{"title":"Gate Drivers Based on High-Voltage Charge Storing (HVCS)","authors":"A. Seidel, B. Wicht","doi":"10.1007/978-3-030-68940-7_3","DOIUrl":"https://doi.org/10.1007/978-3-030-68940-7_3","url":null,"abstract":"","PeriodicalId":224535,"journal":{"name":"Highly Integrated Gate Drivers for Si and GaN Power Transistors","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114415965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Conclusion","authors":"A. Seidel, Bernhard Wicht","doi":"10.1007/978-3-030-68940-7_7","DOIUrl":"https://doi.org/10.1007/978-3-030-68940-7_7","url":null,"abstract":"","PeriodicalId":224535,"journal":{"name":"Highly Integrated Gate Drivers for Si and GaN Power Transistors","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115504376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Gate Drivers Based on High-Voltage Energy Storing (HVES)","authors":"A. Seidel, B. Wicht","doi":"10.1007/978-3-030-68940-7_4","DOIUrl":"https://doi.org/10.1007/978-3-030-68940-7_4","url":null,"abstract":"","PeriodicalId":224535,"journal":{"name":"Highly Integrated Gate Drivers for Si and GaN Power Transistors","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125247520","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fundamentals","authors":"A. Seidel, Bernhard Wicht","doi":"10.1002/9781119540328.part1","DOIUrl":"https://doi.org/10.1002/9781119540328.part1","url":null,"abstract":"","PeriodicalId":224535,"journal":{"name":"Highly Integrated Gate Drivers for Si and GaN Power Transistors","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117202938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}