{"title":"Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated Within Metallic Cavities","authors":"S. Khemiri, A. Ramanujan, M. Kadi, Z. Riah","doi":"10.1016/B978-1-78548-013-3.50003-6","DOIUrl":"https://doi.org/10.1016/B978-1-78548-013-3.50003-6","url":null,"abstract":"","PeriodicalId":263051,"journal":{"name":"Embedded Mechatronic Systems","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126909120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi-objective Optimization in Fluid–Structure Interaction","authors":"R. Maani, A. Hami, B. Radi","doi":"10.1016/b978-1-78548-189-5.50009-4","DOIUrl":"https://doi.org/10.1016/b978-1-78548-189-5.50009-4","url":null,"abstract":"","PeriodicalId":263051,"journal":{"name":"Embedded Mechatronic Systems","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129576441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress","authors":"S. Khemiri, M. Kadi","doi":"10.1016/B978-1-78548-013-3.50006-1","DOIUrl":"https://doi.org/10.1016/B978-1-78548-013-3.50006-1","url":null,"abstract":"","PeriodicalId":263051,"journal":{"name":"Embedded Mechatronic Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129126381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
E. Joubert, O. Latry, P. Dherbécourt, M. Fontaine, C. Gautier, H. Polaert, P. Eudeline
{"title":"Internal Temperature Measurement of Electronic Components","authors":"E. Joubert, O. Latry, P. Dherbécourt, M. Fontaine, C. Gautier, H. Polaert, P. Eudeline","doi":"10.1016/B978-1-78548-013-3.50007-3","DOIUrl":"https://doi.org/10.1016/B978-1-78548-013-3.50007-3","url":null,"abstract":"","PeriodicalId":263051,"journal":{"name":"Embedded Mechatronic Systems","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130405311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}