Proposed for presentation at the American Physical Society March Meeting held March 15-19, 2021.最新文献

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Characterizing mid-circuit measurements with a new form of gate set tomography Part 2: Experiment. 用一种新形式的门集层析成像表征中路测量。第2部分:实验。
G. Ribeill, M. Ware, L. Govia, K. Rudinger, T. Proctor, T. Ohki
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引用次数: 0
Broadband Non-resonant Platform for Electric field Enhancement. 宽带非谐振电场增强平台。
G. Subramania, S. Foteinopoulou
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引用次数: 0
Characterizing mid-circuit measurements with a new form of gate set tomography Part 1: Theory. 用一种新形式的门集层析成像表征中路测量。第1部分:理论。
K. Rudinger, T. Proctor, E. Nielsen, G. Ribeill, M. Ware, L. Govia, T. Ohki
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引用次数: 1
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