Modeling Aspects in Optical Metrology VIII最新文献

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Modeling Aspects in Optical Metrology VIII Pub Date : 2021-06-30 DOI: 10.1117/12.2603205

引用次数: 0

Recent advances in Bayesian optimization with applications to parameter reconstruction in optical nano-metrology 贝叶斯优化及其在光学纳米计量参数重构中的应用进展

Modeling Aspects in Optical Metrology VIII Pub Date : 2021-06-20 DOI: 10.1117/12.2592266

Matthias Plock, S. Burger, Philipp‐Immanuel Schneider

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引用次数: 2