi.org/10.1142/5221","url":null,"abstract":"Basic concepts of Multi-State Systems (MSS) Boolean methods extension for MSS reliability analysis basic random process methods for MSS reliability assessment Universal Generating Function (UGF) models MSS reliability optimization application problems.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131247607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Recent Advances in Reliability and Quality Engineering","authors":"H. Pham","doi":"10.1142/4346","DOIUrl":"https://doi.org/10.1142/4346","url":null,"abstract":"Control charts for data having a symmetrical distribution with a positive Kurtosis, P. Philippe a software reliability model with testing coverage and imperfect debugging, X. Zhang and H. Pham cost allocation for software reliability, O. Berman and M. Cutler general reliability test plans for one-shot devices, A. Zhang and W.-K. Shiue multivariate control chart, M.-W. Lu and R.J. Rudy optimal preparedness maintenance of multi-unit systems with imperfect maintenance and economic dependence, H. Wang et al estimation of system reliability by variationally processed Monte Carlo simulation, M. Chang et al a Bayesian approach to the optimal policy under imperfect preventive maintenance models, K.-S. Park and C.-H. Jun design of life tests based on multi-stage decision process, A. Kanagawa and H. Ohta reliability-centred maintenance for light rail equipment, K.H.K. Leung et al incorporating environmental concepts with tolerance design optimization model, G. Chen Markovian reliability modelling for software safety/availability measurement, K. Tokuno and S. Yamada group control charts with variable stream and sample sizes, K.T. Lee et al a methodology for the measurement of test effectiveness, J.C. Munson and A.P. Nikora modelling software quality with classification trees, T.M. Khoshgoftaar and E.B. Allen highly reliable systems - designing software for improved assessment, B. Cukic and F. Bastani manufacturing systems estimation using neural network models, P.L. Cooper and G.J. Savage a deterministic selective maintenance model for complex systems, C.R. Cassidy et al.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114722332","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Contributions to Hardware and Software Reliability","authors":"P. K. Kapur, R. Garg, S. Kumar","doi":"10.1142/4011","DOIUrl":"https://doi.org/10.1142/4011","url":null,"abstract":"Preliminary concepts and background replacement policies with minimal repairs problems with applications to computing systems software reliability growth models based on NHPP release policies numerical computations in renewal and reliability theory.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121170048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Life-Time Data - Statistical Models and Methods","authors":"J. Deshpande, S. G. Purohit","doi":"10.1142/5988","DOIUrl":"https://doi.org/10.1142/5988","url":null,"abstract":"","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122006712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Software Reliability Modelling","authors":"M. Xie","doi":"10.1142/1390","DOIUrl":"https://doi.org/10.1142/1390","url":null,"abstract":"Introduction to software reliability elements of software reliability modelling Markov models nonhomogeneous poisson process (NHPP) models some static models Bayesian analysis and modelling some statistical data analysis techniques determination of optimum release time recent advances in software reliability.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122949398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability Modeling, Analysis and Optimization","authors":"H. Pham","doi":"10.1142/5870","DOIUrl":"https://doi.org/10.1142/5870","url":null,"abstract":"Reliability Modeling: Optimal Checkpointing Interval for Task Duplication with Spare Processing (S Nakagawa et al.) Optimal Interval of CRL Issue in PKI Architecture (M Arafuka et al.) Applying Accelerated Life Models to HALT Testing (F Guerin et al.) Software Quality Engineering: Measurement of Object-Oriented Software Understandability Using Spatial Complexity (J K Chhabra et al.) An Approach to Quantifying Process Cost and Quality (G Twaites & C Hoffman) Software Process Improvement Activities Based on CMM (T Fujiwara & S Yamada) Software Reliability Modeling: A Two-Level Continuous Sampling Plan for Software Systems (S Hwang & H Pham) An Extended Delayed S-Shaped Software Reliability Growth Model Based on Infinite Server Queueing Theory (S Inoue & S Yamada) Disappointment Probability Based on the Number of Debuggings for Operational Software Availability Measurement (Y Saitoh et al.) Maintenance and Inspection Policies: Optimal Random and Periodic Inspection Policies (T Sugiura et al.) Screening Scheme for High Performance Products (W-T Cheong & L-C Tang) Age-Dependent Failure Interaction (Q Zhao et al.) and other papers.","PeriodicalId":399208,"journal":{"name":"Series on Quality, Reliability and Engineering Statistics","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130860074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}