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Analysis of electron transport properties in unstrained and strained Si1−xGex alloys 未应变和应变Si1−xGex合金的电子输运特性分析
IEEE Transactions on Semiconductor Technology Modeling and Simulation Pub Date : 1900-01-01 DOI: 10.1109/TSTMS.1996.6449219
F. M. Bufler, P. Graf, Bernd Meinerzhagen, B. Adeline, M. M. Rieger, H. Kibbel, G. Fischer
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引用次数: 4
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