2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)最新文献

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Contact Burn Injuries: Experimental Assessments of Short Duration Contact Exposures 接触性烧伤:短时间接触暴露的实验评估
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861363
F. Colella, Michael Barry, James Vickery
{"title":"Contact Burn Injuries: Experimental Assessments of Short Duration Contact Exposures","authors":"F. Colella, Michael Barry, James Vickery","doi":"10.1109/ISPCE51668.2021.9861363","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861363","url":null,"abstract":"The quantification of contact burn injury risk is an important part of many product development cycles and hazard assessments for industrial processes. Two well-known standards relied upon for performing these assessments are primarily based on experiments conducted in the 1940s. Partially due to the manner in which these experiments were conducted, the standards implicitly make the assumption that the objects have a semi-infinite reservoir of energy. In this paper, a series of experiments were conducted by taking thermesthesiometer measurements of different materials, having different thicknesses, at different temperatures. In general, the risk of a burn injury occurring shows little dependence on the thickness of the material. In this way, for short term exposures, a surface temperature measurement of the object is likely sufficient to assess the risk of a burn injury occurring. Measurements did confirm, however, that for longer exposures with thinner materials, the severity of the heat exposure decreases, likely due to the energy dissipating from the limited thermal mass of the object.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124529082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Touch Current from DC Products; exploring the landscape 直流产品的接触电流;探索风景
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861358
Joseph McGuire, P. E. Perkins
{"title":"Touch Current from DC Products; exploring the landscape","authors":"Joseph McGuire, P. E. Perkins","doi":"10.1109/ISPCE51668.2021.9861358","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861358","url":null,"abstract":"An examination of touch voltage and current for DC powered ITE & AV products with consideration to the requirements established in harmonized international standard IEC 62368-1. Measurement of several pieces of DC powered ITE found that at least some DC powered products do not generate monopolar/DC waveforms. Assumptions based on electrical ratings alone or improper measurement of open circuit voltage could lead to misclassification of energy sources under IEC 62368-1. Additionally, misclassifying the nature of the touch current due to these non-monopolar/DC waveforms could result in application of the wrong limits established in IEC 62368-1. Additional clarification in IEC 62368-1 and/or IEC 60990 for DC products has the potential to improve consistency for these measurements.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":" 27","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113948130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Leveraging the EU CE Mark for independent 3rd party end-product certifications - Facts and Myths 利用欧盟CE标志进行独立的第三方最终产品认证-事实和神话
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ispce51668.2021.9861365
James L. Bender, Brunno P. Covolan
{"title":"Leveraging the EU CE Mark for independent 3rd party end-product certifications - Facts and Myths","authors":"James L. Bender, Brunno P. Covolan","doi":"10.1109/ispce51668.2021.9861365","DOIUrl":"https://doi.org/10.1109/ispce51668.2021.9861365","url":null,"abstract":"Many companies erroneously conflate the familiar European CE mark to be equivalent to North American safety certification recognized component approvals. For purposes of this publication, “North America” only includes the United States and Canada. Although a CE marked component or subassembly cannot solely be used to support such recognized component certifications, it can offer value to both product developers and independent certification laboratories to optimize component selection. A common situation occurs when a product developer desires end-product Listing certification based on a critical component/subassembly level CE mark for North American compliance. Even if the CE mark is provided against a harmonized standard, this may not be acceptable to 3rd party safety certification laboratories in absence of a more formal recognized component evaluation. This paper will provide an overview of the importance of CE mark product safety compliance claim and benefits of supplemental certification approvals.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123270894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Intelligent and Non-Static Power Sources, a Rational Clarification 智能和非静态电源的评估,一个理性的澄清
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861361
Jim Wiese, P. E. Perkins
{"title":"Evaluation of Intelligent and Non-Static Power Sources, a Rational Clarification","authors":"Jim Wiese, P. E. Perkins","doi":"10.1109/ISPCE51668.2021.9861361","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861361","url":null,"abstract":"Product standards, such as IEC 62368-1 for ITC equipment struggle to keep up with technology changes, even when they are designed to be adaptable - such as this Hazard Based standard. Unexpected consequences can develop with the introduction of disruptive technology that takes advantage of a seeming loophole in a standard and move forward without getting a full evaluation under the standard. Fault managed power systems, such as PoE, push the standard in getting proper evaluation. This paper is a case study including a detailed proposal as to how to address an issue such as this within the standard.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127707489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Contact Burn Injuries: Analytical Assessments of Thermal Damage in a Perfused Tissue 接触烧伤:灌注组织热损伤的分析评估
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861368
F. Colella, M. Yen
{"title":"Contact Burn Injuries: Analytical Assessments of Thermal Damage in a Perfused Tissue","authors":"F. Colella, M. Yen","doi":"10.1109/ISPCE51668.2021.9861368","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861368","url":null,"abstract":"Burn hazard from consumer electronics and wearables is growing more common as we maintain increasingly constant contact with these technologies. Trends in consumer electronics show that consumers are spending more time in contact with devices that dissipate heat. This long duration, low temperature contact with objects of relatively low thermal mass has the potential, under more severe exposure conditions, to cause thermal damage to the skin tissue. However, much of the regulatory guidance is more suited to evaluating burns sustained by short duration contact with hot objects that do not dissipate internal heat. In general, the accurate prediction of the time-temperature response of the skin tissue can be a complicated task due to complexities such as device contact area, skin geometry, skin properties, and heat transfer in the skin due to blood perfusion and metabolic heat generation. However, for most of the contact scenarios, the time-temperature response of the skin can be characterized by (1) initial time-dependent phases controlled by the object thermal mass and initial temperature followed by (2) a steady state phase that is controlled by the heat dissipation inside the device and the thermal and physiological properties of the skin. In the context of wearables or consumer electronics devices with low thermal mass, low initial temperatures and long duration exposures, the amount of energy transferred to the skin during the initial time-dependent phases can be neglected, and a preliminary hazard assessment can be conducted relying on simplified heat transfer calculations for a perfused tissue. This paper presents a number of novel closed form heat transfer solutions to simulate the behavior of a perfused tissue in contact with an object that dissipates heat.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117173033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dalziel Revisited Application; Analyzing mixed AC/DC waveforms 达尔齐尔重新申请;分析交直流混合波形
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861366
P. E. Perkins
{"title":"Dalziel Revisited Application; Analyzing mixed AC/DC waveforms","authors":"P. E. Perkins","doi":"10.1109/ISPCE51668.2021.9861366","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861366","url":null,"abstract":"This paper continues the evaluation of touch current generated by switching circuits within the Dalziel space. This work further confirms the inclusion of impulses below half cycle when compared in the normalized Weiss-LaPique space. Al this confirms the usefulness of the Frequency Factor compensated peak touch current measurements for evaluating touch current waveforms as generated by equipment.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123607813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Normal, Abnormal & Fault conditions rationalized; providing proper protection in equipment 对正常、异常、故障情况进行合理化处理;为设备提供适当的保护
2021 IEEE International Symposium on Product Compliance Engineering (ISPCE) Pub Date : 2021-09-20 DOI: 10.1109/ISPCE51668.2021.9861364
P. E. Perkins
{"title":"Normal, Abnormal & Fault conditions rationalized; providing proper protection in equipment","authors":"P. E. Perkins","doi":"10.1109/ISPCE51668.2021.9861364","DOIUrl":"https://doi.org/10.1109/ISPCE51668.2021.9861364","url":null,"abstract":"IEC standards developed over the last 75 years have not consistently used the terms Normal, Abnormal and Fault conditions in describing under what conditions a product needs to continue to operate safely. This paper rationalizes operating conditions across these modes and provides more consistency in the design and evaluation process, separating the responsibilities of the manufacturer and the installation. Product safety standards committees updating their documents in light of this work will be on a better footing for reliably safe products in the field.","PeriodicalId":146853,"journal":{"name":"2021 IEEE International Symposium on Product Compliance Engineering (ISPCE)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127883758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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