Surface Analysis of Paper最新文献

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FT-IR Spectroscopy 傅立叶变换红外光谱
Surface Analysis of Paper Pub Date : 2020-04-15 DOI: 10.1201/9780429279997-6
M. A. Friese, Sujit Banerjee, P. Mangin
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引用次数: 0
Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy 用共聚焦显微镜对纸张表面进行三维评价
Surface Analysis of Paper Pub Date : 2020-04-15 DOI: 10.1201/9780429279997-1
M. Béland, P. Mangin
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引用次数: 0
Raman Spectroscopy 拉曼光谱
Surface Analysis of Paper Pub Date : 2020-04-15 DOI: 10.1201/9780429279997-8
U. Agarwal, R. Atalla
{"title":"Raman Spectroscopy","authors":"U. Agarwal, R. Atalla","doi":"10.1201/9780429279997-8","DOIUrl":"https://doi.org/10.1201/9780429279997-8","url":null,"abstract":"","PeriodicalId":382839,"journal":{"name":"Surface Analysis of Paper","volume":"226 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133322083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy 用共聚焦显微镜对纸张表面进行三维评价
Surface Analysis of Paper Pub Date : 2020-04-15 DOI: 10.1201/9780429279997-14
S. J. Hanley, D. Gray
{"title":"Three-Dimensional Evaluation of Paper Surfaces Using Confocal Microscopy","authors":"S. J. Hanley, D. Gray","doi":"10.1201/9780429279997-14","DOIUrl":"https://doi.org/10.1201/9780429279997-14","url":null,"abstract":"","PeriodicalId":382839,"journal":{"name":"Surface Analysis of Paper","volume":"383 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126282458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
X-Ray Photoelectron Spectroscopy (XPS) x射线光电子能谱(XPS)
Surface Analysis of Paper Pub Date : 2020-04-15 DOI: 10.1201/9780429279997-11
William K. Istone
{"title":"X-Ray Photoelectron Spectroscopy (XPS)","authors":"William K. Istone","doi":"10.1201/9780429279997-11","DOIUrl":"https://doi.org/10.1201/9780429279997-11","url":null,"abstract":"As seen in figure 1, photoejection of a core electron (instead of radiationless secondary electron emission in AES, fig. 3) occurs in XPS. The kinetic energy of the photoejected core electrons is defined as KE = hv BE + phi, where hv is the energy of the incoming x-ray photons, BE is the binding energy of the photoejected electrons, and phi is the spectrometer work function. The binding energy (BE) of the core electrons allows for specific elemental characterization of samples as the electronic structure of each element is unique. Auger electron emission occurs readily in XPS as they are mutually exclusive processes, meaning that the individual probabilities of each process occurring must sum to one.","PeriodicalId":382839,"journal":{"name":"Surface Analysis of Paper","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130769814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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