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Photonic Instrumentation Engineering VI最新文献

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Front Matter: Volume 10925 封面:卷10925
Photonic Instrumentation Engineering VI Pub Date : 2019-05-22 DOI: 10.1117/12.2531363
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引用次数: 0
Stress metrology for flexible and flat-panel display manufacturing (Conference Presentation) 柔性和平板显示器制造的应力测量(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2511183
Wei-Chun Hung, R. Morency, W. Walecki
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引用次数: 0
Physical-optics simulation of optical interferometry systems (Conference Presentation) 光学干涉测量系统的物理光学模拟(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2509559
Site Zhang, Rui Shi, C. Hellmann, F. Wyrowski
{"title":"Physical-optics simulation of optical interferometry systems (Conference Presentation)","authors":"Site Zhang, Rui Shi, C. Hellmann, F. Wyrowski","doi":"10.1117/12.2509559","DOIUrl":"https://doi.org/10.1117/12.2509559","url":null,"abstract":"Modern interferometer-based optical-metrology technologies play an important role in many applications, and often consist of multi-disciplinary components. This reveals new ways of improving the performance or enriching the functionality of the system, while at the same time causing certain difficulties in system analysis and assembly. To overcome this, we present a physical-optics-based simulation approach. It starts from an electromagnetic representation of sources, which enables the modeling of coherence and polarization. We demonstrate how to integrate new components (from microscopy objectives to diffractive, micro- and nanostructures) in selected classical interferometric setups, and gauge whether the resulting system fulfills the desired functionality.","PeriodicalId":219169,"journal":{"name":"Photonic Instrumentation Engineering VI","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116802877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-contact characterization of compound optical lenses using confocal microscopy and low-coherence interferometry (Conference Presentation) 使用共聚焦显微镜和低相干干涉法的复合光学透镜的非接触表征(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2510811
Mohamed T. El-Haddad, Yuankai K. Tao
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引用次数: 0
Characterization of fiber optics with femtosecond-infrared fiber Bragg gratings for extreme applications (Conference Presentation) 飞秒红外光纤Bragg光栅在极端应用中的表征(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2507001
D. Murphy, P. Riley, Thomas Rugari, G. Pickrell, B. Risch, S. Rountree, Matthew Davis
{"title":"Characterization of fiber optics with femtosecond-infrared fiber Bragg gratings for extreme applications (Conference Presentation)","authors":"D. Murphy, P. Riley, Thomas Rugari, G. Pickrell, B. Risch, S. Rountree, Matthew Davis","doi":"10.1117/12.2507001","DOIUrl":"https://doi.org/10.1117/12.2507001","url":null,"abstract":"In the nuclear industry, there is a need for sensors that are resistant to both high temperatures and radiation. Fiber Bragg gratings inscribed into radiation resistant fibers are a potential solution to this as the femtosecond-infrared laser can inscribe Bragg gratings into fibers without a photosensitive core. In order for these gratings to be used for sensing, they need to be characterized to determine their temperature and radiation response and sensitivity. This paper characterized three commercially available fibers for use in high heat and high radiation environments. There are six fiber variants examined in this study. Three basic fiber designs are investigated: a germanium doped core, a germanium doped core with fluorine cladding, and a fluorine doped core and cladding. For each fiber design, normal and pre-irradiated versions are investigated. The fibers were tested for thermal response by heating them to 1000C and holding for 24 hours, and for radiation resistance by irradiating with gamma radiation. The germanium core doped fibers were more resistant to thermal effects but still had a wavelength shift during the 24-hour soak. The fluorine-doped fibers either had the gratings partially or completely erased during the thermal hold at 1000°C, but showed suitability for short term excursions to this temperature. The radiation data showed significant shifts in some cases, but there was not enough data to form a definitive conclusion. It appears that radiation introduces variability in the response of the Fiber Bragg Gratings (FBG).","PeriodicalId":219169,"journal":{"name":"Photonic Instrumentation Engineering VI","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116322965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Precision metrology through wavelength-demultiplexed laser interferometry (Conference Presentation) 波长解复用激光干涉测量技术的精密计量(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2511031
Z. Zaidi, V. Fathipour, C. Chang-Hasnain
{"title":"Precision metrology through wavelength-demultiplexed laser interferometry (Conference Presentation)","authors":"Z. Zaidi, V. Fathipour, C. Chang-Hasnain","doi":"10.1117/12.2511031","DOIUrl":"https://doi.org/10.1117/12.2511031","url":null,"abstract":"","PeriodicalId":219169,"journal":{"name":"Photonic Instrumentation Engineering VI","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121085365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantitative phase imaging for surface roughness measurements to demonstrate variation of quality factor in crystalline whispering-gallery mode resonators (Conference Presentation) 用于表面粗糙度测量的定量相位成像以证明晶体低语廊模式谐振器中质量因子的变化(会议报告)
Photonic Instrumentation Engineering VI Pub Date : 2019-03-04 DOI: 10.1117/12.2509408
M. Jacquot, G. Lin, A. Coillet, S. Diallo, L. Larger, Y. Chembo
{"title":"Quantitative phase imaging for surface roughness measurements to demonstrate variation of quality factor in crystalline whispering-gallery mode resonators (Conference Presentation)","authors":"M. Jacquot, G. Lin, A. Coillet, S. Diallo, L. Larger, Y. Chembo","doi":"10.1117/12.2509408","DOIUrl":"https://doi.org/10.1117/12.2509408","url":null,"abstract":"","PeriodicalId":219169,"journal":{"name":"Photonic Instrumentation Engineering VI","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116076789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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