{"title":"Rapid metrology of precision-machined parts via robotic automation","authors":"Kramer Lindell","doi":"10.1117/12.2597361","DOIUrl":"https://doi.org/10.1117/12.2597361","url":null,"abstract":"Precision-machined parts in aviation, automotive, and manufacturing industries have tightly controlled tolerances for the dozens of small geometries spread throughout a single part. These parts can also have stringent specifications for any defects along the surface. The sheer number of measurements needed on each part paired with the volume of parts demands the ability to take not only one measurement quickly, but dozens in a rapid process. Coupling a polarized structured light technique with robotic automation allows for accurate measurements at volume. This paper will discuss automated optical measurements of stationary parts, parts moving on a production line, and rotationally symmetric parts on a rotary stage. The paper will also look at ongoing projects combining the automated polarized structured light method with bright field techniques to accomplish automatic defect identification and inspection.","PeriodicalId":340734,"journal":{"name":"Applied Optical Metrology IV","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130504697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Range selectable frequency-space low-coherence Interferometer: comparison of the theory and measured performance","authors":"W. Walecki","doi":"10.1117/12.2593999","DOIUrl":"https://doi.org/10.1117/12.2593999","url":null,"abstract":"","PeriodicalId":340734,"journal":{"name":"Applied Optical Metrology IV","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114649515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Metrological aspects of holographic microscopy and tomography","authors":"M. Kujawińska","doi":"10.1117/12.2596326","DOIUrl":"https://doi.org/10.1117/12.2596326","url":null,"abstract":"The 50th anniversary of Dennis Gabor’s Nobel prize (1971) and the upcoming 60th anniversary of the work of both Yuri N. Denisyuk (1962) and Emmett N. Leith, Juris Upatnieks (1962) are excellent reasons to look back at the inventions and the great pioneers of holography. In the talk at first I present my personal look at the timeline of optical and digital holography with focus on 2D and 3D holographic microscopy. Next I will address several metrological problems connected with 2D and 3D quantitative phase imaging based on data gathered by means of digital holography microscopy, holographic tomography and combined holographic tomography and optical coherence tomography .","PeriodicalId":340734,"journal":{"name":"Applied Optical Metrology IV","volume":"29 11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125694014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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