G. Eremeev, A. Valente, C. Reece, Michael Kelley, U. Pudasaini, Md. Nizam Sayeed, M. Burton, H. Elsayed-Ali
{"title":"Nb3Sn Multilayer Sequential Sputtering at Jefferson Lab","authors":"G. Eremeev, A. Valente, C. Reece, Michael Kelley, U. Pudasaini, Md. Nizam Sayeed, M. Burton, H. Elsayed-Ali","doi":"10.2172/1984443","DOIUrl":"https://doi.org/10.2172/1984443","url":null,"abstract":"","PeriodicalId":105670,"journal":{"name":"ThinFilms 2018, Padova, Italy, October 8, 2018","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115542367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Beringer, A. Valente, C. Reece, Michael Kelley, D. Beverstock
{"title":"Surface Characterization of NbTiN multilayer films for accelerator applications","authors":"D. Beringer, A. Valente, C. Reece, Michael Kelley, D. Beverstock","doi":"10.2172/1984442","DOIUrl":"https://doi.org/10.2172/1984442","url":null,"abstract":"","PeriodicalId":105670,"journal":{"name":"ThinFilms 2018, Padova, Italy, October 8, 2018","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133899100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
U. Pudasaini, G. Eremeev, C. Reece, J. Tuggle, M. Kelley
{"title":"Nb3Sn growth on niobium in vapor diffusion process and its application to large RF surface","authors":"U. Pudasaini, G. Eremeev, C. Reece, J. Tuggle, M. Kelley","doi":"10.2172/1984439","DOIUrl":"https://doi.org/10.2172/1984439","url":null,"abstract":"","PeriodicalId":105670,"journal":{"name":"ThinFilms 2018, Padova, Italy, October 8, 2018","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133165398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}