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Design for Testability, Debug and Reliability最新文献

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Conclusion and Outlook 结论与展望
Design for Testability, Debug and Reliability Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-69209-4_9
S. Huhn, R. Drechsler
{"title":"Conclusion and Outlook","authors":"S. Huhn, R. Drechsler","doi":"10.1007/978-3-030-69209-4_9","DOIUrl":"https://doi.org/10.1007/978-3-030-69209-4_9","url":null,"abstract":"","PeriodicalId":213333,"journal":{"name":"Design for Testability, Debug and Reliability","volume":"2000 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123549390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated Circuits 集成电路
Design for Testability, Debug and Reliability Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-69209-4_2
S. Huhn, R. Drechsler
{"title":"Integrated Circuits","authors":"S. Huhn, R. Drechsler","doi":"10.1007/978-3-030-69209-4_2","DOIUrl":"https://doi.org/10.1007/978-3-030-69209-4_2","url":null,"abstract":"","PeriodicalId":213333,"journal":{"name":"Design for Testability, Debug and Reliability","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116691862","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Formal Techniques 正式的技术
Design for Testability, Debug and Reliability Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-69209-4_3
S. Huhn, R. Drechsler
{"title":"Formal Techniques","authors":"S. Huhn, R. Drechsler","doi":"10.1007/978-3-030-69209-4_3","DOIUrl":"https://doi.org/10.1007/978-3-030-69209-4_3","url":null,"abstract":"","PeriodicalId":213333,"journal":{"name":"Design for Testability, Debug and Reliability","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122081271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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