{"title":"SAVS","authors":"H. Li, Yiran Chen, Kaushik Roy, Cheng-Kok Koh","doi":"10.1145/1118299.1118347","DOIUrl":"https://doi.org/10.1145/1118299.1118347","url":null,"abstract":"Technology scaling and sub-wavelength optical lithography is associated with significant process variations. We propose a self-adaptive variable supply-voltage scaling (SAVS) technique for multi-issue out-of-order pipeline to improve parametric yield with minimal power dissipation. Our error-correction circuitry and recovery mechanism allow the proposed fault-tolerant pipeline to work at a dynamically tuned supply voltage with a very low error rate. Experiments on an 8-issue, out-of-order superscalar processor show that SAVS can achieve 93.3% yield with 8.66% total power reduction under a scaled Vdd, compared to the same yield achieved by conventional microarchitecture. The increased execution time is negligible (0.014%).","PeriodicalId":348870,"journal":{"name":"Proceedings of the 2006 conference on Asia South Pacific design automation - ASP-DAC '06","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121900013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}