Atomic-force Microscopy and Its Applications最新文献

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Characterization of Single Polymer Molecules 单体高分子分子的表征
Atomic-force Microscopy and Its Applications Pub Date : 2018-11-05 DOI: 10.5772/INTECHOPEN.77999
M. Radiom
{"title":"Characterization of Single Polymer Molecules","authors":"M. Radiom","doi":"10.5772/INTECHOPEN.77999","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.77999","url":null,"abstract":"This chapter offers an overview of the use of atomic force microscopy (AFM) in polymer studies. Soft AFM cantilevers with sharp tips are useful for their relatively high spatial resolution, a few nm, and force resolution, a few tens of pN. AFM imaging is used to characterize conformational properties of single polymer chains at solid-liquid interfaces. AFM force microscopy gives molecular elasticity as well as interaction forces of single polymer chains with solids. Recent technical developments have made possible the characterization of time-resolved mechanical properties of single polymer chains, including the relaxation time and internal friction. AFM force microscopy with biomolecules, supramolecules, and mechanophores reveals the forces required for, and the kinetics of, conformational transitions and chemical reactions in these molecules at the single-chain and single bond levels.","PeriodicalId":259217,"journal":{"name":"Atomic-force Microscopy and Its Applications","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133836084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains 原子力显微镜在血迹年龄鉴定上的法医潜力
Atomic-force Microscopy and Its Applications Pub Date : 2018-11-05 DOI: 10.5772/INTECHOPEN.77204
T. Smijs, F. Galli
{"title":"Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains","authors":"T. Smijs, F. Galli","doi":"10.5772/INTECHOPEN.77204","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.77204","url":null,"abstract":"An important aspect of any crime scene investigation is to detect, secure and analyze trace evidence. In forensic examinations where topographic characterization is important like in fingermark, textile and document forgery examinations, the atomic force microscopy (AFM) imaging technique can be of value. However, it is the force spectroscopy that could make AFM a versatile tool in crime investigations. Particularly, the ability to measure changes in mechanical properties of forensic trace material over time makes this technology in potential interesting for forensic examinations. The usefulness of force measure- ments to evaluate the elasticity of red blood cells (RBCs) in relation to the age of a bloodstain is an interesting example. With minimally invasive AFM technology, time- dependent alterations in the viscoelasticity of RBCs that occur during the aging of bloodstains can be featured. A discrimination between traces left by the perpetrator and other persons that have been present at the crime scene will thus be enabled. A recently obtained proof-of-concept demonstrating the usefulness of AFM for age estimation of bloodstains will be described. Additionally, the usefulness of AFM imaging and force spectroscopy for human hair, document forgery, textile fiber, fingermark and gunshot and explosive residue examinations will be discussed.","PeriodicalId":259217,"journal":{"name":"Atomic-force Microscopy and Its Applications","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121751129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Characterization of Multiblock (Segmented) Copolyurethane- Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods 利用原子力显微镜、纳米摩擦学和纳米压痕方法表征多块(分段)共聚聚氨酯-亚胺及其纳米复合材料
Atomic-force Microscopy and Its Applications Pub Date : 2018-11-05 DOI: 10.5772/INTECHOPEN.78625
Tatiana Evgenievna Sukhanova, Tatyana A. Kuznetsova, Vasilina A. Lapitskaya, Tatiana I. Zubar, Sergei A. Chizhik, Milana E. Vylegzhanina, Aleksandr A. Kutin, Andrey L. Didenko, Valentin M. Svetlichnyi
{"title":"Characterization of Multiblock (Segmented) Copolyurethane- Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods","authors":"Tatiana Evgenievna Sukhanova, Tatyana A. Kuznetsova, Vasilina A. Lapitskaya, Tatiana I. Zubar, Sergei A. Chizhik, Milana E. Vylegzhanina, Aleksandr A. Kutin, Andrey L. Didenko, Valentin M. Svetlichnyi","doi":"10.5772/INTECHOPEN.78625","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.78625","url":null,"abstract":"This chapter reviews our results on the morphology, tribological, and local mechanical property investigations of new copoly(urethane-imide)s (coPUIs) and nanocomposites based thereof using atomic force microscopy (AFM) and nanoindentation (NI) methods. AFM in the contact mode of lateral forces revealed the presence of different contrast phases on the surface of synthesized films which depends on the chemical structure of monomers used. Single-walled carbon nanotubes (SWCNTs), carbon nanofibers, graphene, tungsten disulfide and tungsten diselenide were introduced into coPUI matrices. Dependencies of microhardness and modulus of elasticity on the depth of indentation have been obtained. It was found that for each synthesized coPUI, there is only one type of carbon nanomateri- als that exerts the greatest influence on their characteristics. The improvement of mechani cal properties is found to mainly depend on the nature of the polymer matrix and filler. Our results showed that effective methods for improving of tribological characteristics can be either modification by SWCNTs (up to 1 wt.%) or heating at 30°C. Synthesized coPUI films and nanocomposites are very promising materials and can be used as thermoplastic elastomers for tribological applications, and their physical-mechanical properties can be controlled both by temperature and by mechanical action. more than twice. Conversely, the initial coPUI (R-AltTDI-R)SOD has a sufficiently low C fr , and the introduction of nanoparticles WS 2 and WSe 2 leads to its almost doubling. The efficiency of multi-pass scanning tests is shown for investigating the tribological prop erties of modified copolymer systems. It is found that coPUI (R-AltTDI-R)SOD and nano composites based thereof with SWCNT have the best tribological properties, while SWCNTs are uniformly distributed in the material and cause homogeneous structuring at the nano-level. As a result of studying the tribological properties of coPUI film surface using AFM method with multi-pass scanning, it has been found that effective methods for improving these properties can be either modification by SWCNTs (up to 1 wt.%) or heating to 30°C. Our results show that synthesized coPUI films and nanocomposites based thereof are very promising materials for tribological applications and their physical-mechanical properties can be controlled both by temperature and by mechanical action.","PeriodicalId":259217,"journal":{"name":"Atomic-force Microscopy and Its Applications","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114410631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes 垂直排列碳纳米管表征的扫描探针技术
Atomic-force Microscopy and Its Applications Pub Date : 2018-11-05 DOI: 10.5772/INTECHOPEN.78061
Marina V. Il’ina, Oleg I. Il’in, Vladimir A. Smirnov, Yuriy F. Blinov, Boris G. Konoplev, Oleg A. Ageev
{"title":"Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes","authors":"Marina V. Il’ina, Oleg I. Il’in, Vladimir A. Smirnov, Yuriy F. Blinov, Boris G. Konoplev, Oleg A. Ageev","doi":"10.5772/INTECHOPEN.78061","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.78061","url":null,"abstract":"This chapter presents the results of experimental studies of the electrical, mechanical and geometric parameters of vertically aligned carbon nanotubes (VA CNTs) using scanning probe microscopy (SPM). This chapter also presents the features and difficul - ties of characterization of VA CNTs in different scanning modes of the SPM. Advanced techniques for VA CNT characterization (the height, Young’s modulus, resistivity, adhesion and piezoelectric response) taking into account the features of the SPM modes are described. The proposed techniques allow to overcome the difficulties associated with the vertical orientation and high aspect ratio of nanotubes in determining the electrical and mechanical parameters of the VA CNTs by standard meth- ods. The results can be used in the development of diagnostic methods as well as in nanoelectronics and nanosystem devices based on vertically aligned carbon nanotubes (memory elements, adhesive structures, nanoelectromechanical switches, emission structures, etc.).","PeriodicalId":259217,"journal":{"name":"Atomic-force Microscopy and Its Applications","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116757024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups 导论章:为什么原子力显微镜(AFM)是所有工程材料群表面形貌研究的主要方法之一
Atomic-force Microscopy and Its Applications Pub Date : 2018-11-05 DOI: 10.5772/INTECHOPEN.80446
T. Tański, B. Ziebowicz, P. Jarka, MarcinStaszuk
{"title":"Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups","authors":"T. Tański, B. Ziebowicz, P. Jarka, MarcinStaszuk","doi":"10.5772/INTECHOPEN.80446","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.80446","url":null,"abstract":"© 2016 The Author(s). Licensee InTech. This chapter is distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. I tr ct r t r: t ic F rc icr sc ( F ) is ne of the Leading ethods of Surface orphology Research of all Engineering aterial Groups","PeriodicalId":259217,"journal":{"name":"Atomic-force Microscopy and Its Applications","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124737284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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