X-Ray Diffraction Imaging最新文献

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Coded Aperture X-Ray Diffraction Tomography 编码孔径x射线衍射层析成像
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-1
J. Greenberg
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引用次数: 3
Semiconductor Sensors for XRD Imaging 用于XRD成像的半导体传感器
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-2
K. Iniewski, A. Grosser
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引用次数: 1
Integrated Circuits for XRD Imaging 用于XRD成像的集成电路
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-3
K. Iniewski, C. Siu
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引用次数: 0
X-Ray Diffraction and Focal Construct Technology x射线衍射与焦点构造技术
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-6
K. Rogers, Paul G. Evans
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引用次数: 1
Applications of X-Ray Diffraction Imaging in Medicine x射线衍射成像在医学中的应用
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-4
M. Lakshmanan
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引用次数: 0
Materials Science of X-Ray Diffraction x射线衍射材料科学
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-5
S. Wolter
{"title":"Materials Science of X-Ray Diffraction","authors":"S. Wolter","doi":"10.1201/9780429196492-5","DOIUrl":"https://doi.org/10.1201/9780429196492-5","url":null,"abstract":"","PeriodicalId":23769,"journal":{"name":"X-Ray Diffraction Imaging","volume":"23 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80055727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
X-Ray Diffraction Tomography: Methods and Systems x射线衍射断层扫描:方法和系统
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-7
Shuo Pang, Zheyuan Zhu
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引用次数: 0
Energy-Resolving Detectors for XDi Airport Security Systems 用于XDi机场安全系统的能量分辨探测器
X-Ray Diffraction Imaging Pub Date : 2018-11-02 DOI: 10.1201/9780429196492-8
D. Kosciesza
{"title":"Energy-Resolving Detectors for XDi Airport Security Systems","authors":"D. Kosciesza","doi":"10.1201/9780429196492-8","DOIUrl":"https://doi.org/10.1201/9780429196492-8","url":null,"abstract":"","PeriodicalId":23769,"journal":{"name":"X-Ray Diffraction Imaging","volume":"60 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88759241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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