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Advanced Laser Diode Reliability最新文献

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Laser Diode DC Measurement Protocols 激光二极管直流测量协议
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50005-7
M. Vanzi, G. Mura, L. Béchou, G. Marcello, V. S. Valle
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引用次数: 1
The Rules of the Rue Morgue 莫尔格街的规矩
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50010-0
M. Vanzi
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引用次数: 0
Copyright 版权
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50007-0
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引用次数: 0
Introduction to Appendix 附录简介
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50009-4
M. Vanzi
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引用次数: 0
Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 用于高速光通信的激光二极管的可靠性——一种基于蒙特卡罗的方法来预测工作条件下的寿命分布和故障率
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50003-3
L. Mendizabal, F. Verdier, Y. Deshayes, Y. Ousten, Y. Danto, L. Béchou
{"title":"Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions","authors":"L. Mendizabal, F. Verdier, Y. Deshayes, Y. Ousten, Y. Danto, L. Béchou","doi":"10.1016/b978-1-78548-154-3.50003-3","DOIUrl":"https://doi.org/10.1016/b978-1-78548-154-3.50003-3","url":null,"abstract":"","PeriodicalId":215499,"journal":{"name":"Advanced Laser Diode Reliability","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129995477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Index 指数
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50012-4
{"title":"Index","authors":"","doi":"10.1016/b978-1-78548-154-3.50012-4","DOIUrl":"https://doi.org/10.1016/b978-1-78548-154-3.50012-4","url":null,"abstract":"","PeriodicalId":215499,"journal":{"name":"Advanced Laser Diode Reliability","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121505958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laser Diode Characteristics 激光二极管特性
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50004-5
M. Vanzi
{"title":"Laser Diode Characteristics","authors":"M. Vanzi","doi":"10.1016/b978-1-78548-154-3.50004-5","DOIUrl":"https://doi.org/10.1016/b978-1-78548-154-3.50004-5","url":null,"abstract":"","PeriodicalId":215499,"journal":{"name":"Advanced Laser Diode Reliability","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116443941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Laser Diode Reliability 激光二极管可靠性
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50001-x
M. Fukuda, G. Mura
{"title":"Laser Diode Reliability","authors":"M. Fukuda, G. Mura","doi":"10.1016/b978-1-78548-154-3.50001-x","DOIUrl":"https://doi.org/10.1016/b978-1-78548-154-3.50001-x","url":null,"abstract":"","PeriodicalId":215499,"journal":{"name":"Advanced Laser Diode Reliability","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131116681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-Component Model for Semiconductor Laser Degradation 半导体激光退化的多组分模型
Advanced Laser Diode Reliability Pub Date : 1900-01-01 DOI: 10.1016/b978-1-78548-154-3.50002-1
S. K. Lam, D. Cassidy
{"title":"Multi-Component Model for Semiconductor Laser Degradation","authors":"S. K. Lam, D. Cassidy","doi":"10.1016/b978-1-78548-154-3.50002-1","DOIUrl":"https://doi.org/10.1016/b978-1-78548-154-3.50002-1","url":null,"abstract":"","PeriodicalId":215499,"journal":{"name":"Advanced Laser Diode Reliability","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116816768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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